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公开(公告)号:US20220139883A1
公开(公告)日:2022-05-05
申请号:US17577944
申请日:2022-01-18
Applicant: Invensas Corporation
Inventor: Javier A. DeLaCruz , Belgacem Haba
IPC: H01L25/065 , H01L25/18 , H01L23/00 , G06F15/78 , H01L23/532
Abstract: The technology relates to a system on chip (SoC). The SoC may include a network on layer including one or more routers and an application specific integrated circuit (ASIC) layer bonded to the network layer, the ASIC layer including one or more components. In some instances, the network layer and the ASIC layer each include an active surface and a second surface opposite the active surface. The active surface of the ASIC layer and the second surface of the network may each include one or more contacts, and the network layer may be bonded to the ASIC layer via bonds formed between the one or more contacts on the second surface of the network layer and the one or more contacts on the active surface of the ASIC layer.
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公开(公告)号:US20210149586A1
公开(公告)日:2021-05-20
申请号:US17098299
申请日:2020-11-13
Applicant: Invensas Corporation
Inventor: Javier A. DeLaCruz , David E. Fisch
IPC: G06F3/06
Abstract: Some embodiments provide a three-dimensional (3D) circuit that has data lines of one or more memory circuits on a different IC die than the IC die(s) on which the memory blocks of the memory circuit(s) are defined. In some embodiments, the 3D circuit includes a first IC die with a first set of two or more memory blocks that have a first set of data lines. The 3D circuit also includes a second IC die that is stacked with the first IC dies and that includes a second set of two or more memory blocks with a second set of data lines. The 3D circuit further includes a third IC die that is stacked with the first and second IC dies and that includes a third set of data lines, which connect through several z-axis connections with the first and second sets of data lines to carry data to and from the first and second memory block sets when data is being written to and read from the first and second memory block sets. The z-axis connections in some embodiments electrically connect circuit nodes in overlapping portions of the first and third IC dies, and overlapping portions of second and third IC dies, in order to carry data between the third set of data lines on the third IC die and the first and second set of data lines of the first and second of memory block sets on the first and second IC dies. These z-axis connections between the dies are very short as the dies are very thin. For instance, in some embodiments, the z-axis connections are less than 10 or 20 microns. The z-axis connections are through silicon vias (TSVs) in some embodiments.
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公开(公告)号:US20220150184A1
公开(公告)日:2022-05-12
申请号:US17583872
申请日:2022-01-25
Applicant: Invensas Corporation
Inventor: Javier A. DeLaCruz , Belgacem Haba , Rajesh Katkar
IPC: H04L49/109
Abstract: The technology relates to a system on chip (SoC). The SoC may include a plurality of network layers which may assist electrical communications either horizontally or vertically among components from different device layers. In one embodiment, a system on chip (SoC) includes a plurality of network layers, each network layer including one or more routers, and more than one device layers, each of the plurality of network layers respectively bonded to one of the device layers. In another embodiment, a method for forming a system on chip (SoC) includes forming a plurality of network layers in an interconnect, wherein each network layer is bonded to an active surface of a respective device layer in a plurality of device layer.
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公开(公告)号:US09984992B2
公开(公告)日:2018-05-29
申请号:US14997774
申请日:2016-01-18
Applicant: Invensas Corporation
Inventor: Javier A. DeLaCruz , Abiola Awujoola , Ashok S. Prabhu , Christopher W. Lattin , Zhuowen Sun
IPC: H05K1/02 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/065 , H01L25/16
CPC classification number: H01L24/49 , H01L23/3121 , H01L23/49838 , H01L23/552 , H01L24/17 , H01L24/48 , H01L24/97 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/105 , H01L25/16 , H01L25/50 , H01L2224/04042 , H01L2224/11334 , H01L2224/16145 , H01L2224/16227 , H01L2224/17051 , H01L2224/32145 , H01L2224/32225 , H01L2224/48108 , H01L2224/48137 , H01L2224/48145 , H01L2224/48227 , H01L2224/49109 , H01L2224/73204 , H01L2224/73253 , H01L2224/73257 , H01L2224/73265 , H01L2225/06506 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06562 , H01L2225/1023 , H01L2924/00014 , H01L2924/14 , H01L2924/15192 , H01L2924/15311 , H01L2924/1532 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/19107 , H01L2924/3025 , H05K1/0284 , H01L2224/45099 , H01L2924/00012 , H01L2924/00
Abstract: In a vertically integrated microelectronic package, a first microelectronic device is coupled to an upper surface of a circuit platform in a wire bond-only surface area thereof. Wire bond wires are coupled to and extends away from an upper surface of the first microelectronic device. A second microelectronic device in a face-down orientation is coupled to upper ends of the wire bond wires in a surface mount-only area. The second microelectronic device is located above and at least partially overlaps the first microelectronic device. A protective layer is disposed over the circuit platform and the first microelectronic device. An upper surface of the protective layer has the surface mount-only area. The upper surface of the protective layer has the second microelectronic device disposed thereon in the face-down orientation in the surface mount-only area for coupling to the upper ends of the first wire bond wires.
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公开(公告)号:US20170194281A1
公开(公告)日:2017-07-06
申请号:US14997774
申请日:2016-01-18
Applicant: Invensas Corporation
Inventor: Javier A. DeLaCruz , Abiola Awujoola , Ashok S. Prabhu , Christopher W. Lattin , Zhuowen Sun
IPC: H01L23/00 , H01L23/498 , H01L25/065 , H01L23/31 , H01L25/16
CPC classification number: H01L24/49 , H01L23/3121 , H01L23/49838 , H01L23/552 , H01L24/17 , H01L24/48 , H01L24/97 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/105 , H01L25/16 , H01L25/50 , H01L2224/04042 , H01L2224/11334 , H01L2224/16145 , H01L2224/16227 , H01L2224/17051 , H01L2224/32145 , H01L2224/32225 , H01L2224/48108 , H01L2224/48137 , H01L2224/48145 , H01L2224/48227 , H01L2224/49109 , H01L2224/73204 , H01L2224/73253 , H01L2224/73257 , H01L2224/73265 , H01L2225/06506 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06562 , H01L2225/1023 , H01L2924/00014 , H01L2924/14 , H01L2924/15192 , H01L2924/15311 , H01L2924/1532 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/19107 , H01L2924/3025 , H05K1/0284 , H01L2224/45099 , H01L2924/00012 , H01L2924/00
Abstract: In a vertically integrated microelectronic package, a first microelectronic device is coupled to an upper surface of a circuit platform in a wire bond-only surface area thereof. Wire bond wires are coupled to and extends away from an upper surface of the first microelectronic device. A second microelectronic device in a face-down orientation is coupled to upper ends of the wire bond wires in a surface mount-only area. The second microelectronic device is located above and at least partially overlaps the first microelectronic device. A protective layer is disposed over the circuit platform and the first microelectronic device. An upper surface of the protective layer has the surface mount-only area. The upper surface of the protective layer has the second microelectronic device disposed thereon in the face-down orientation in the surface mount-only area for coupling to the upper ends of the first wire bond wires.
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