公开(公告)号：US20160195433A1

公开(公告)日：2016-07-07

申请号：US14986861

申请日：2016-01-04

Applicant: Yokogawa Electric Corporation ,  YOKOGAWA METERS & INSTRUMENTS CORPORATION

Inventor： Tsutomu Kaneko ,  Manabu Kojima

IPC: G01J3/18 ,  G02B27/28 ,  G01J3/26 ,  G02B27/00 ,  G01J3/02 ,  G02B17/00 ,  G02B5/30 ,  G02B27/42

CPC classification number: G01J3/18 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0216 ,  G01J3/0224 ,  G01J3/04 ,  G01J3/26 ,  G01J2003/262 ,  G02B5/3083 ,  G02B17/008 ,  G02B27/286 ,  G02B27/4244

Abstract: An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.

Abstract translation: 光学装置包括：衍射光栅; 含有双折射材料的去极化板以消除衍射光栅的偏振依赖性; 以及光学校正器，被配置为光学校正由衍射光栅衍射引起的衍射光的衍射角偏差。 光学校正器可以被配置为将由衍射光栅衍射的衍射光弯曲回来，以将光重新发射到衍射光栅。

公开(公告)号：US5357340A

公开(公告)日：1994-10-18

申请号：US838771

申请日：1992-03-10

Applicant: Michael Zochbauer

Inventor： Michael Zochbauer

IPC: G01J3/12 ,  G01J3/26 ,  G01J3/45 ,  G01B9/02

CPC classification number: G01J3/26 ,  G01J2003/1269 ,  G01J2003/262

Abstract: The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.

Abstract translation: PCT No.PCT / DE90 / 00747 Sec。 371日期：1992年3月10日 102（e）1992年3月10日PCT PCT 1990年10月1日PCT公布。 公开号WO91 / 05988 日期：1991年5月2日。本发明涉及一种法布里 - 珀罗光谱法，该方法使用辐射路径中的光谱仪，其具有辐射源，辐射通过的两个连续的法布里 - 珀罗干涉滤光器，物质的混合物 被检查和一个检测器。 将第一法布里 - 珀罗滤光器F1的光学层厚度设定为给定值，并调制第二法布里 - 珀罗滤光片F2的光学层厚度。 作为层厚度的函数的所得干涉图是待检查物质的特征。 在检测器D处接收到的干涉图被数学变换转换为作为波数的函数的频谱。

公开(公告)号：US11965779B2

公开(公告)日：2024-04-23

申请号：US17763957

申请日：2020-10-28

Applicant: TimeGate Instruments Oy

Inventor： Lauri Kurki ,  Ilkka Alasaarela ,  Jussi Tenhunen

IPC: G01J3/44 ,  G01J3/02 ,  G01J3/14 ,  G01J3/18 ,  G01J3/26

CPC classification number: G01J3/44 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0297 ,  G01J3/14 ,  G01J3/1895 ,  G01J3/26 ,  G01J2003/262

Abstract: An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.

公开(公告)号：US20180094977A1

公开(公告)日：2018-04-05

申请号：US15718475

申请日：2017-09-28

Applicant: European Space Agency

Inventor： Matteo Taccola

IPC: G01J3/26 ,  G02B17/06 ,  G02B5/18 ,  G01J3/18 ,  G01J3/28

CPC classification number: G01J3/26 ,  G01J3/021 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/1809 ,  G01J3/2823 ,  G01J2003/262 ,  G02B5/1861 ,  G02B17/061 ,  G02B17/0615

Abstract: An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.

公开(公告)号：US09863810B2

公开(公告)日：2018-01-09

申请号：US14986861

申请日：2016-01-04

Applicant: Yokogawa Electric Corporation ,  YOKOGAWA TEST & MEASUREMENT CORPORATION

Inventor： Tsutomu Kaneko ,  Manabu Kojima

IPC: G01J3/18 ,  G02B27/28 ,  G01J3/26 ,  G02B27/00 ,  G01J3/02 ,  G02B17/00 ,  G02B5/30 ,  G02B27/42

CPC classification number: G01J3/18 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0216 ,  G01J3/0224 ,  G01J3/04 ,  G01J3/26 ,  G01J2003/262 ,  G02B5/3083 ,  G02B17/008 ,  G02B27/286 ,  G02B27/4244

Abstract: An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.