公开(公告)号：US20240393386A1

公开(公告)日：2024-11-28

申请号：US18672151

申请日：2024-05-23

Applicant: MPI Corporation

Inventor： YA-HUNG LO ,  CHIEN-HSUN CHEN ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28

Abstract: A method for adjusting position of probing base comprises steps of providing a probing machine comprising a probing holder, a first probing base having a first probing needle comprising a plurality of first probing bodies wherein two adjacent tips of the first probing bodies h a first pitch, and a second probing base having a second probe comprising a plurality of second probing bodies in which two adjacent tips of the second probing bodies has a second pitch, thereafter, grabbing the first probing base and connecting the first probing base to the probing holder, acquiring first image with respect to the plurality of first probing bodies through visual identification module, and finally, adjusting roll angle of probing tips of the plurality of first needle bodies according to the first image. Alternatively, the present invention further provides a probing machine using the method for testing DUTs having different pitches.

公开(公告)号：US20210102992A1

公开(公告)日：2021-04-08

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： YANG-HUNG CHENG ,  YA-HUNG LO ,  CHIEN-HSUN CHEN ,  CHIA-NAN CHOU ,  CHUNG-YEN HUANG ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.