公开(公告)号：US10267727B2

公开(公告)日：2019-04-23

申请号：US15536469

申请日：2015-11-10

Applicant: Anton Paar Optotec GmbH

Inventor： Martin Ostermeyer

IPC: G01N21/21 ,  G01N21/27 ,  G01N21/31 ,  G01J4/00

Abstract: Optical measuring system for determining polarization-optical properties of a sample, which comprises a polarization state generator (PSG) which is configured for preparing a measuring light which is propagating along an analysis beam path with a defined polarization state; a sample receptacle which is arranged downstream of the PSG in the analysis beam path and which is adapted for receiving the sample; a polarization state analyzer (PSA) which is arranged downstream of the sample receptacle in the analysis beam path; a detector which is arranged downstream of the PSA in the analysis beam path for detecting the measuring light, wherein the PSA and the detector are configured for capturing a polarization rotation αP(λeff) of the measuring light which is caused by the sample; and an evaluation and control unit for evaluating measuring signals from the detector and/or PSA and/or PSG, wherein a wavelength-spectrum of the measuring light contains at least a first wavelength λ1 and a second wavelength λ2, wherein the detector is configured for detecting measuring light with the first wavelength separated from measuring light with the second wavelength, and wherein the evaluation and control unit is configured for calculating a polarization rotation αP(λ0) of the measuring light which is caused by the sample at a standardized wavelength λ0 in dependency from (a) a first polarization rotation αP(λ1) at the first wavelength λ1, (b) a second polarization rotation αP(λ2) at the second wavelength λ2, (c) a first transmission T(λ1) at the first wavelength λ1, and (d) a second transmission T(λ2) at the second wavelength λ2.

公开(公告)号：US20230341333A1

公开(公告)日：2023-10-26

申请号：US18302618

申请日：2023-04-18

Applicant: Anton Paar OptoTec GmbH

Inventor： Martin Ostermeyer

IPC: G01N21/88 ,  G01N21/90 ,  G01K1/022

CPC classification number: G01N21/8806 ,  G01N21/9036 ,  G01K1/022 ,  G01N2021/8848 ,  G01N2201/12

Abstract: An optical measuring device having a polarization state generator to prepare a measuring light having a defined polarization state propagating along an analysis beam path, a receiving equipment arranged downstream of the polarization state generator to receive at least a first measuring cell and a second measuring cell, a polarization state analyzer arranged downstream of the receiving equipment, a detector for detecting an intensity of the measuring light, a stationary transmitting/receiving system to communicate with at least one of the first measuring cell and the second measuring cell and an evaluation and control unit for evaluating measuring signals from the detector and/or the polarization state analyzer and/or the polarization state generator taking into account information communicated between the stationary transmitting/receiving system and at least one of the two measuring cells.

公开(公告)号：US09927358B2

公开(公告)日：2018-03-27

申请号：US15141092

申请日：2016-04-28

Applicant: Anton Paar OptoTec GmbH

Inventor： Martin Ostermeyer

IPC: G01N21/41 ,  G01N21/27

CPC classification number: G01N21/4133 ,  G01N21/274 ,  G01N2201/062 ,  G01N2201/127

Abstract: Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of the sample, wherein the calibration device comprises an itself traceably calibratable determination unit, which is preferably at least partially external of the refractometer, which is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on whose basis the refractometer is calibratable.

公开(公告)号：US20180321136A1

公开(公告)日：2018-11-08

申请号：US15536469

申请日：2015-11-10

Applicant: Anton Paar Optotec GmbH

Inventor： Martin Ostermeyer

IPC: G01N21/21 ,  G01N21/27 ,  G01N21/31 ,  G01J4/00

CPC classification number: G01N21/211 ,  G01J4/00 ,  G01N21/21 ,  G01N21/274 ,  G01N21/314 ,  G01N2021/3137 ,  G01N2021/3148

Abstract: Optical measuring system for determining polarization-optical properties of a sample, which comprises a polarization state generator (PSG) which is configured for preparing a measuring light which is propagating along an analysis beam path with a defined polarization state; a sample receptacle which is arranged downstream of the PSG in the analysis beam path and which is adapted for receiving the sample; a polarization state analyzer (PSA) which is arranged downstream of the sample receptacle in the analysis beam path; a detector which is arranged downstream of the PSA in the analysis beam path for detecting the measuring light, wherein the PSA and the detector are configured for capturing a polarization rotation αP(λeff) of the measuring light which is caused by the sample; and an evaluation and control unit for evaluating measuring signals from the detector and/or PSA and/or PSG, wherein a wavelength-spectrum of the measuring light contains at least a first wavelength λ1 and a second wavelength λ2, wherein the detector is configured for detecting measuring light with the first wavelength separated from measuring light with the second wavelength, and wherein the evaluation and control unit is configured for calculating a polarization rotation αP(λ0) of the measuring light which is caused by the sample at a standardized wavelength λ0 in dependency from (a) a first polarization rotation αP(λ1) at the first wavelength λ1, (b) a second polarization rotation αP(λ2) at the second wavelength λ2, (c) a first transmission T(λ1) at the first wavelength λ1, and (d) a second transmission T(λ2) at the second wavelength λ2.

公开(公告)号：US10018520B2

公开(公告)日：2018-07-10

申请号：US15140201

申请日：2016-04-27

Applicant: Anton Paar OptoTec GmbH

Inventor： Martin Ostermeyer ,  Thomas Brandl

IPC: G01K15/00 ,  G01N21/41 ,  G01N21/27 ,  G01N21/43 ,  G01N21/552 ,  G01N21/35

CPC classification number: G01K15/005 ,  G01N21/274 ,  G01N21/4133 ,  G01N21/43 ,  G01N21/552 ,  G01N2021/3595 ,  G01N2021/414 ,  G01N2201/1211

Abstract: Measuring apparatus-calibration device for calibrating a measuring apparatus-temperature sensor of a, in particular optical, measuring apparatus, wherein the measuring apparatus-calibration device comprises a, preferably measuring apparatus-external, calibration-temperature sensor, which is traceably calibratable itself, for determining a calibration temperature in the region of a measuring surface of the measuring apparatus and a determination unit which is adapted for determining an information which is indicative for a discrepancy between a measuring apparatus-temperature which is captured by the measuring apparatus-temperature sensor in the region of the measuring surface and the calibration temperature, on whose basis the measuring apparatus-temperature sensor is calibratable.

公开(公告)号：US20160320297A1

公开(公告)日：2016-11-03

申请号：US15141092

申请日：2016-04-28

Applicant: Anton Paar OptoTec GmbH

Inventor： Martin Ostermeyer

IPC: G01N21/41 ,  G01N21/45

CPC classification number: G01N21/4133 ,  G01N21/274 ,  G01N2201/062 ,  G01N2201/127

Abstract: Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of the sample, wherein the calibration device comprises an itself traceably calibratable determination unit, which is preferably at least partially external of the refractometer, which is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on whose basis the refractometer is calibratable.

Abstract translation: 用于校准用于确定指示样品的折射率的信息的折射计的操作波长特性的校准装置，其中所述校准装置包括自身可追溯校准的确定单元，其优选地至少部分在所述折射计的外部，所述确定单元 适于确定指示折射计的可预定设定点操作波长特性与折射计的实际波长特性之间的差异的信息，其折射仪可校准。

公开(公告)号：US20160320252A1

公开(公告)日：2016-11-03

申请号：US15140201

申请日：2016-04-27

Applicant: Anton Paar OptoTec GmbH

Inventor： Martin Ostermeyer ,  Thomas Brandl

IPC: G01K15/00 ,  G01N21/35 ,  G01N21/41 ,  G01N21/552

CPC classification number: G01K15/005 ,  G01N21/274 ,  G01N21/4133 ,  G01N21/43 ,  G01N21/552 ,  G01N2021/3595 ,  G01N2021/414 ,  G01N2201/1211

Abstract: Measuring apparatus-calibration device for calibrating a measuring apparatus-temperature sensor of a, in particular optical, measuring apparatus, wherein the measuring apparatus-calibration device comprises a, preferably measuring apparatus-external, calibration-temperature sensor, which is traceably calibratable itself, for determining a calibration temperature in the region of a measuring surface of the measuring apparatus and a determination unit which is adapted for determining an information which is indicative for a discrepancy between a measuring apparatus-temperature which is captured by the measuring apparatus-temperature sensor in the region of the measuring surface and the calibration temperature, on whose basis the measuring apparatus-temperature sensor is calibratable.

Abstract translation: 用于校准特别是光学测量装置的测量装置温度传感器的测量装置校准装置，其中所述测量装置校准装置包括优选地是测量装置外部的校准温度传感器，其可自身可校准， 用于确定测量装置的测量表面区域中的校准温度;以及确定单元，其用于确定指示由测量装置温度传感器捕获的测量装置温度之间的差异的信息 测量表面的区域和校准温度，在此基础上测量仪器 - 温度传感器是可校准的。