公开(公告)号：US10712325B2

公开(公告)日：2020-07-14

申请号：US16515307

申请日：2019-07-18

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01J3/40 ,  G01N33/00 ,  G01N15/14 ,  G01N21/85 ,  G01N21/84 ,  G01N15/00

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

公开(公告)号：US20180356385A1

公开(公告)日：2018-12-13

申请号：US16060081

申请日：2016-12-06

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01N33/00 ,  G01N15/14 ,  G01N21/85

CPC classification number: G01N33/0098 ,  G01N15/1429 ,  G01N15/1434 ,  G01N21/85 ,  G01N2015/0065 ,  G01N2021/845 ,  G01N2021/8466

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

公开(公告)号：US10393719B2

公开(公告)日：2019-08-27

申请号：US16060081

申请日：2016-12-06

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01J3/40 ,  G01N33/00 ,  G01N15/14 ,  G01N21/85 ,  G01N15/00 ,  G01N21/84

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

公开(公告)号：US09335252B2

公开(公告)日：2016-05-10

申请号：US14730531

申请日：2015-06-04

Applicant: BASF Plant Science Company GmbH

Inventor： Frederik Leyns ,  Cédrick Vandaele ,  Pierre Lejeune ,  Jeroen Baert ,  Fabio Fiorani

IPC: G01N21/64 ,  G01N21/17 ,  A01G7/00 ,  G01N21/84 ,  A01G1/00 ,  G01N33/00

CPC classification number: G01N21/17 ,  A01G7/00 ,  A01G22/00 ,  G01N21/84 ,  G01N33/0098 ,  G01N2021/1765 ,  G01N2021/8466

Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).