公开(公告)号：US20150192462A1

公开(公告)日：2015-07-09

申请号：US14412490

申请日：2013-07-03

Applicant: Smiths Detection, Inc.

Inventor： David W. Schiering ,  Maxim Frayer ,  Peng Zou

IPC: G01J3/02 ,  G01J3/44 ,  G01J3/36

CPC classification number: G01J3/0256 ,  G01J3/108 ,  G01J3/36 ,  G01J3/42 ,  G01J3/44 ,  G01J2003/106

Abstract: Systems and techniques for optical spectrometer detection using, for example, IR spectroscopy components and Raman spectroscopy components are described. For instance, a system includes a first electromagnetic radiation source configured to illuminate a sample with a first portion of electromagnetic radiation in a first region of the electromagnetic spectrum (e.g., an IR source) and a second electromagnetic radiation source configured to illuminate a sample with a second portion of electromagnetic radiation in a second substantially monochromatic region of the electromagnetic spectrum (e.g., a laser source). The system also includes a detector module configured to detect a sample constituent of a sample by analyzing a characteristic of electromagnetic radiation reflected from the sample associated with the first electromagnetic radiation source and a characteristic of electromagnetic radiation reflected from the sample associated with the second electromagnetic radiation source.

Abstract translation: 描述了使用例如IR光谱组件和拉曼光谱分量的光谱仪检测的系统和技术。 例如，系统包括第一电磁辐射源，其配置成用电磁光谱的第一区域（例如，IR源）中的电磁辐射的第一部分照射样品，以及第二电磁辐射源，其被配置为用 在电磁光谱的第二基本单色区域中的电磁辐射的第二部分（例如，激光源）。 该系统还包括检测器模块，该检测器模块被配置为通过分析从与第一电磁辐射源相关联的样品反射的电磁辐射的特性和从与第二电磁辐射相关联的样品反射的电磁辐射的特征来检测样品的样品成分 资源。

公开(公告)号：US09869585B2

公开(公告)日：2018-01-16

申请号：US14412490

申请日：2013-07-03

Applicant: Smiths Detection Inc.

Inventor： David W. Schiering ,  Maxim Frayer ,  Peng Zou

IPC: G01J3/02 ,  G01J3/44 ,  G01J3/36 ,  G01J3/42 ,  G01J3/10

CPC classification number: G01J3/0256 ,  G01J3/108 ,  G01J3/36 ,  G01J3/42 ,  G01J3/44 ,  G01J2003/106

Abstract: Systems and techniques for optical spectrometer detection using, for example, IR spectroscopy components and Raman spectroscopy components are described. For instance, a system includes a first electromagnetic radiation source configured to illuminate a sample with a first portion of electromagnetic radiation in a first region of the electromagnetic spectrum (e.g., an IR source) and a second electromagnetic radiation source configured to illuminate a sample with a second portion of electromagnetic radiation in a second substantially monochromatic region of the electromagnetic spectrum (e.g., a laser source). The system also includes a detector module configured to detect a sample constituent of a sample by analyzing a characteristic of electromagnetic radiation reflected from the sample associated with the first electromagnetic radiation source and a characteristic of electromagnetic radiation reflected from the sample associated with the second electromagnetic radiation source.