Abstract:
The invention relates to an energy conversion device (10), comprising: - first (20) and second (30) electrodes intended to be connected to the terminals of an electrical load (60); - an electret (40) placed opposite the first electrode (20), mounted movably with respect to the first electrode (20) according to a degree of freedom in a plane, so that a relative movement between the electret and the first electrode induces a difference in potential between the electrodes. Moreover: - the electret (40) comprises a continuous layer exhibiting a series of projections (42) extending along a direction (z) perpendicular to said plane, the projections being distributed with a pitch (P) which is smaller than the travel between the first electrode and the electret; - the first electrode (20) exhibits faces (21) opposite the electret, these faces being distributed with an identical pitch to the pitch of the projections of the electret.
Abstract:
A vibration transducer includes a silicon single crystal vibration beam provided over a silicon single crystal substrate, the vibration beam having a sectional shape that is longer in a direction perpendicular to a surface of the silicon single crystal substrate than in a direction parallel with it, a shell made of silicon, surrounding the vibration beam with a gap, and forming a vacuum room together with the silicon single crystal substrate, a plate-like first electrode plate disposed parallel with the surface of the silicon single crystal substrate, the first electrode plate having one end connected to the vibration beam, plate-like second and third electrode plates disposed parallel with the surface of the silicon single crystal substrate so as to be opposed to each other with the vibration beam interposed in between, and asperities formed on confronting side surfaces of the vibration beam and the second and third electrode plates.
Abstract:
A protective film (20) of an SiO2 thin film is formed on a front surface of an Si substrate (12), and a part of the protective film (20) is removed to form an etching window (22). A sacrifice layer (23) of polycrystalline Si is formed in the etching window (22). A protective film (24) of SiO2 is formed on the front surface of the Si substrate (12) from the top of the sacrifice layer (23), and a thin film (13) as an element formed of polycrystalline Si is further formed on the protective film (24). A backside etching window (26) is opened in a protective film (21) on the back side of the Si substrate (12). The Si substrate (12) is soaked in TMAH to perform crystal anisotropic etching in the Si substrate (12) through the backside etching window (26) to provide a through-hole (14) in the Si substrate (12).; When the sacrifice layer (23) is exposed to the interior of the through-hole (14), the sacrifice layer (23) is etching-removed to provide a gap (19) between the protective film (24) and the Si substrate (12) and crystal anisotropic etching of the Si substrate (12) is carried out from its front side and backside.
Abstract:
A vibrating gyrosensor includes a support substrate on which a wiring pattern having a plurality of lands is formed, and a vibrating element mounted on a surface of the support substrate. The vibrating element includes a base part having a mounting surface on which a plurality of terminals, and a vibrator part integrally projected in a cantilever manner from one of the sides of the base part and having a substrate-facing surface coplanar with the mounting surface of the base part. The vibrator part has a first electrode layer, a piezoelectric layer, and a second electrode layer, which are formed on the substrate-facing surface in that order. Furthermore, a reinforcing part is formed at the base end of the vibrator part so that the sectional area of the vibrator part gradually increases toward the base part.
Abstract:
PROBLEM TO BE SOLVED: To achieve a vibration type transducer allowed to be highly accurately and inexpensively manufactured.SOLUTION: A vibration type transducer for measuring distortion applied to a vibration beam by measuring the resonance frequency of the vibration beam includes: a silicon monocrystal vibration beam arranged in a vacuum chamber, applying tension stress to a substrate and having a cross-sectional shape having longer cross-sectional thickness in a vertical direction to a substrate surface as compared with that in a direction parallel with the substrate surface; a tabular first electrode plate arranged in parallel with the substrate surface and connecting one end to the vibration beam; second and third electrode plates arranged opposite to each other through the vibration beam in parallel with the substrate surface and forming a one-plane shape parallel with the substrate surface together with the vibration beam and the first electrode plate; and rugged parts formed on the surfaces of side wall parts on which the vibration beam is opposed to the second and third electrode plates to prevent mutual adhesion between the vibration beam and the second and third electrode plates.
Abstract:
A physical quantity sensor includes a sensor portion, a casing, and a vibration isolator. The casing includes a supporting portion with a supporting surface that is located to face an end surface of the sensor portion. The vibration isolator is located between the end surface of the sensor portion and the supporting surface of the casing to join the sensor portion to the casing. The vibration isolator reduces a relative vibration between the sensor portion and the casing.
Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a vibration sensor which can form a through hole whose expansion on the back side is small in substrate etching from the back side by a combination of crystal anisotropic etching and isotropic etching. SOLUTION: A protection film 20 composed of an SiO 2 film is formed on a surface of an Si substrate 12, and its part is removed to form a sacrificial layer 23 made up of polycrystal Si on an opened etching window 22. A protection film 24 composed of SiO 2 is formed on the surface of Si substrate 12 over the sacrificial layer 23, and an element film 13 composed of polycrystal Si is formed on it. An etching window 26 of the back side is opened on a protection film 21 of the back side. The Si substrate 12 is immersed in TMAH to etch crystal-isotropically the Si substrate 12 through the etching window 26 of the back side, and a through hole 14 is formed on the Si substrate 12. When the sacrificial layer 23 is exposed in the through hole 14, the sacrificial layer 23 is removed by etching, then a clearance 19 is produced between the protection film 24 and Si substrate 12, and the Si substrate 12 is etched crystal-isotropically from both sides of surface and back. COPYRIGHT: (C)2008,JPO&INPIT