中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

12 records (took 0.027 seconds)

    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES
    3.
    发明公开
    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES 审中-公开

    公开(公告)号：EP4249894A2

    公开(公告)日：2023-09-27

    申请号：EP23163015.3

    申请日：2023-03-21

    Applicant: Apple Inc.

    Inventor： PELC, Jason S. ,  ARBORE, Mark A. ,  TERREL, Matthew A. ,  GREENING, Thomas C. ,  TU, Yongming ,  GAN, Lucia

    IPC: G01N21/25 ,  G01N21/31

    Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

    BROADBAND MULTIMODE WAVEGUIDE INTERFACES
    4.
    发明公开
    BROADBAND MULTIMODE WAVEGUIDE INTERFACES 审中-公开

    公开(公告)号：EP4530687A1

    公开(公告)日：2025-04-02

    申请号：EP24202907.2

    申请日：2024-09-26

    Applicant: Apple Inc.

    Inventor： ARBORE, Mark A.

    IPC: G02B6/12 ,  G02B6/122 ,  G02B6/125 ,  G02B6/28

    Abstract: A photonic integrated circuit as discussed herein may include one or more multimode waveguide interfaces that define a corresponding transition between a waveguide and a free propagation region of a photonic integrated circuit. Specifically, a multimode waveguide interface may include an input waveguide that is connected to an interferometric waveguide, and a slab waveguide connected to the interferometric waveguide. The input waveguide and interferometric waveguide are positioned and configured to convert a portion of a first mode of light into a second mode of light, such that the first and second modes interfere within the interferometric waveguide. The interferometric waveguide is configured such that these modes are in phase for a first target wavelength and out of phase for a second target wavelength at an interface between the interferometric waveguide and the slab waveguide.

    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE
    5.
    发明公开
    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE 审中-公开
    光学检测系统和方法，包括考虑样品内光程长度的变化

    公开(公告)号：EP3213053A1

    公开(公告)日：2017-09-06

    申请号：EP15825998.6

    申请日：2015-12-22

    Applicant: Apple Inc.

    Inventor： TERREL, Matthew A. ,  ARBORE, Mark A.

    IPC: G01N21/49 ,  G01N21/17 ,  G01N21/47

    CPC classification number: G01N21/59 ,  G01N21/49 ,  G01N2021/1782 ,  G01N2021/4709 ,  G01N2021/4711 ,  G01N2201/066 ,  G01N2201/0691 ,  G01N2201/0696 ,  G01N2201/12

    Abstract: An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.

    Abstract translation: 照明器/收集器组件（104）可以将入射光（106）传送到样本（102）并且收集从样本（102）返回的返回光（112）。 传感器（114）可以测量作为收集的返回光（112）的射线位置和射线角度的函数的射线强度。 光线选择器可以选择来自传感器（114）处收集的符合第一选择标准的返回光（112）的第一射线子集。 在一些示例中，光线选择器可以将光线强度聚合成箱，每个箱对应于在光学路径长度的相应范围内的估计光学路径长度内在收集的返回光（112）内穿过样本（102）内的光线。 表征器可以基于射线强度，射线位置以及射线第一子集的射线角度来确定样本（102）的物理属性，例如吸收率。 考虑样本内穿过的光程长度变化可以提高精度。

    DESPECKLING IN OPTICAL MEASUREMENT SYSTEMS
    6.
    发明公开
    DESPECKLING IN OPTICAL MEASUREMENT SYSTEMS 审中-实审

    公开(公告)号：EP4343374A1

    公开(公告)日：2024-03-27

    申请号：EP23197128.4

    申请日：2023-09-13

    Applicant: Apple Inc.

    Inventor： TERREL, Matthew A. ,  GERE, David S. ,  SUGARBAKER, Alexander F. ,  GREENING, Thomas C. ,  PELC, Jason S. ,  ARBORE, Mark A.

    IPC: G01S7/481 ,  G01N21/25

    Abstract: Embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. The optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. Each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. The optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.

    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES
    7.
    发明公开
    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES 审中-公开

    公开(公告)号：EP4249894A3

    公开(公告)日：2023-10-04

    申请号：EP23163015.3

    申请日：2023-03-21

    Applicant: Apple Inc.

    Inventor： PELC, Jason S. ,  ARBORE, Mark A. ,  TERREL, Matthew A. ,  GREENING, Thomas C. ,  TU, Yongming ,  GAN, Lucia

    IPC: G01N21/25 ,  G01N21/31

    Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE
    8.
    发明公开
    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE 审中-公开

    公开(公告)号：EP4220134A1

    公开(公告)日：2023-08-02

    申请号：EP23165899.8

    申请日：2015-12-22

    Applicant: Apple Inc.

    Inventor： TERREL, Matthew A. ,  ARBORE, Mark A.

    IPC: G01N21/49 ,  G01N21/17 ,  G01N21/47

    Abstract: An illuminator/collector assembly (104) can deliver incident light (106) to a sample (102) and collect return light (112) returning from the sample (102). A sensor (114) can measure ray intensities as a function of ray position and ray angle for the collected return light (112). A ray selector (116) can select a first subset of rays from the collected return light (112) at the sensor (114) that meet a first selection criterion. In some examples, the ray selector (116) can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light (112) that traverse within the sample (102) an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample (102), such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample (102) can improve accuracy.

Patent Agency Ranking