公开(公告)号：US09442134B2

公开(公告)日：2016-09-13

申请号：US14332047

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Chun-Chung Huang ,  Wei Chen ,  Hsin-Hsiang Liu ,  Kuang-Chung Chou

IPC: G01R31/00 ,  G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07342 ,  G01R31/2889

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected to the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second electrical lines respectively.

Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二电线分别电连接到第一电线。 电感元件分别电连接到第一电线和测试仪; 并且电容器具有分别连接到第二电线的相对端。

公开(公告)号：US09500675B2

公开(公告)日：2016-11-22

申请号：US14331610

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Wei Chen ,  Hsin Hsiang Liu ,  Kuang Chung Chou ,  Chan Hung Huang

IPC: G01R1/073

CPC classification number: G01R1/07385 ,  G01R1/07378 ,  G01R31/31716 ,  G01R31/31905

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Abstract translation: 支持环回测试并且在PCB和DUT之间提供的探针模块包括衬底，探针基座，两个探针，两个信号路径切换器和电容器。 基板具有两个第一连接电路和两个第二连接电路，其中每个第一连接电路的一端连接到PCB。 探针基座设置在基板和DUT之间，其上设置有探针，其中每个探针的端部暴露并电连接到一个第二连接电路，而另一端也暴露于与DUT接触。 每个信号路径切换器设置在探针基座上，并且分别电连接到一个第一和第二连接电路的另一端。 电容器设置在探针基座上，两端电连接到两个信号路径切换器。

公开(公告)号：US20150015295A1

公开(公告)日：2015-01-15

申请号：US14332047

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  Jun-Liang Lai ,  Chun-Chung HUANG ,  Wei Chen ,  Hsin-Hsiang Liu ,  Kuang-Chung Chou

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07342 ,  G01R31/2889

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.

Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二第一电线分别电连接到第一电线。 电感元件分别与第一电线和测试仪电连接; 并且电容器具有分别连接到第二第一电线的相对端。