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公开(公告)号：US10772275B2
公开(公告)日：2020-09-15
申请号：US16098282
申请日：2017-04-28
Applicant: BASF PLANT SCIENCE COMPANY GMBH
Inventor： Frederik Leyns , Joris Eeckhout
Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.
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公开(公告)号：US10712325B2
公开(公告)日：2020-07-14
申请号：US16515307
申请日：2019-07-18
Applicant: BASF PLANT SCIENCE COMPANY GMBH
Inventor： Pierre Lejeune , Jeroen Baert , Frederik Leyns , Joris Eeckhout
Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
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Patent Agency Ranking
3.发明申请公开(公告)号：US20190116749A1
公开(公告)日：2019-04-25
申请号：US16098282
申请日：2017-04-28
Applicant: BASF PLANT SCIENCE COMPANY GMBH
Inventor： Frederik Leyns , Joris Eeckhout
CPC classification number: A01H3/04 , A01G7/00 , G01N33/0098 , G01N33/5097 , G06T7/0012 , G06T7/0016 , G06T2207/10016 , G06T2207/10024 , G06T2207/30004
Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.
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公开(公告)号：US20180356385A1
公开(公告)日：2018-12-13
申请号：US16060081
申请日：2016-12-06
Applicant: BASF PLANT SCIENCE COMPANY GMBH
Inventor： Pierre Lejeune , Jeroen Baert , Frederik Leyns , Joris Eeckhout
CPC classification number: G01N33/0098 , G01N15/1429 , G01N15/1434 , G01N21/85 , G01N2015/0065 , G01N2021/845 , G01N2021/8466
Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
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公开(公告)号：US20150268156A1
公开(公告)日：2015-09-24
申请号：US14730531
申请日：2015-06-04
Applicant: BASF Plant Science Company GmbH
Inventor： Frederik Leyns , Cédrick VANDAELE , Pierre LEJEUNE , Jeroen BAERT , Fabio FIORANI
CPC classification number: G01N21/17 , A01G7/00 , A01G22/00 , G01N21/84 , G01N33/0098 , G01N2021/1765 , G01N2021/8466
Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
Abstract translation: 公开了一种用于筛选多个植物试样（114）中的至少一个植物试样（112）的筛选装置（110）。 筛选装置（110）包括适于获取空间分辨图像（117）的检测器（116）。 筛选装置（110）还包括至少一个选择装置（118），适于从多个植物样本（114）中选择单个植物标本（120）或一组植物标本（122），以便由检测器 116）。 选择装置（118）包括适于偏转在植物样本（112）和检测器（116）之间传播的电磁波的偏转装置（124）。
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公开(公告)号：US10393719B2
公开(公告)日：2019-08-27
申请号：US16060081
申请日：2016-12-06
Applicant: BASF PLANT SCIENCE COMPANY GMBH
Inventor： Pierre Lejeune , Jeroen Baert , Frederik Leyns , Joris Eeckhout
Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
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公开(公告)号：US09335252B2
公开(公告)日：2016-05-10
申请号：US14730531
申请日：2015-06-04
Applicant: BASF Plant Science Company GmbH
Inventor： Frederik Leyns , Cédrick Vandaele , Pierre Lejeune , Jeroen Baert , Fabio Fiorani
CPC classification number: G01N21/17 , A01G7/00 , A01G22/00 , G01N21/84 , G01N33/0098 , G01N2021/1765 , G01N2021/8466
Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
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