SINGLE DEVELOPMENT STEP, DUAL LAYER PHOTORESIST PHOTOLITHOGRAPHIC PROCESS

    公开(公告)号:DE3573044D1

    公开(公告)日:1989-10-19

    申请号:DE3573044

    申请日:1985-03-13

    Applicant: IBM

    Abstract: @ A photoresist photolithographic process is disclosed which provides for a single development step to develop a dual layer photoresist for lift-off, reactive ion etching, or ion implantation processes requiring a precise aperture size at the top of the photoresist layer.The process involves the deposition of two compositionally similar layers, with the first layer having the characteristic of being soluble in a developer after exposure to light and baking, and the second layer having the characteristic of being insoluble in the same developer after having been exposed to light and baked. With these two distinct characteristics for the two layers of photoresist, the effective aperture for windows in the composite photoresist can be tightly controlled in its cross-sectional dimension in the face of large variations in the developer concentration and devel- opmenttime.

    6.
    发明专利
    未知

    公开(公告)号:DE2743763A1

    公开(公告)日:1978-04-06

    申请号:DE2743763

    申请日:1977-09-29

    Applicant: IBM

    Abstract: A positive relief image is produced by coating a substrate with a layer of a copolymer containing about 90-98 mole percent of polymerized lower alkyl methacrylate units and about 2-10 mole percent of polymerized lower haloalkyl methacrylate units, heating the layer to cause cross-linking between polymer chains by removal of hydrogen halide, patternwise exposing the layer with high energy radiation such as a scanning electron beam, and removing the exposed portion of the layer with a solvent developer.

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