CALIBRATION MECHANISM FOR THERMAL IMAGING SYSTEMS

    公开(公告)号:US20240159594A1

    公开(公告)日:2024-05-16

    申请号:US18510222

    申请日:2023-11-15

    Applicant: OroraTech GmbH

    Inventor: Lucas Krempel

    CPC classification number: G01J5/52 G01J5/0804 G01J2005/0077

    Abstract: A method and an imaging system for providing an infrared image of an object comprises an optical element configured to capture infrared radiation from the object, an infrared sensing module, a processing unit, and a shutter assembly. The infrared sensing module comprises a plurality of infrared detectors, each configured to receive the infrared radiation from the object after passage through the optical element and generate a measurement signal from the received infrared radiation. The processing unit is coupled to the infrared sensing module and configured to convert the measurement signals into temperature data associated with the object for providing the infrared image. The shutter assembly is disposed between the infrared sensing module and the optical element, and is configured to selectively pass the infrared radiation from the object through to the infrared sensing module. The shutter assembly comprises a temperature controller configured to adjust a temperature of the shutter assembly.

    Systems and methods of adaptive two-wavelength single-camera imaging thermography (ATSIT) for accurate and smart in-situ process temperature measurement during metal additive manufacturing

    公开(公告)号:US11874176B2

    公开(公告)日:2024-01-16

    申请号:US17015062

    申请日:2020-09-08

    Abstract: A two-wavelength, single-camera imaging thermography system for in-situ temperature measurement of a target, comprising: a target light path inlet conduit for receiving a target light beam reflected from the target; a beam splitter installed in a splitter housing at a distal end of the target light path conduit, wherein the beam splitter divides the target light beam into a first light beam and a second light beam; a first light path conduit emanating from the splitter housing comprising a first aperture iris installed within the first light path conduit for aligning the first light beam; a first band pass filter installed within the first light path conduit for regulating the first light beam to a first wavelength λ1 and an optional half waveplate installed within the first light path conduit to modulate a polarization ratio of the first light beam of λ1 wavelength; a second light path conduit emanating from the splitter housing comprising a second aperture iris installed within the second light path conduit for aligning the second light beam; a second band pass filter installed within the second light path conduit for regulating the second light beam to a second wavelength λ2; a junction housing, wherein distal ends of each of the first and second light path conduits are connected to the junction housing; a polarizing beam splitter installed in the junction housing, wherein the polarizing beam splitter reflects the first light beam of λ1 wavelength along the same path or a parallel path of the second light beam of λ2 wavelength that passes directly through the polarizing beam splitter unreflected to create a merged light beam comprising light of λ1 and λ2 wavelengths; and a light path outlet conduit connected to the junction for directing the merged beam to a high-speed camera for imaging.

Patent Agency Ranking