公开(公告)号：WO2010044003A2

公开(公告)日：2010-04-22

申请号：PCT/IB2009/054365

申请日：2009-10-06

Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  VAN BEEK, Michael, C. ,  RENSEN, Wouter, H., J. ,  HARBERS, Rik

Inventor： VAN BEEK, Michael, C. ,  RENSEN, Wouter, H., J. ,  HARBERS, Rik

IPC: G01N21/47 ,  G01N21/49 ,  G01N21/59 ,  A61B5/00

CPC classification number: A61B5/0059 ,  A61B5/4528 ,  G01N21/4795 ,  G01N2201/0626 ,  G01N2201/0635 ,  G01N2201/0675 ,  G01N2201/124

Abstract: A device (1; 10; 20; 30; 40) for optically examining the interior of a turbid medium is provided. The device comprises an illumination system (2; 12; 22; 32; 42) adapted for illuminating a turbid medium to be examined and an imaging device (106) adapted for generating images from detected light. The illumination system (2; 12; 22; 32; 42) is adapted to be operable in at least a first mode in which a large area is illuminated and a second mode in which at least one selected region (110) of the large area is illuminated.

Abstract translation: 提供了一种用于光学检查混浊介质内部的装置（1; 10; 20; 30; 40）。 该装置包括适于照射要检查的混浊介质的照明系统（2; 12; 22; 32; 42）和适于从检测到的光产生图像的成像装置（106）。 照明系统（2; 12; 22; 32; 42）适于在其中照亮大面积的至少第一模式和第二模式中操作，其中大面积的至少一个选定区域（110） 被照亮。

公开(公告)号：WO2009156981A1

公开(公告)日：2009-12-30

申请号：PCT/IL2009/000572

申请日：2009-06-09

Applicant: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD. ,  SILBERSTEIN, Shai ,  AVNI, Tsafrir

Inventor： SILBERSTEIN, Shai ,  AVNI, Tsafrir

IPC: G01N21/95

CPC classification number: G01N21/9501 ,  G01N21/9503 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/8825 ,  G01N2201/067 ,  G01N2201/0675 ,  G01N2201/0697 ,  G01N2201/1241

Abstract: An optical inspection system or tool can be configured to inspect objects using dynamic illumination where one or more characteristics of the illumination is/are adjusted to meet the inspection needs of different areas. For example, the illumination intensity may be increased or decreased as the tool inspects areas of memory and periphery features in a wafer die. In some embodiments, the adjustment can be based on data obtained during a pre-inspection setup sequence in which images taken based on illumination with varying characteristics are evaluated for suitability in the remainder of the inspection process.

Abstract translation: 光学检查系统或工具可以被配置为使用动态照明来检查物体，其中调整照明的一个或多个特征以满足不同区域的检查需要。 例如，当工具检查晶片管芯中的存储器区域和外围特征时，可以增加或减小照明强度。 在一些实施例中，调整可以基于在预检查设置顺序期间获得的数据，其中基于具有变化特性的照明拍摄的图像被评估为在检查过程的其余部分中的适用性。

公开(公告)号：WO2004036284A1

公开(公告)日：2004-04-29

申请号：PCT/JP2003/011935

申请日：2003-09-18

Applicant: 科学技術振興事業団 ,  林 照剛 ,  前川 克廣 ,  柴田 隆行

Inventor： 林 照剛 ,  前川 克廣 ,  柴田 隆行

IPC: G02B21/00

CPC classification number: G01N21/6458 ,  G01N21/21 ,  G01N21/6445 ,  G01N21/6452 ,  G01N2021/6471 ,  G01N2021/6478 ,  G01N2201/0675 ,  G02B21/0024 ,  G02B21/0068 ,  G02B21/0076

Abstract: 共焦点顕微鏡及びそれを用いた蛍光測定方法及び偏光測定方法であって、照明光源（１１）から偏光を、マイクロレンズアレイ（２１）を上部に配置したマトリクス式液晶素子（２２）及び対物レンズ（２３）を介して被観察物（２）へ入射する入射光学系（１０，１０’）と、被観察物からの反射光又は蛍光を検出する検出光学系（３０，３０’）と、液晶素子（２２）を制御する液晶制御部（５２）とを備え、マイクロレンズアレイ（２１）を透過したマイクロレンズ毎の光を、液晶素子（２２）の各画素（２２ａ）毎に透過させ、対物レンズ（２３）にて被観察物（２）に複数の焦点（２４）を結ぶと共に、液晶素子（２２）の各画素を透過する光の偏光方向を液晶制御部（５２）を用い各画素を透過する光の偏光方向を互いに直交するように制御する。

Abstract translation: 一种共焦显微镜以及使用它的荧光测量方法和偏振光测量方法，所述显微镜包括用于将来自照明光源（11）的偏振光发射到观察对象（10,10'）的入射光学系统（10,10' 2）通过其上设置有微透镜阵列（21）的矩阵型液晶元件（22）和物镜（23），检测光学系统（30,30'），用于检测来自物镜 观察或荧光，以及用于控制液晶元件（22）的液晶控制单元（52），其中通过微透镜阵列（21）的每个微透镜相关光都允许穿过每个像素（ 22a），然后变成在观察对象物（2）上形成多个焦点（24）的物镜（23），并且通过各个像素的光的偏振方向 液晶元件（22）由液体控制 id水晶控制单元（52），以便彼此正交。

公开(公告)号：US20180348119A1

公开(公告)日：2018-12-06

申请号：US15994431

申请日：2018-05-31

Applicant: Government of the United States of America, as represented by the Secretary of Commerce

Inventor： Jeeseong C. Hwang ,  Heidrun Wabnitz

IPC: G01N21/25 ,  G01N21/27 ,  G01N33/49 ,  A61B5/1455 ,  A61B5/1495 ,  A61B5/00

CPC classification number: G01N21/255 ,  A61B5/14553 ,  A61B5/1495 ,  A61B5/7246 ,  G01N21/27 ,  G01N21/4785 ,  G01N21/4795 ,  G01N21/49 ,  G01N33/4925 ,  G01N2021/4797 ,  G01N2201/0675 ,  G01N2201/0683 ,  G01N2201/0893

Abstract: An optical phantom produces a time-resolved diffuse reflectance spectrum and includes: a light source; a spatial light modulator; and an optical delay line including optical fibers of different length that produce different time-of-flight distributions, such that different time-of-flight distributions are combined and produce phantom light having the time-resolved diffuse reflectance spectrum.

公开(公告)号：US20180306716A1

公开(公告)日：2018-10-25

申请号：US15979521

申请日：2018-05-15

Applicant: NxGen Partners IP, LLC

Inventor： Solyman Ashrafi

IPC: G01N21/59 ,  G01N33/68 ,  G01N33/487 ,  A61B5/00 ,  G01N33/483 ,  G01N21/64 ,  G01N21/65 ,  G01N21/3581 ,  G01N21/21

CPC classification number: G01N21/59 ,  A61B5/0075 ,  G01N21/21 ,  G01N21/3581 ,  G01N21/636 ,  G01N21/6486 ,  G01N21/65 ,  G01N33/483 ,  G01N33/487 ,  G01N33/6896 ,  G01N2201/0675 ,  G01N2333/4709 ,  G01N2800/2821

Abstract: An apparatus for detecting a material within a sample includes a light emitting unit for directing at least one light beam through the sample. A plurality of units receive the light beam that has passed through the sample and performs a spectroscopic analysis of the sample based on the received light beam. Each of the plurality of units analyze a different parameter with respect to the sample a provide a separate output signal with respect to the analysis. A processor detects the material with respect each of the provided separate output signals.

公开(公告)号：US20180246307A1

公开(公告)日：2018-08-30

申请号：US15758546

申请日：2016-09-07

Applicant: University of Southampton

Inventor： Edward Thomas Foss ROGERS ,  Peter John Shand SMITH

IPC: G02B21/00 ,  G01N21/21

CPC classification number: G02B21/0068 ,  G01N21/21 ,  G01N2201/0675 ,  G02B21/0032 ,  G02B21/0072 ,  G02B21/0092 ,  G02B27/58

Abstract: A super-resolution scanning confocal polarisation contrast microscope is provided. The microscope has a laser light source (1), sample stage (10) for mounting a sample 6 and detector (8). A polarisation controller (3) is used to set the polarisation state of the light beam to any one of a defined set of different polarisation states. A spatial light modulator (5) modulates the light beam in amplitude and/or phase to focus a sub-diffraction-limit central spot on the sample together with unwanted sidebands. A scanning confocal scheme is used with a pin hole 9 in front of the detector (8) so that only that portion of the light is detected which has comes from the central spot, while rejecting light that has been scattered by the sample from the sidebands. Polarisation contrast images with sub-diffraction limit resolution can thus be acquired.

公开(公告)号：US20170082545A1

公开(公告)日：2017-03-23

申请号：US15275707

申请日：2016-09-26

Applicant: NIKON CORPORATION

Inventor： Fumihiro DAKE ,  Tomoko UJIKE ,  Hiroki YAZAWA

IPC: G01N21/64 ,  G01N21/65 ,  G02B21/00

CPC classification number: G01N21/6458 ,  G01N21/6445 ,  G01N21/65 ,  G01N2021/653 ,  G01N2201/0675 ,  G02B21/0032 ,  G02B21/0076 ,  G02B21/0096

Abstract: A super-resolution observation device includes an illumination optical system collecting a first illuminating light having a first optical frequency co, on a first region of an observation object, collecting a second illuminating light having a second optical frequency ω2′ on a second region partially overlapping the first region, and collecting a third illuminating light having a third optical frequency ω2 on a third region containing a non-overlap region which is a region of the first region and does not overlap the second region; and an extraction unit extracting a signal light generated in accordance with a change in an energy level of a substance in the non-overlap region from a light generated in all of the first region, the second region, and the third region.

公开(公告)号：US20170052430A1

公开(公告)日：2017-02-23

申请号：US15123760

申请日：2015-04-03

Applicant: Sony Corporation

Inventor： Yoshihito Higashitsutsumi ,  Shinichiro Gomi ,  Jun Iwama

IPC: G03B15/06 ,  G02F1/1335 ,  G01N21/21 ,  G02B5/30 ,  H04N5/225 ,  G01B11/30 ,  A61B5/00 ,  G03B15/03

CPC classification number: G03B15/06 ,  A61B5/00 ,  A61B5/0022 ,  A61B5/0077 ,  A61B5/107 ,  A61B5/442 ,  G01B11/303 ,  G01N21/21 ,  G01N2201/0675 ,  G02B5/3083 ,  G02B21/06 ,  G02F1/133528 ,  G03B15/03 ,  G03B15/05 ,  G03B15/14 ,  H04N5/225 ,  H04N5/2256

Abstract: An imaging device includes a camera 31, a light source 32, a polarizer 35 arranged between the camera 31 plus the light source 32 and an object 11, and a spatial light modulator 40A arranged between the polarizer 35 and the object 11 to control a revolution angle of an emitting light polarization plane relative to an incident light polarization plane.

Abstract translation: 成像装置包括相机31，光源32，布置在相机31加上光源32和对象11之间的偏振器35以及布置在偏振器35和物体11之间以控制旋转的空间光调制器40A 发射光偏振面相对入射光偏振面的角度。

公开(公告)号：US20160356746A1

公开(公告)日：2016-12-08

申请号：US14913958

申请日：2014-08-26

Applicant: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE

Inventor： Rafael Piestun ,  Hengyi Ju ,  Jacob Dove ,  Antonio Miguel Caravacca-Aguirre ,  Todd Murray ,  Donald Conkey

IPC: G01N29/24 ,  G01N29/06

CPC classification number: G01N29/2418 ,  A61B5/0095 ,  G01N21/1702 ,  G01N29/0654 ,  G01N2021/1706 ,  G01N2201/0675

Abstract: Systems and methods are disclosed to enhance three-dimensional photoacoustic imaging behind, through, or inside a scattering material. Embodiments of the invention can increase the optical fluence in an ultrasound transducer focus and/or enhance the optical intensity using wavefront shaping before the scatterer. The photoacoustic signal induced by an object placed behind the scattering medium can serve as feedback to optimize the wavefront, enabling one order of magnitude enhancement of the photoacoustic amplitude. Using the enhanced optical intensity, the object can be scanned in two dimensions and/or a spot can be scanned by re-optimizing the wavefront before post-processing of the data to reconstruct the image. The temporal photoacoustic signal provides information to reconstruct the third-dimensional information.

Abstract translation: 公开了系统和方法来增强散射材料后面，通过或内部的三维光声成像。 本发明的实施例可以在散射体之前使用波前整形来增加超声波换能器焦点中的光能密度和/或增强光强度。 由放置在散射介质后面的物体引起的光声信号可以用作反馈以优化波前，使光声振幅能够提高一个数量级。 使用增强的光强度，可以在二维扫描物体和/或可以在对数据进行后处理以重构图像之前重新优化波阵面来扫描点。 时间光声信号提供重建第三维信息的信息。

公开(公告)号：US09500846B2

公开(公告)日：2016-11-22

申请号：US14660906

申请日：2015-03-17

Applicant: Howard Hughes Medical Institute

Inventor： Robert E. Betzig ,  Kai Wang

IPC: F21V9/16 ,  G01J1/58 ,  G02B21/00 ,  G02B21/36 ,  G01N21/64

CPC classification number: G02B21/0064 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2201/0675 ,  G02B21/0056 ,  G02B21/006 ,  G02B21/0072 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/361 ,  G02B26/06

Abstract: Excitation light is focused to a focus within a sample and the focus is scanned within a volume in the sample with scanning optical elements. Signal light emitted from the focus is de-scanned, with the one or more scanning optical elements, onto a wavefront sensor as the focus is scanned within the volume. Based on the descanned signal light, an average aberration created by the volume of the sample of a wavefront of the excitation light is determined. A wavefront of the excitation light is corrected by an amount according to the determined average aberration while the focus is scanned within the volume, the signal light is imaged onto a photosensitive detector as the focus is scanned within the volume, and a wavefront of the imaged signal light is corrected by an amount according to the determined average aberration while the focus is scanned. These steps can be repeated for a plurality of different volumes in the sample, and an image of the sample can be generated based on the detected signal light from scanned foci within the different volumes.

Abstract translation: 激发光聚焦到样品中的焦点，并用扫描光学元件在样品中的体积内扫描焦点。 当聚焦在体积内被扫描时，从焦点发出的信号光与一个或多个扫描光学元件一起被扫描到波前传感器上。 基于下拉信号光，确定由激发光的波前的样本的体积产生的平均像差。 当在体积内扫描焦点时，根据确定的平均像差校正激发光的波前，当体积内的焦点被扫描时，将信号光成像到光敏检测器上，并且成像的波前 当扫描焦点时，根据确定的平均像差校正信号光的量。 可以对样本中的多个不同体积重复这些步骤，并且可以基于来自不同体积内的扫描焦点的检测到的信号光来生成样本的图像。