Abstract:
PURPOSE: An analog to digital converter and an image sensor including the same are provided to improve a working speed without the additional consumption of power or a circuit size by arranging a modulation unit including a plurality of modulators. CONSTITUTION: An analog to digital converter(1000) includes a modulation unit(1100) and a digital signal generation unit(1200). The modulation unit is arranged in one or more column lines from a plurality of column lines. The plurality of column lines respectively provides analog input signals. The modulation unit calculates the analog input signal provided from corresponding column lines. The modulation unit generates a digital bit stream signal corresponding to a part of digital signal bits in each stage. The digital signal generation unit generates a digital signal corresponding to the analog input signal by counting digital bit stream signals.
Abstract:
본 발명은 네비게이션 태스크와, 공통버퍼와, GUI 태스크사이의 상호작용을 통하여 MP3, JPEG, DivX 등 거의 모든 컨텐츠에 대하여 하나의 화면에 해당 컨텐츠의 데이터 파일 정보 및 헤더 데이터 정보를 함께 디스플레이함으로서 사용자가 원하는 데이터 파일 항목을 보다 쉽고 편리하게 실행하여 감상할 수 있다. 이를 위해 본 발명은 복수의 필드로 이루어진 화면을 갖는 디스플레이부와, 복수의 데이터 파일이 저장된 디스크와, 데이터 파일의 일반정보 및 상태정보를 저장하는 공통 버퍼와, 저장메시지에 따라 디스크에 저장된 데이터 파일의 일반정보 및 상태정보를 읽어 공통버퍼에 정보별로 구분하여 저장시키는 네비게이션 태스크와, 사용자의 명령에 따라 네비게이션 태스크에 해당 데이터 파일에 대한 저장메시지를 전송하고, 네비게이션 태스크에 의해 공통 버퍼에 저장된 정보를 읽어 디스플레이부의 각 필드별로 디스플레이시키는 GUI 태스크를 포함한다.
Abstract:
본 발명에 따른 상태 기반 불휘발성 메모리 장치의 에러 정정 방법은, 부호어(Codeword)를 선택된 메모리 셀들에 할당하되, 상기 부호어 중 제 1 비트 그룹을 제 1 메모리 셀에, 상기 부호어 중 제 2 비트 그룹을 제 2 메모리 셀에 할당하는 단계, 그리고 상기 부호어를 상기 선택된 메모리 셀들에 프로그램하는 단계를 포함하되, 상기 제 1 비트 그룹과 상기 제 2 비트 그룹은 각각 상기 부호어 상에서 연속되는 비트들이다.
Abstract:
PURPOSE: A flash memory device, a program method thereof, and a read-out method thereof are provided to program at least N+1 bits in a single memory cell by sequentially executing a programming process for the upper program state and the lower program state of an N-th page. CONSTITUTION: A flash memory device comprises a control logic(160) and a bit level conversion control circuit(180). The control logic controls a program or read-out process regarding the first or N bit of data in response to a program command or read-out command. When the program or read-out process regarding the first or N bit of the data is completed, the bit level conversion control circuit executes a program or read-out process for an N+1 bit of the data in response to a control signal.
Abstract:
PURPOSE: A sequence replacement method and a device thereof are provided to improve the reliability of a memory device by replacing a specific sequence which is not required with a different sequence. CONSTITUTION: A sequence replacing unit(160) comprises a storage part and a sequence substitution circuit. The storage part stores an m number of sequences which are predefined. The sequence substitution circuit receives a first sequence outputted from a host. When the first sequence is the same as one among the m number of sequences, the sequence substitution circuit outputs a substitution sequence to a memory device instead of the first sequence. The substitution sequence includes pattern bits which represent the pattern of the first sequence and location bits which represent the start location of the first sequence.
Abstract:
PURPOSE: A memory system and a bad block management method thereof are provided to improve the efficiency of a memory block. CONSTITUTION: A first step is processed to determine that a memory block satisfies a bad block condition(S110). When the memory block satisfies the bad block condition, a subsequent treatment operates in the memory block(S120). The memory block is allocated to the bad block(S130). When the bad block satisfies a bad block release condition, the bad block is released. The subsequent treatment programs a cell in the erase state into a program state cell or stores the timing to assign the memory block as the bad block.
Abstract:
PURPOSE: A nonvolatile semiconductor memory device, a memory card thereof, a memory system thereof, and a read voltage estimation method thereof are provided to prevent data error due to the change of read voltage by estimating optimum read voltage through comparing data information during a program process and a read process. CONSTITUTION: A memory cell array(110) comprises a plurality of memory cells. A read voltage estimating unit(20) compares data information during a program process and a read process. The read voltage estimating unit estimates optimum read voltage by changing the read voltage based on the comparison result. A read voltage generating unit(10) generates a corresponding read voltage in response to a control signal of the read voltage estimating unit. A reference data storage unit stores the reference data drawn from program data.
Abstract:
PURPOSE: A memory device and a method for programming memory data are provided to reduce a stabilization time of a threshold voltage and improve distribution of the threshold voltage of memory cells by controlling the intervals and the sizes of a plurality of pulses applied to a plurality of memory cells. CONSTITUTION: A memory cell array(310) includes a plurality of memory cells. A programming unit(320) repetitively applies plus pulses and minus pulses to a plurality of memory cells. A controller controls the interval between the plus pulses and the minus pulses and the size of the pulses.
Abstract:
An apparatus for detecting memory data based on a soft decision value are provided to minimize an error of data stored in a memory cell by allotting a soft decision value according to error information. In an apparatus for detecting memory data based on a soft decision value, a reference voltage determination unit(110) determines a soft decision value based on channel information of a memory cell. A voltage comparative part(120) determines a period which includes a threshold voltage by comparing the threshold voltage of the memory cell with a plurality of soft-decision reference voltages. A data detection part detects data stored in memory cell by a period where a threshold voltage is included. A pilot data storage module(140) stores pilot data of the small bit pattern in the memory cell. The data detection part detects the pilot data stored in the memory cell. A channel information estimating unit(150) estimates the channel information of the memory cell based on detected data.
Abstract:
A memory device and a memory reading method thereof are provided to improve the performance of an error correction by performing the ECC(Error Correction Code) decoding of the data read from the multi bit cells. A memory device(100) includes a multi bit cell array(110), an error detector(120), and a data estimator(130). The error detector reads a first data page from a memory page(111) inside the multi bit cell array. The error detector performs ECC decoding of the first data page and detects the error bit of the first data page. The estimator identifies the multi bit cell with an error bit. The estimator estimates the data of the second data page stored in the identified multi bit cell.