Mems device having support structures configured to minimize stress-related deformation and methods for fabricating same
    92.
    发明公开
    Mems device having support structures configured to minimize stress-related deformation and methods for fabricating same 审中-公开
    MEMS与支撑结构装置用于最小化它们的制备应力引起的变形和过程

    公开(公告)号:EP2497745A2

    公开(公告)日:2012-09-12

    申请号:EP12170755.8

    申请日:2006-08-17

    Abstract: Embodiments of MEMS devices include a movable layer supported by overlying support structures, and may also include underlying support structures. In one embodiment, the residual stresses within the overlying support structures and the movable layer are substantially equal. In another embodiment, the residual stresses within the overlying support structures and the underlying support structures are substantially equal. In certain embodiments, substantially equal residual stresses are obtained through the use of layers made from the same materials having the same thicknesses. In further embodiments, substantially equal residual stresses are obtained through the use of support structures and/or movable layers which are mirror images of one another.

    Abstract translation: MEMS器件的实施方案包括通过上覆的支撑结构支撑的可移动层,并且因此可以包括下面的支撑结构。 在一个,实施方式的残留应力的上覆的支承结构内,并且所述可移动层基本上相等。 在另一个实施例中的上覆的支承结构内的残余应力和底层支撑结构基本上相等。 在某些实施方案中,基本上相等的残余应力是通过使用由具有相同厚度的相同材料制成的层而得到的。 在进一步的实施方案中,基本上相等的残余应力是通过使用支撑结构和/或哪些是彼此的镜像可动层而获得的。

    DISPOSITIF MICROMECANIQUE COMPORTANT UNE POUTRE MOBILE
    94.
    发明授权
    DISPOSITIF MICROMECANIQUE COMPORTANT UNE POUTRE MOBILE 有权
    与移动BAR微机械装置

    公开(公告)号:EP1846320B8

    公开(公告)日:2009-04-08

    申请号:EP06709238.7

    申请日:2006-02-02

    CPC classification number: B81C1/00666 B81B2201/016 B81C2201/0167

    Abstract: The invention relates to a micromechanical device comprising a mobile beam (1), said beam being attached by the two ends (2) thereof to a rigid frame (3) provided with two arms (4) each having two ends (5). The ends (5) of an arm (4) are respectively fixed to the two ends (2) of the mobile beam (1). Each arm (4) has a central part (6) arranged between the two ends (5) of the corresponding arm (4). A rear face of the central part (6) of each arm (4) is attached to a base support (10). The frame (3) comprises at least one stressed element (11) for adjusting the stressed state of the beam. The stressed element (11) can be centred between the front face and the rear face of the corresponding arm (4). The frame (3) can comprise pairs of front and rear stressed elements (11) which are respectively arranged on the front face and the rear face of the arms (4) in such a way that they face each other.

    MICROMACHINED ELECTROSTATIC ACTUATOR WITH AIR GAP
    96.
    发明授权
    MICROMACHINED ELECTROSTATIC ACTUATOR WITH AIR GAP 有权
    具有空气隙的微观力学静电驱动器

    公开(公告)号:EP1183566B1

    公开(公告)日:2004-08-18

    申请号:EP00930822.2

    申请日:2000-05-19

    Applicant: MCNC

    Abstract: A MEMS (Micro Electro Mechanical System) electrostatic device operated with lower and more predictable operating voltages is provided. An electrostatic actuator, an electrostatic attenuator of electromagnetic radiation, and a method for attenuating electromagnetic radiation are provided. Improved operating voltage characteristics are achieved by defining a non increasing air gap between the substrate electrode and flexible composite electrode within the electrostatic device. A medial portion of a multilayer flexible composite overlying the electromechanical substrate is held in position regardless of the application of electrostatic force, thereby sustaining the defined air gap. The air gap is relatively constant in separation from the underlying microelectronic surface when the medial portion is cantilevered in one embodiment. A further embodiment provides an air gap that decreases to zero when the medial portion approaches and contacts the underlying microelectronic surface. A moveable distal portion of the flexible composite is biased to curl naturally due to differences in thermal coefficients of expansion between the component layers. In response to electrostatic forces, the distal portion moves and thereby alters the distance separating the flexible composite from the underlaying microelectronic surface. Structures and techniques for controlling bias in the medial portion and the resulting air gap are provided. The electrostatic device may be disposed to selectively clear or intercept the path of electromagnetic radiation. Materials used in the attenuator can be selected to pass, reflect, or absorb various types of electromagnetic radiation. A plurality of electromagnetic attenuators may be disposed in an array and selectively activated in subsets.

    Verfahren zur Herstellung einer Schicht mit reduzierten mechanischen Spannungen
    98.
    发明公开
    Verfahren zur Herstellung einer Schicht mit reduzierten mechanischen Spannungen 失效
    一种用于生产具有减少的机械应力的层的过程。

    公开(公告)号:EP0663692A2

    公开(公告)日:1995-07-19

    申请号:EP94120791.2

    申请日:1994-12-27

    Inventor: Biebl, Markus

    CPC classification number: G01L9/0042 B81C1/00666 B81C2201/0167

    Abstract: Zur Herstellung einer Schicht (15) mit reduzierten mechanischen Spannungen wird die Schicht (15) aus mindestens zwei Teilschichten (13, 14) zusammengesetzt, die so aufeinander abgestimmt sind, daß sich die Streßgradienten in den beiden Schichten (13, 14) im wesentlichen kompensieren. Das Verfahren ist insbesondere bei der Herstellung von Strukturen in der Oberflächen-Mikromechanik einsetzbar.

    Abstract translation: Prodn。 一个层的具有降低的机械应力包括:(a)从至少一个第一部分的层(13)和一个第二部分的层(14)产生所述层(15); (B)到衬底(11,12)施加所述第一局部层(13); (C)涂布于第一局部层的第二子层(14)(13); 及(d)调节在彼此象两个层的应力梯度的层(13,14)被补偿。

    一种MEMS薄片及其制造方法
    99.
    发明申请

    公开(公告)号:WO2014005496A1

    公开(公告)日:2014-01-09

    申请号:PCT/CN2013/078523

    申请日:2013-06-29

    Abstract: 一种MEMS薄片(100),包括硅衬底层(110)、第一氧化层(120)及第一薄膜层(130);所述硅衬底层包括用于微机电工艺的正面(112)及与所述正面相对的背面(114),所述正面及所述背面均为抛光面;所述第一氧化层主要成分为二氧化硅,形成于所述硅衬底层的背面;所述第一薄膜层主要成分为氮化硅,形成于所述第一氧化层表面。上述微机电系统薄片中,通过在硅衬底层的背面依次层叠第一氧化层及第一薄膜层,有效保护了背面,防止其在进行微机电工艺过程中划伤,同时还提供了一种MEMS薄片的制造方法。

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