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公开(公告)号：US09442134B2
公开(公告)日：2016-09-13
申请号：US14332047
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： Wei-Cheng Ku , Jun-Liang Lai , Chun-Chung Huang , Wei Chen , Hsin-Hsiang Liu , Kuang-Chung Chou
CPC classification number: G01R1/07342 , G01R31/2889
Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected to the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second electrical lines respectively.
Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二电线分别电连接到第一电线。 电感元件分别电连接到第一电线和测试仪; 并且电容器具有分别连接到第二电线的相对端。
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公开(公告)号：US09622348B2
公开(公告)日：2017-04-11
申请号：US14332269
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： Wei-Cheng Ku , Jun-Liang Lai , Chun-Chung Huang , Jing-Zhi Hung , Yung Nan Wu , Chih-Hao Ho
CPC classification number: H05K1/116 , H05K1/0298 , H05K3/429 , H05K2201/09845
Abstract: A multilayer circuit board includes a plurality of stacked substrates, a plurality of first conductive lands, and a plurality of second conductive lands. A surface at a side of each of the substrates has an exposed portion which is not covered by the neighboring substrate, wherein each of the first conductive lands is respectively provided on each of the exposed portions. Each of the second conductive lands is provided on the exposed portion of the outermost substrate, wherein each of the substrates has a conductor pattern to be electrically connected to one of the first conductive lands and to one of the second conductive lands.
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