EMISSION SPECTROSCOPIC ANALYZER
    1.
    发明申请

    公开(公告)号:US20180238736A1

    公开(公告)日:2018-08-23

    申请号:US15903197

    申请日:2018-02-23

    Inventor: TATSUYA KAIHATSU

    Abstract: An emission spectroscopy instrumentation is easily operated and includes a calculation element 154 that calculates a variation of the measurement values of every detector relative to a plurality of measurements of a standard; a determination element 155 that determines whether any an additional measurement is required when a variation relative to all detectors is within an acceptable value and an addition measurement is required when a variation relative to any one detector is out of an acceptable value; a notification element 156 that notifies to an operator a determination result according to the determination element 155, and a calculation-determination control element 153 that controls the calculation element 154 and the determination element 155 that calculates the variation and makes a determination at the timing when the measurement of the standard sample is executed at predetermined times, and calculates a variation and makes a determination at every one additional measurement when the additional measurement is needed.

Patent Agency Ranking