公开(公告)号：US20170343787A1

公开(公告)日：2017-11-30

申请号：US15680962

申请日：2017-08-18

Applicant: Thorlabs, Inc.

Inventor： Alex CABLE ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC: G02B21/24 ,  G02B7/28 ,  G01B9/02 ,  G02B21/00 ,  G02B21/26

CPC classification number: G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

公开(公告)号：US20170276471A1

公开(公告)日：2017-09-28

申请号：US15469036

申请日：2017-03-24

Applicant: Thorlabs, Inc.

Inventor： James JIANG ,  Alex CABLE

IPC: G01B11/00 ,  G01B11/06 ,  G01B9/02

Abstract: Disclosed is an optical probe system that is capable of high speed, high precision, and high resolution 3D digitalization of engineered objects. The 3D dimensional data of the engineered object is measured using a swept source optical coherence tomography system with improved speed, spatial resolutions, and depth range. Also disclosed is a type of coordinate measurement machine (CMM) that is capable of performing high speed, high resolution, and non-contact measurement of engineered objects. The mechanic stylus in the touch-trigger probe of a conventional CMM is replaced with an optical stylus with reconfigurable diameter and length. The distance from the center of the optical stylus to the measurement probe is optically adjusted to match the height of the object to be measured quickly, which eliminates one dimensional movement of the probe and greatly improves the productivity.

公开(公告)号：US20210102799A1

公开(公告)日：2021-04-08

申请号：US17123979

申请日：2020-12-16

Applicant: Thorlabs, Inc.

Inventor： James JIANG ,  Alex CABLE

IPC: G01B11/00 ,  G01B11/24 ,  G01B9/02 ,  G01B11/06

Abstract: Disclosed is an optical probe system that is capable of high speed, high precision, and high resolution 3D digitalization of engineered objects. The 3D dimensional data of the engineered object is measured using a swept source optical coherence tomography system with improved speed, spatial resolutions, and depth range. Also disclosed is a type of coordinate measurement machine (CMM) that is capable of performing high speed, high resolution, and non-contact measurement of engineered objects. The mechanic stylus in the touch-trigger probe of a conventional CMM is replaced with an optical stylus with reconfigurable diameter and length. The distance from the center of the optical stylus to the measurement probe is optically adjusted to match the height of the object to be measured quickly, which eliminates one dimensional movement of the probe and greatly improves the productivity.

公开(公告)号：US20180156598A1

公开(公告)日：2018-06-07

申请号：US15885754

申请日：2018-01-31

Applicant: Thorlabs, Inc. ,  Praevium Research, Inc.

Inventor： Alex CABLE ,  Vijaysekhar Jayaraman ,  James Jiang ,  Benjamin Potsaid

IPC: G01B9/02 ,  H01S5/42

CPC classification number: G01B9/02083 ,  G01B9/02004 ,  G01B9/02007 ,  G01B9/02091 ,  H01S5/18366 ,  H01S5/4012 ,  H01S5/423 ,  H01S5/426

Abstract: An optical instrument including at least a first and second wavelength swept vertical cavity laser (VCL) sources. The wavelength sweeping ranges spanned by the first and second VCL sources may differ with a region of spectral overlap. The first and second VCL sources may be operable under different modes of operation, wherein the modes of operation differ in at least one of: sweep repetition rate, sweep wavelength range, sweep center wavelength, and sweep trajectory. A VCL source may also exhibit sweep-to-sweep variation. Apparatus and methods are described for aligning sample signal data from the first VCL and sample signal data from the second VCL to generate output digital data. The output digital data is aligned with respect to at least one of: wavelength, wavenumber, and interferometric phase. The apparatus and methods can also be used to phase stabilize successive sweeps from the same VCL source or wavelength swept source.

公开(公告)号：US20240061152A1

公开(公告)日：2024-02-22

申请号：US18234506

申请日：2023-08-16

Applicant: Thorlabs, Inc.

Inventor： Longfei YE ,  Ryan Joseph PRIORE ,  Bill DONOVAN ,  Alex CABLE

IPC: G02B1/111 ,  G02B1/118 ,  B05D3/14

CPC classification number: G02B1/111 ,  G02B1/118 ,  B05D3/148

Abstract: In a method of producing an anti-reflective surface, instead of etching subwavelength structures directly onto the substrate, a thin film layer of topcoat is deposited onto the surface of the substrate, and the anti-reflective surface is created by etching the structures into the topcoat. Because the thin film can be applied to substrates made of a large number of different materials, only common etching recipes need to be developed for a few thin film materials. The present method overcomes the shortcoming that existing methods of etching structures directly on a substrate would require a different etching recipe for each substrate made of a different material.

公开(公告)号：US20160216501A1

公开(公告)日：2016-07-28

申请号：US14994835

申请日：2016-01-13

Applicant: Thorlabs, Inc.

Inventor： Alex CABLE ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC: G02B21/24 ,  G02B21/26 ,  G02B5/12 ,  G02B21/08

CPC classification number: G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

Abstract translation: 公开了使用低相干干涉测量技术来创建用于光学显微镜的自动聚焦装置的几种技术方法。 这些方法允许自动聚焦在紧邻反射表面并在折射材料之后的薄结构，如覆盖滑动，以及将聚焦位置自动调节到样品区域中，而不受邻近表面反射的干扰。 补偿由覆盖样品的材料折射引起的测量偏移。 提出的是一种仪器的技术，允许在低相干干涉测量自动对焦系统中自动交换成像目标，这与TDI（时间延迟积分）成像，共聚焦和双光子荧光显微镜相结合是主要感兴趣的。