LOW CURRENT POGO PROBING CARD
    1.
    发明专利

    公开(公告)号:JPH1126527A

    公开(公告)日:1999-01-29

    申请号:JP16084098

    申请日:1998-06-09

    Abstract: PROBLEM TO BE SOLVED: To enhance the insulation between traces where stressed leak currents appear and suppress the crosstalk between trace sets by electrically connecting guard traces having a top surface shape of a card to auxiliary guard traces at a set of conductor pairs formed through a top dielectric layer. SOLUTION: A laminate board 158 includes a top dielectric layer, bottom dielectric and guide traces 204 disposed between the top and bottom dielectric layers and has an opening 166 and top and bottom main surfaces. The probe device comprises a probe needle 164 and electric contact electrically connected to the needle 164 and is disposed on the top main surface on which the probe devices are radially disposed with respect to the opening 166 and extends down below the opening 166. Pogo-pin accepting pad sets 170, first conductors for electrically connecting the sets 170 to the guard traces 204 and second conductors for connecting electric contacts to the sets 170 are provided.

    PROBE STATION THERMAL CHUCK FOR SHIELDING CAPACITANCE CURRENT

    公开(公告)号:JP2001068515A

    公开(公告)日:2001-03-16

    申请号:JP2000197550

    申请日:2000-06-30

    Abstract: PROBLEM TO BE SOLVED: To reduce noises caused by a capacitance current and affecting test and measurement to a value less than an allowable value by shielding the capacitance current produced by a thermal unit for changing the temperature of a chuck for supporting a device, in a probe station for testing and measuring an integrated circuit device. SOLUTION: This thermal chuck includes a chuck 4 for supporting a device during testing, a thermal unit for changing the temperature of the chuck 4, and a conductive member which is connected to the thermal unit as a capacitance but is not in direct electrical contact therewith. The conductive member is connected electrically to a controller 18 for supplying electricity to the thermal unit and provides a conductive passage for taking almost all the capacitance current generated by the operation of the thermal unit and flowing the current to the controller 18. In order to take the capacitance current generated by the conductive member and to flow the current to a ground outside the closed box 2, the expansion portion of the environment closed box 2 of the probe station is coupled capacitatively to the conductive member.

    PROBE STATION WITH LOW NOISE CHARACTERISTICS
    4.
    发明申请
    PROBE STATION WITH LOW NOISE CHARACTERISTICS 审中-公开
    低噪声特征的探测站

    公开(公告)号:WO2004044949A3

    公开(公告)日:2004-10-14

    申请号:PCT/US0333842

    申请日:2003-10-24

    Abstract: A cable (30) includes an inner conductor (50), an inner dielectric (52), and a guard conductor (56), where the inner dielectric (52) is between the inner conductor (50) and the guard conductor (56). The cable also includes an outer dielectric (58), and a shield conductor (62), where the outer dielectric (58) is between the guard conductor (56) and the shield conductor (62). The cable further includes an additional layer of material between the outer dielectric and the shield conductor (30) of suitable composition for reducing triboelectric current generation between the outer dielectric (58) and the shield conductor (62) to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    Abstract translation: 电缆(30)包括内部导体(50),内部电介质(52)和保护导体(56),其中内部电介质(52)在内部导体(50)和保护导体(56)之间, 。 电缆还包括外部电介质(58)和屏蔽导体(62),其中外部电介质(58)在保护导体(56)和屏蔽导体(62)之间。 电缆还包括在外部电介质和屏蔽导体(30)之间的适当组合物的附加材料层,用于减少外部电介质(58)和屏蔽导体(62)之间产生的摩擦电流,小于将发生的摩擦电流 外部电介质和屏蔽导体彼此直接相连。

    Probe station with low noise characteristics

    公开(公告)号:AU2003291650A8

    公开(公告)日:2004-06-03

    申请号:AU2003291650

    申请日:2003-10-24

    Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    PROBE STATION WITH LOW NOISE CHARACTERISTICS

    公开(公告)号:AU2003291650A1

    公开(公告)日:2004-06-03

    申请号:AU2003291650

    申请日:2003-10-24

    Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

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