Abstract:
A light guide tube (15) which guides an infrared radiation from a measured object, a 1st infrared sensor (10) which detects the infrared radiation from the light guide tube (15), a temperature sensor (12) which generates a reference temperature signal, a reference cavity (17) which shows a temperature status approximately the same as the temperature status of the light guide tube (15) and is closed so as to prevent the incidence of an external infrared radiation, a 2nd infrared sensor (11) which detects an infrared radiation from the reference cavity (17), a temperature calculating means (13) which calculates the temperature of the object in accordance with the signals from the 1st infrared sensor (10), the 2nd infrared radiation sensor (11) and the temperature sensor (12) and a display (14) which displays the temperature in accordance with a signal from the temperature calculating means (13) are provided. The diameter of at least one of the light guide tube (15) and the reference cavity (17) is gradually reduced from the side of the 1st and 2nd infrared sensors (10 and 11) toward the light incidence opening of the light guide tube (15).
Abstract:
A noncontact infrared tympanic thermometer which does not require environmental stabilization or waveguide temperature control because it utilizes an optically stabilized infrared detector for detecting the infrared energy emitted by the tympanic membrane. This stability is accomplished by locating a neutral density filter (164) over half of the optical aperture (162) of the detector package (16) such that the neutral density filter (164) ''shadows'' only one of two thermopile channels (163) for detecting the infrared energy emitted by the tympanic membrane. The two thermopile channels (163) are connected in series opposition such that any optical signal equally present in both channels will yield a zero net output. Since the infrared energy emitted by the walls (161) of the detector package (16) reach each detector (163) equally, the effects of these emissions on the temperature measurement are eliminated.
Abstract:
The invention relates to a radiation sensor array (21), comprising a radiation sensor (2), comprising a cantilevered element (5), which comprises an optical absorber (6) and a resistance structure (3), and a holding structure (4) that holds the cantilevered element (5) at a distance to a substrate (1), and which represents a connection between the cantilevered element (5) and the substrate (1), and comprising an evaluation unit for detecting an absorbed radiation from the change of an electrical resistance of the resistance structure (3), characterized by a wavelength-selective design of the optical absorber (6).
Abstract:
A semiconductor sensor system, in particular a bolometer, includes a substrate, an electrode supported by the substrate, an absorber spaced apart from the substrate, a voltage source, and a current source. The electrode can include a mirror, or the system may include a mirror separate from the electrode. Radiation absorption efficiency of the absorber is based on a minimum gap distance between the absorber and mirror. The current source applies a DC current across the absorber structure to produce a signal indicative of radiation absorbed by the absorber structure. The voltage source powers the electrode to produce a modulated electrostatic field acting on the absorber to modulate the minimum gap distance. The electrostatic field includes a DC component to adjust the absorption efficiency, and an AC component that cyclically drives the absorber to negatively interfere with noise in the signal.
Abstract:
A semiconductor device (1) for measuring IR radiation is disclosed. It comprises a substrate (2) and a cap (3) enclosing a cavity (12,), a sensor pixel (10) in the cavity, comprising a first absorber (11) for receiving said IR radiation, a first heater (13), first temperature measurement means (14) for measuring a first temperature (Ts); a reference pixel (10) in the same cavity, comprising a second absorber (21) shielded from said IR radiation, a second heater (23), and second temperature measurement means (24) for measuring a second temperature (Tr); a control circuit (4) for applying a first/second power (Ps, Pr) to the first/second heater (13, 23) such that the first temperature (Ts) equals the second temperature (Tr); and an output circuit (5) for generating an output signal indicative of the IR radiation (Pir) based on a difference between the first and second power (Ps, Pr).
Abstract:
A measuring apparatus (1) is provided comprising a detector device for detecting a variable to be measured, and control means (19) operative to control the detector means and generate an output signal indicative of the magnitude of the variable being measured. The detector means comprises a housing (3) on which are mounted two Peltier-Seebeck detectors (11, 13), the detectors (11, 13) being arranged on the housing (3) such that only the first Peltier-Seebeck detector (11) is exposed, in use, to the variable to be measured. The control means (19) being operative to generate the output signal based on the output of the first Peltier-Seebeck detector (11) and the output of the second Peltier-Seebeck detector (13) The output signal generated therefore accounts for the effect of the ambient heat on each Peltier-Seebeck detector (11, 13).
Abstract:
The invention relates to a passive microbolometer (12), comprising a reflective screen (17) and a suspended membrane with the function of radiation absorber, thermometer and electrical connection. The membrane is supported by at least two anchor elements (15) fixed to a support substrate (16). The reflective screen (17) may be embodied by at least one layer (18) of metallic material with a thickness of the order of 500Å to 2000Å. The screen (17) is arranged beneath the membrane in electrical contact with the membrane absorber element (13) such as to reduce the area resistance of the unit made up of the screen (17) and the absorbing element (13) and to avoid the absorption of radiation by the latter.
Abstract:
A light guide tube (15) which guides an infrared radiation from a measured object, a first infrared sensor (10) which detects the infrared radiation from the light guide tube (15), a temperature sensor (12) which generates a reference temperature signal, a reference cavity (17) which shows a temperature status approximately the same as the temperature status of the light guide tube (15) and is closed so as to prevent the incidence of an external infrared radiation, a second infrared sensor (11) which detects an infrared radiation from the reference cavity (17), a temperature calculating means (13) which calculates the temperature of the object in accordance with the signals from the first infrared sensor (10), the second infrared radiation sensor (11) and the temperature sensor (12) and a display (14) which displays the temperature in accordance with a signal from the temperature calculating means (13) are provided. The diameter of at least one of the light guide tube (15) and the reference cavity (17) is gradually reduced from the side of the first and second infrared sensors (10 and 11) toward the light incidence opening of the light guide tube (15).
Abstract:
A system for locating inflamed plaque in an artery of a patient includes a catheter with an expander mounted at a catheter distal end. An infrared carrier, e.g., an optical fiber is mounted on the catheter with a carrier distal end attached to the expander. A sensor is connected to a carrier proximal end to measure infrared radiation transmitted through the carrier from the carrier distal end. In use, the expander is operable to selectively move the carrier distal end into contact with the arterial wall. Infrared radiation can then be measured to determine the temperature at the arterial wall. Temperatures at various locations can be taken, with elevated temperatures being indicative of inflamed plaque.
Abstract:
In one embodiment, a system for measuring the temperature of a first object, such as wafer 112, in the presence of a second radiating object, such as a heating lamp 118, is disclosed herein. A heating lamp 118 is provided for heating the wafer 112 for device processing. Both the wafer 112 and the lamp 118 emit radiation. A first detector 120 detects radiation emitted by both the wafer 112 and the lamp 118. A second detector 122 which detects radiation from only the heating lamp 118 may also be used. A modulation source 126 is provided for modulating the heater 118 to a selected modulation depth M L such that the temperature of the lamp 118 varies with the selected AC modulation and the temperature of the wafer 112 remains substantially constant. Also, circuitry is provided for determining the fraction of radiation emitted by the lamp and collected by the first detector 120 (lamp interference signal) based upon the heating lamp modulation and then calculating the precise temperature of the wafer 112. Other systems and methods are also disclosed.