公开(公告)号：US20240393386A1

公开(公告)日：2024-11-28

申请号：US18672151

申请日：2024-05-23

Applicant: MPI Corporation

Inventor： YA-HUNG LO ,  CHIEN-HSUN CHEN ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28

Abstract: A method for adjusting position of probing base comprises steps of providing a probing machine comprising a probing holder, a first probing base having a first probing needle comprising a plurality of first probing bodies wherein two adjacent tips of the first probing bodies h a first pitch, and a second probing base having a second probe comprising a plurality of second probing bodies in which two adjacent tips of the second probing bodies has a second pitch, thereafter, grabbing the first probing base and connecting the first probing base to the probing holder, acquiring first image with respect to the plurality of first probing bodies through visual identification module, and finally, adjusting roll angle of probing tips of the plurality of first needle bodies according to the first image. Alternatively, the present invention further provides a probing machine using the method for testing DUTs having different pitches.

公开(公告)号：US20210102992A1

公开(公告)日：2021-04-08

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： YANG-HUNG CHENG ,  YA-HUNG LO ,  CHIEN-HSUN CHEN ,  CHIA-NAN CHOU ,  CHUNG-YEN HUANG ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.

公开(公告)号：US20150204907A1

公开(公告)日：2015-07-23

申请号：US14556612

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  YA-HUNG LO ,  SHOU-JEN TSAI

IPC: G01R1/073 ,  G01R1/04

CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.

Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。

公开(公告)号：US20150212186A1

公开(公告)日：2015-07-30

申请号：US14558450

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  SHOU-JEN TSAI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/02

CPC classification number: G01R35/005 ,  G01R31/025 ,  G01R31/043 ,  G01R31/2808 ,  G01R31/2851

Abstract: A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.

Abstract translation: 提供了一种校准和操作测试系统的方法，其中测试系统具有测试机，导线组，校准模块和探针模块。 该方法包括以下步骤：将测试机与导线组电连接; 电连接导线组和校准模块; 在短路测试，开路测试和阻抗测试中，将测试机器的电信号发送到校准模块进行至少一次测试，然后通过相应地根据测试结果进行补偿来校准测试系统 这些测试; 电气断开导线组和校准模块，并电连接导线组和探针模块; 将探针模块抵靠DUT; 从测试机发送电信号到探头模块，对DUT进行电气测试。