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公开(公告)号：US10982949B2
公开(公告)日：2021-04-20
申请号：US16697180
申请日：2019-11-27
Applicant: YOKOGAWA ELECTRIC CORPORATION
Inventor： Kazufumi Nishida , Hitoshi Hara , Kazuki Setsuda
Abstract: A measurement apparatus includes a detection unit to detect a first light intensity of a light obtained by making a first light having a first wavelength transmitted through a measurement object, a second light intensity of a light obtained by making a second light having a second wavelength transmitted through the object, the second wavelength having a lower rate of absorption by a material of the object than the first wavelength, and a third light intensity of a light obtained by making a third light having a third wavelength transmitted through the object, the third wavelength having a lower rate of absorption by the material of the object than the first wavelength and having a lower rate of absorption by the object containing a fluid than the second wavelength, and a calculation unit to calculate the thickness of the object by using the first, second, and third light intensities.
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公开(公告)号：US20240397602A1
公开(公告)日：2024-11-28
申请号：US18655734
申请日：2024-05-06
Applicant: Yokogawa Electric Corporation
Inventor： Tomoya Taguchi , Kazuki Setsuda
Abstract: A vacuum tube support structure includes a vacuum tube, a cover configured to cover the vacuum tube, and a support member configured to support the vacuum tube and the cover. The cover includes a fluid introduction port configured to allow a fluid to pass through the cover to introduce the fluid inside the cover and a fluid discharge port configured to allow the fluid to pass through the cover to discharge the fluid from inside the cover. The fluid introduced through the fluid introduction port contacts the vacuum tube and is discharged through the fluid discharge port.
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公开(公告)号：US10345231B2
公开(公告)日：2019-07-09
申请号：US15822398
申请日：2017-11-27
Applicant: Yokogawa Electric Corporation
Inventor： Kazuki Setsuda , Naomichi Chida , Kazufumi Nishida
IPC: G01N21/3559 , H03F3/08 , G01N21/31 , G01N21/359
Abstract: A signal detection device according to one aspect of the present invention includes a receiver configured to receive a signal including at least a first signal component modulated by a first frequency and a second signal component modulated by a second frequency, and a detector configured to generate, using a base signal, a first reference signal to be used for detecting the first signal component and a second reference signal to be used for detecting the second signal component, perform lock-in detection on the signal received by the receiver using the first reference signal to obtain a first detection signal, perform lock-in detection on the signal received by the receiver using the second reference signal to obtain two second detection signals having different phases from each other, and change at least one of a frequency and a phase of each of the first and second reference signals to set one of the two second detection signals to zero.
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Patent Agency Ranking
公开(公告)号：US09170194B2
公开(公告)日：2015-10-27
申请号：US14388298
申请日：2013-03-28
Applicant: YOKOGAWA ELECTRIC CORPORATION
Inventor： Yasushi Ichizawa , Kumiko Horikoshi , Kazuki Setsuda , Naomichi Chida
IPC: G01N21/3559 , G01N21/59 , G01N21/86 , G01J5/02 , G01N21/31
CPC classification number: G01N21/3559 , G01N21/59 , G01N21/86 , G01N2021/3148 , G01N2021/3174 , G01N2021/3181 , G01N2021/8663 , G01N2201/0627
Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.
Abstract translation: 材料性质测量装置包括：辐射源照射器，被配置为用测量目标材料照射具有n个不同波长的辐射束;检测器，被配置为检测在测量目标材料照射后具有各个波长的辐射束的强度;以及处理 单元，被配置为使用校正系数校正具有至少一部分各个波长的辐射束的检测强度，其中行和列分别由n或更小的阶数的矩阵表示，并且计算指示 基于校正后具有各波长的辐射束的相对强度，测量目标材料的特性。
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公开(公告)号：US11867636B2
公开(公告)日：2024-01-09
申请号：US16984185
申请日：2020-08-04
Applicant: YOKOGAWA ELECTRIC CORPORATION
Inventor： Kazuki Setsuda , Hitoshi Hara , Yasushi Ichizawa
IPC: G01N21/86 , G01B11/06 , G01N21/3559
CPC classification number: G01N21/86 , G01B11/0691 , G01N21/3559 , G01N2021/869 , G01N2021/8618 , G01N2021/8663
Abstract: A measurement device to measure a physical quantity of a measurement target having a sheet-like shape is provided, including: a first integrating sphere which is separated by a gap from a first surface of the measurement target, has a first opening facing the first surface, and is not provided with a light detector to detect an intensity of light; a second integrating sphere which is separated by a gap from a second surface of the measurement target, where the second surface is positioned opposite to the first surface, and has a second opening facing the first opening with the measurement target sandwiched therebetween; a light source to emit light into the first integrating sphere; a light detecting unit to detect an intensity of light inside the second integrating sphere; and a calculating unit to calculate the physical quantity of the measurement target based on the intensity of the detected light.
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公开(公告)号：US10481082B2
公开(公告)日：2019-11-19
申请号：US16026759
申请日：2018-07-03
Applicant: YOKOGAWA ELECTRIC CORPORATION
Inventor： Kazuki Setsuda , Naomichi Chida
Abstract: A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.
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公开(公告)号：US20190011353A1
公开(公告)日：2019-01-10
申请号：US16026759
申请日：2018-07-03
Applicant: YOKOGAWA ELECTRIC CORPORATION
Inventor： Kazuki Setsuda , Naomichi Chida
CPC classification number: G01N21/255 , G01N21/3103 , G01N21/3559 , G01N21/86 , G01N33/346 , G01N33/442 , G01N2021/3148 , G01N2021/8636 , G01N2021/8663 , G01N2021/869 , G01N2201/061
Abstract: A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.
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公开(公告)号：US20150090885A1
公开(公告)日：2015-04-02
申请号：US14388298
申请日：2013-03-28
Applicant: YOKOGAWA ELECTRIC CORPORATION,
Inventor： Yasushi Ichizawa , Kumiko Horikoshi , Kazuki Setsuda , Naomichi Chida
IPC: G01N21/3559 , G01N21/86 , G01N21/59
CPC classification number: G01N21/3559 , G01N21/59 , G01N21/86 , G01N2021/3148 , G01N2021/3174 , G01N2021/3181 , G01N2021/8663 , G01N2201/0627
Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.
Abstract translation: 材料性质测量装置包括：辐射源照射器，被配置为用测量目标材料照射具有n个不同波长的辐射束;检测器，被配置为检测在测量目标材料照射后具有各个波长的辐射束的强度;以及处理 单元，被配置为使用校正系数校正具有至少一部分各个波长的辐射束的检测强度，其中行和列分别由n或更小的阶数的矩阵表示，并且计算指示 基于校正后具有各波长的辐射束的相对强度，测量目标材料的特性。
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