公开(公告)号：US10393719B2

公开(公告)日：2019-08-27

申请号：US16060081

申请日：2016-12-06

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01J3/40 ,  G01N33/00 ,  G01N15/14 ,  G01N21/85 ,  G01N15/00 ,  G01N21/84

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

公开(公告)号：US10772275B2

公开(公告)日：2020-09-15

申请号：US16098282

申请日：2017-04-28

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Frederik Leyns ,  Joris Eeckhout

IPC: A01H3/04 ,  G01N33/00 ,  G06T7/00 ,  G01N33/50 ,  A01G7/00

Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.

公开(公告)号：US10712325B2

公开(公告)日：2020-07-14

申请号：US16515307

申请日：2019-07-18

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01J3/40 ,  G01N33/00 ,  G01N15/14 ,  G01N21/85 ,  G01N21/84 ,  G01N15/00

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

公开(公告)号：US20190116749A1

公开(公告)日：2019-04-25

申请号：US16098282

申请日：2017-04-28

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Frederik Leyns ,  Joris Eeckhout

IPC: A01H3/04 ,  G01N33/00 ,  A01G7/00 ,  G01N33/50 ,  G06T7/00

CPC classification number: A01H3/04 ,  A01G7/00 ,  G01N33/0098 ,  G01N33/5097 ,  G06T7/0012 ,  G06T7/0016 ,  G06T2207/10016 ,  G06T2207/10024 ,  G06T2207/30004

Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.

公开(公告)号：US20180356385A1

公开(公告)日：2018-12-13

申请号：US16060081

申请日：2016-12-06

Applicant: BASF PLANT SCIENCE COMPANY GMBH

Inventor： Pierre Lejeune ,  Jeroen Baert ,  Frederik Leyns ,  Joris Eeckhout

IPC: G01N33/00 ,  G01N15/14 ,  G01N21/85

CPC classification number: G01N33/0098 ,  G01N15/1429 ,  G01N15/1434 ,  G01N21/85 ,  G01N2015/0065 ,  G01N2021/845 ,  G01N2021/8466

Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.