STRESS ISOLATION FRAME FOR A SENSOR
    1.
    发明申请

    公开(公告)号:US20190169018A1

    公开(公告)日:2019-06-06

    申请号:US15985283

    申请日:2018-05-21

    Abstract: A device for reducing package stress sensitivity of a sensor includes one or more anchor points for attaching to a substrate; a rigid frame structure configured to at least partially support the sensor; and a compliant element between each anchor point and the rigid frame structure. Also disclosed is a device for supporting a micro-electro-mechanical (MEMS) sensor comprising four anchor points for attaching to a substrate; a rigid frame structure configured to support the MEMS sensor; and a crab-leg suspension element between each anchor point and the rigid frame structure, wherein the crab-leg suspension element is compliant. A method for reducing package stress sensitivity of a sensor is provided as well.

    MEMS DEVICE WITH ELECTRODES PERMEABLE TO OUTGASSING SPECIES
    2.
    发明申请
    MEMS DEVICE WITH ELECTRODES PERMEABLE TO OUTGASSING SPECIES 有权
    带有电极的MEMS器件可以通过出口物种进行

    公开(公告)号:US20160376143A1

    公开(公告)日:2016-12-29

    申请号:US14935296

    申请日:2015-11-06

    Abstract: A MEMS device and method for providing a MEMS device are disclosed. In a first aspect, the MEMS device comprises a first substrate and a second substrate coupled to the first substrate forming a sealed enclosure. A moveable structure is located within the sealed enclosure. An outgassing layer is formed on the first or second substrates and within the sealed enclosure. A first conductive layer is disposed between the moveable structure and the outgassing layer, wherein the first conductive layer allows outgassing species to pass therethrough.

    Abstract translation: 公开了一种用于提供MEMS器件的MEMS器件和方法。 在第一方面,MEMS装置包括第一基板和耦合到第一基板的第二基板,形成密封外壳。 可移动的结构位于密封的外壳内。 在第一或第二基板上和密封的外壳内形成除气层。 第一导电层设置在可移动结构和除气层之间,其中第一导电层允许除气物质通过其中。

    PROOF MASS AND POLYSILICON ELECTRODE INTEGRATED THEREON

    公开(公告)号:US20190035905A1

    公开(公告)日:2019-01-31

    申请号:US16044233

    申请日:2018-07-24

    Abstract: A method includes depositing a silicon layer over a first oxide layer that overlays a first silicon substrate. The method further includes depositing a second oxide layer over the silicon layer to form a composite substrate. The composite substrate is bonded to a second silicon substrate to form a micro-electro-mechanical system (MEMS) substrate. Holes within the second silicon substrate are formed by reaching the second oxide layer of the composite substrate. The method further includes removing a portion of the second oxide layer through the holes to release MEMS features. The MEMS substrate may be bonded to a CMOS substrate.

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