Abstract:
A matrix addressed display system designed so as to enable data line (22) repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line (22) repair utilizes additional data driver (36) outputs, a defect map memory (48) in the TFT/LCD module and modification of the data stream to the data drivers (36) by additional circuits (42) between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.
Abstract:
PROBLEM TO BE SOLVED: To make possible easily and inexpensively repairing an omission in a data line by selectively activating a selected non-committed data driver and providing a data signal on a conductive line. SOLUTION: In an array 32, the number of output lines of respective data drivers 36 are increased for adding an auxiliary driver to a glass panel 34. An electric connector used for connecting an LCD panel to a data source of a host computer, etc., requires a PROM chip selecting excess line only by a piece, and other PROM signals are multiplexed by existing lines. After reset, a controller 42 decides when the input data are lapped in a temporary memory from an address in a defective map for using on an auxiliary line 38. The data supplied to a display are corrected related to defective line information stored in the memory, and the selected non-committed data driver 36 is a ctivated selectively, and the data signal is provided on the conductive line.
Abstract:
PROBLEM TO BE SOLVED: To provide a metal wiring structure for a uniform current density in a C4 ball. SOLUTION: A sub-pad assembly of a metal structure is arranged directly underneath a metal pad. The sub-pad assembly includes an upper level metal line structure that comes into contact with the metal pad and a set of metal vias that provide electrical connection between the upper level metal line structure and a lower level metal line structure arranged underneath of the upper level metal line structure. The reliability of a C4 ball is improved by using a metal pad structure having a set of integrated metal vias that are divided and distributed to promote an uniform current density distribution in the C4 ball. The areal density of the cross-sectional area of the plurality of metal vias is higher at the center part of the metal pad than at the peripheral edge part of the flat part of the metal pad. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
A matrix addressed display system designed so as to enable data line (22) repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line (22) repair utilizes additional data driver (36) outputs, a defect map memory (48) in the TFT/LCD module and modification of the data stream to the data drivers (36) by additional circuits (42) between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.
Abstract:
A matrix addressed display system designed so as to enable data line (22) repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line (22) repair utilizes additional data driver (36) outputs, a defect map memory (48) in the TFT/LCD module and modification of the data stream to the data drivers (36) by additional circuits (42) between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.
Abstract:
A matrix addressed display system designed so as to enable data line (22) repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line (22) repair utilizes additional data driver (36) outputs, a defect map memory (48) in the TFT/LCD module and modification of the data stream to the data drivers (36) by additional circuits (42) between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.
Abstract:
Unpinned metal-oxide-compound semiconductor structures are disclosed and a method of fabricating such structures is described. Epitaxial layers of compound semiconductor (14) are grown by MBE which results in the formation of a smooth surface having a stabilized reconstruction. An elemental semiconductor layer (16) is deposited epitaxially in situ with the compound semiconductor layer (14) which unpins the surface Fermi level. A layer of insulator material (18) is then deposited on the elemental semiconductor layer (16) by PECVD. In one embodiment, the compound semiconductor (14) is GaAs and the elemental semiconductor (16) is Si. The insulator material (18) is a layer of high quality SiO2. A metal gate (20) is deposited on the SiO2 layer (18) to form a MOS device (13). The epitaxial GaAs layer (14) has a density of states which permits the interface Fermi level to be moved through the entire forbidden energy gap. In another embodiment, the SiO2 deposition completely consumes the interface Si layer (16) so that the resulting MOS device comprises SiO2 (18) directly overlying the GaAs layer (14).
Abstract:
Unpinned metal-oxide-compound semiconductor structures are disclosed and a method of fabricating such structures is described. Epitaxial layers of compound semiconductor (14) are grown by MBE which results in the formation of a smooth surface having a stabilized reconstruction. An elemental semiconductor layer (16) is deposited epitaxially in situ with the compound semiconductor layer (14) which unpins the surface Fermi level. A layer of insulator material (18) is then deposited on the elemental semiconductor layer (16) by PECVD. In one embodiment, the compound semiconductor (14) is GaAs and the elemental semiconductor (16) is Si. The insulator material (18) is a layer of high quality SiO2. A metal gate (20) is deposited on the SiO2 layer (18) to form a MOS device (13). The epitaxial GaAs layer (14) has a density of states which permits the interface Fermi level to be moved through the entire forbidden energy gap. In another embodiment, the SiO2 deposition completely consumes the interface Si layer (16) so that the resulting MOS device comprises SiO2 (18) directly overlying the GaAs layer (14).