公开(公告)号：US20150015295A1

公开(公告)日：2015-01-15

申请号：US14332047

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  Jun-Liang Lai ,  Chun-Chung HUANG ,  Wei Chen ,  Hsin-Hsiang Liu ,  Kuang-Chung Chou

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07342 ,  G01R31/2889

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.

Abstract translation: 位于测试仪和待测器件（DUT）之间的探针卡包括两条第一条电线，两条第二条电线，两条电感元件和一个电容器。 第一电线分别与探针电连接。 第二第一电线分别电连接到第一电线。 电感元件分别与第一电线和测试仪电连接; 并且电容器具有分别连接到第二第一电线的相对端。

公开(公告)号：US20150015291A1

公开(公告)日：2015-01-15

申请号：US14332200

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  Jun-Liang Lai ,  Chun-Chung HUANG ,  Jing-Zhi Hung ,  Yung Nan Wu ,  CHIH-HAO HO

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06772 ,  G01R1/06727 ,  G01R1/07342

Abstract: A cantilever probe card, which is provided between a device under test (DUT) and a tester, includes a carrier board, a probe base, two probes, and a transmission device. The carrier board is provided with through holes. The probe base is provided on the carrier board, and the probes are mounted to the probe base. Each probe has a tip to contact a test pad of the DUT. The transmission device is flexible, and has signal circuits. The transmission device passes through the through hole on the carrier board, and the signal circuits connect the probes to the tester respectively.

Abstract translation: 设置在被测设备（DUT）和测试仪之间的悬臂探针卡包括载板，探针基座，两个探针和传输装置。 载板上设有通孔。 探针底座设置在载板上，探头安装在探针底座上。 每个探头都有一个提示，用于接触DUT的测试焊盘。 传输设备灵活，并具有信号电路。 传输装置通过载板上的通孔，信号电路将探头分别连接到测试仪。

公开(公告)号：US20150014046A1

公开(公告)日：2015-01-15

申请号：US14332269

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng KU ,  Jun-Liang LAI ,  Chun-Chung HUANG ,  Jing-Zhi HUNG ,  Yung Nan WU ,  Chih-Hao HO

IPC: H05K1/11

CPC classification number: H05K1/116 ,  H05K1/0298 ,  H05K3/429 ,  H05K2201/09845

Abstract: A multilayer circuit board includes a plurality of stacked substrates, a plurality of first conductive lands, and a plurality of second conductive lands. A surface at a side of each of the substrates has an exposed portion which is not covered by the neighboring substrate, wherein each of the first conductive lands is respectively provided on each of the exposed portions. Each of the second conductive lands is provided on the exposed portion of the outermost substrate, wherein each of the substrates has a conductor pattern to be electrically connected to one of the first conductive lands and to one of the second conductive lands.

Abstract translation: 多层电路板包括多个堆叠的衬底，多个第一导电焊盘和多个第二导电焊盘。 每个基板的一侧的表面具有未被相邻基板覆盖的暴露部分，其中每个第一导电焊盘分别设置在每个暴露部分上。 每个第二导电焊盘设置在最外基板的暴露部分上，其中每个基板具有导电图案，以将其电连接到第一导电焊盘之一和第二导电焊盘之一。