143.
    发明专利
    未知

    公开(公告)号:DE69204271T2

    公开(公告)日:1996-03-21

    申请号:DE69204271

    申请日:1992-12-28

    Abstract: System to control the form of a charged particle beam. The particle beam emanates from a source (58) of these particles. This source is associated with a collecting electrode which collects the particles. The system comprises at least one resistive zone (56) and at least two control electrodes (52, 54), this resistive zone and these control electrodes being arranged substantially at the same level as the source, these control electrodes being furthermore placed on either side of the resistive zone and intended for polarising the latter, the electrical resistance profile of the resistive zone being chosen so as to have the distribution of potential making it possible to obtain the desired form of the beam emanating from the source when the control electrodes are suitably polarised. Application to the focusing of a charged particle beam.

    148.
    发明专利
    未知

    公开(公告)号:FR2641412A1

    公开(公告)日:1990-07-06

    申请号:FR8817484

    申请日:1988-12-30

    Inventor: EPSZTEIN BERNARD

    Abstract: The invention relates to an electron source (20) formed of at least one elementary electron emitter (31, 31b) comprising an emissive tip (34) having a very small radius of curvature and operating in accordance with the field emission principle. The invention applies particularly in the case of constructions employing technologies used for integrated circuits or in the area of thin-layered films, these technologies enabling a plurality of elementary emitters to be produced on one substrate. … The aim of the invention is in particular to enable an electron beam (F1) to be produced, the intensity of which is independent of possible variations in electron emission by the emissive tip 34. … The emissive tip (34) interacts with an extractor electrode (27), and according to a characteristic of the invention, a control electrode (29), having a negative potential relative to the extractor electrode (27), is arranged downstream of this latter in relation to the sense of propagation (41) of the beam (F1). … …

    149.
    发明专利
    未知

    公开(公告)号:DE3805123A1

    公开(公告)日:1988-10-13

    申请号:DE3805123

    申请日:1988-02-18

    Applicant: SIEMENS AG

    Abstract: A method and an apparatus for irradiating a relatively large area with a charged particle beam. In the method, a pencil-like beam is generated and spread along a fan axis perpendicular to the beam axis. The fan axis is rotated around the beam axis so that finally a circular area is irradiated. The apparatus includes means for generating a pencil-like beam, a lens system for spreading the beam along the fan axis and means to rotate the fan axis around the beam axis. In a preferred embodiment, the beam is spread such that its transverse intensity distribution increases with increasing distance from the beam center so that the area swept by the beam is irradiated with an even intensity.

    150.
    发明专利
    未知

    公开(公告)号:NL8600391A

    公开(公告)日:1987-09-16

    申请号:NL8600391

    申请日:1986-02-17

    Applicant: PHILIPS NV

    Abstract: The invention relates to a cathode ray tube having an envelope 1 comprising a screen 2 and an electron gun 3 which is situated inside the envelope 1 opposite to the screen and which has three electrodes 4, 5 and 6, which electrodes are provided coaxially on the inner wall of a glass tube 7 in adjoining places having diameters differing per electrode.In order to obtain, for example, smaller dimensions and a better alignment of the electron gun and a higher resolution, according to the invention a focusing lens associated with the electron gun 3 is a high-ohmic resistance layer 8 having a spiral shape 9.

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