ENERGY SOURCE FOR MEMORY DEVICE
    1.
    发明申请

    公开(公告)号:US20250155941A1

    公开(公告)日:2025-05-15

    申请号:US18389247

    申请日:2023-11-14

    Abstract: An energy source for a memory device is disclosed. In particular, a memory device such as an insertable memory card may include a detachable portion that has an energy source positioned thereon. The junction between the primary portion and the detachable portion includes sufficient conductors to convey power from the energy source as well as any needed control signals. In an exemplary aspect, the detachable portion is positioned relative to the primary portion such that the detachable portion may be readily removed while the memory device is installed in a computing device. By providing a detachable energy source, the energy source may readily be replaced in the event of failure without having to replace the entirety of the memory device. Such flexibility may save time, money, and otherwise simplify design requirements.

    MEMORY CONTROLLER FOR HIGH LATENCY MEMORY DEVICES

    公开(公告)号:US20180095661A1

    公开(公告)日:2018-04-05

    申请号:US15285305

    申请日:2016-10-04

    CPC classification number: G06F3/061 G06F3/064 G06F3/0659 G06F3/0673

    Abstract: Approaches, techniques, and mechanisms are disclosed for improving the performance of memory controllers for memory devices. A system may have a memory controller that interfaces with a memory device to store or retrieve information. When the system needs to retrieve information from the memory device, the memory controller sends an address and a command to instruct the memory device to read the information stored at the address. The memory device reads the information, and after a specific amount of time, the memory device sends the information to the memory controller. According to an embodiment, “dummy” data is sent first prior to the availability of the data read out of the memory devices, while waiting for the requested data to be accessed, and then the actual data is sent immediately following the dummy data. According to an embodiment, a geometry of a memory device has only one column of memory cells that are used to store information. The memory device with only one column in an embodiment does not require decoding of a column address. As such, the read latency of the memory device is significantly reduced.

    Memory module test adapter
    3.
    发明授权

    公开(公告)号:US10510432B1

    公开(公告)日:2019-12-17

    申请号:US15659420

    申请日:2017-07-25

    Inventor: Jinying Shen

    Abstract: Approaches, techniques, and mechanisms are disclosed for a test adapter designed to improve testability of non-volatile dual in-line memory modules (NVDIMM) on automatic test equipment (ATE) testers or in-system boards, which have inadequate power supplies. An NVDIMM includes both volatile memories and non-volatile memories. A test adapter is designed to supply increased power to an NVDIMM. A test adapter is implemented using an interposer or a printed circuit board (PCB) that may be inserted into a socket on an ATE tester or on an end-user system-level board. The interposer or PCB includes a power socket for attaching a power cable to supply the external power supply to the NVDIMM. A power on/off sequence is controlled by an ATE tester to simulate or test a system power on/off sequence. An external input power is always on, but both serial and backup power signals are only on during tests of an NVDIMM.

    SERIAL ATTACHED NON-VOLATILE MEMORY
    4.
    发明公开

    公开(公告)号:US20240134757A1

    公开(公告)日:2024-04-25

    申请号:US18400185

    申请日:2023-12-29

    CPC classification number: G06F11/1469 G06F1/263 G06F1/30 G06F11/1451

    Abstract: Systems and methods for enabling serial attached Non-Volatile (NV) memory are provided. In some embodiments, a method of operation of a computing system includes: in an NV Random Access Memory module (NVRAM) having a non-volatile device, a volatile memory device with data, a NV Controller unit (NVC), and a serial host interface, the method includes: receiving a request for data on the serial host interface and providing the requested data, from the volatile memory device, on the serial host interface. The method also includes: detecting a disruptive volatile memory event; copying the data of the volatile memory device to the NV device through the serial host interface based on the disruptive volatile memory event; and restoring the data of the volatile memory device from the NV device through the serial host interface. In this way, Dynamic Random-Access Memory (DRAM) level endurance and speed/latency can be provided while making it NV.

    Centralized backup power module
    5.
    发明授权

    公开(公告)号:US10551892B1

    公开(公告)日:2020-02-04

    申请号:US15709257

    申请日:2017-09-19

    Inventor: Jinying Shen

    Abstract: Approaches, techniques, and mechanisms are disclosed for a centralized backup power support system that improves testability of non-volatile dual in-line memory modules (NVDIMM) on Automatic Test Equipment (ATE) testers and in-system tests. An NVDIMM includes both volatile memories and non-volatile memories. According to an embodiment, a compact backup power distribution board is powered with an external power supply with an individual protection circuit. The backup power distribution board has an unlimited energy capacity for any density of NVDIMM and zero charge waiting time. According to an embodiment, instead of using an electric double-layer capacitor (EDLC) to support backup power, a resistor is used instead of an EDLC on each backup power module. There is no charging time when the backup power module does not have EDLC cells, resulting in significant reduction in test time and production cost and increase in production output.

    Memory controller for high latency memory devices

    公开(公告)号:US10338821B2

    公开(公告)日:2019-07-02

    申请号:US15285305

    申请日:2016-10-04

    Abstract: Approaches, techniques, and mechanisms are disclosed for improving the performance of memory controllers for memory devices. A system may have a memory controller that interfaces with a memory device to store or retrieve information. When the system needs to retrieve information from the memory device, the memory controller sends an address and a command to instruct the memory device to read the information stored at the address. The memory device reads the information, and after a specific amount of time, the memory device sends the information to the memory controller. According to an embodiment, “dummy” data is sent first prior to the availability of the data read out of the memory devices, while waiting for the requested data to be accessed, and then the actual data is sent immediately following the dummy data. According to an embodiment, a geometry of a memory device has only one column of memory cells that are used to store information. The memory device with only one column in an embodiment does not require decoding of a column address. As such, the read latency of the memory device is significantly reduced.

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