公开(公告)号：US20180033602A1

公开(公告)日：2018-02-01

申请号：US15223200

申请日：2016-07-29

Applicant: Smiths Detection Inc.

Inventor： Vadym Berkout ,  Thomas D. Saul

IPC: H01J49/06 ,  H01J49/00 ,  H01J49/26

CPC classification number: H01J49/062 ,  H01J49/0027 ,  H01J49/0404 ,  H01J49/0477 ,  H01J49/105 ,  H01J49/26

Abstract: A low temperature plasma probe, a mass spectrometry system, and a method for using a low temperature plasma probe are described. In an embodiment, a low temperature plasma probe includes an intake capillary that provides an ion flow from a sample surface to a mass spectrometer; at least one low temperature plasma tube that provides low temperature plasma gas; at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.

公开(公告)号：US20180366309A1

公开(公告)日：2018-12-20

申请号：US16111185

申请日：2018-08-23

Applicant: Smiths Detection, Inc.

Inventor： Vadym Berkout ,  Thomas D. Saul

IPC: H01J49/06 ,  H01J49/26 ,  H01J49/00

Abstract: A low temperature plasma probe, a mass spectrometry system, and a method for using a low temperature plasma probe are described. In an embodiment, a low temperature plasma probe includes an intake capillary that provides an ion flow from a sample surface to a mass spectrometer; at least one low temperature plasma tube that provides low temperature plasma gas; at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.

公开(公告)号：US10096456B2

公开(公告)日：2018-10-09

申请号：US15223200

申请日：2016-07-29

Applicant: Smiths Detection Inc.

Inventor： Vadym Berkout ,  Thomas D. Saul

IPC: H01J49/00 ,  H01J49/06 ,  H01J49/26

Abstract: A low temperature plasma probe, a mass spectrometry system, and a method for using a low temperature plasma probe are described. In an embodiment, a low temperature plasma probe includes an intake capillary that provides an ion flow from a sample surface to a mass spectrometer; at least one low temperature plasma tube that provides low temperature plasma gas; at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.