公开(公告)号：EP2106537A1

公开(公告)日：2009-10-07

申请号：EP08701723.2

申请日：2008-01-23

Applicant: Valtion Teknillinen Tutkimuskeskus

Inventor： SAARI, Heikki

IPC: G01J3/26 ,  G01N21/17 ,  G01N21/64

CPC classification number: G01J3/10 ,  G01J3/26 ,  G01J3/433 ,  G02B26/001

Abstract: The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). In accordance with the invention the spectrometer has means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400), and the spectrometer has means for detecting (300, 400) and demodulating (306, 307) multiple pass bands simultaneously.

公开(公告)号：EP1475618B1

公开(公告)日：2008-12-10

申请号：EP03010520.9

申请日：2003-05-09

Applicant: SIEMENS AKTIENGESELLSCHAFT

Inventor： Lundqvist, Stefan ,  Thorsén, Per-Arne

IPC: G01J3/433

CPC classification number: G01J3/433 ,  G01N21/39 ,  G01N2021/399 ,  G01N2201/0691

公开(公告)号：EP1636556A4

公开(公告)日：2007-09-12

申请号：EP04809374

申请日：2004-05-13

Applicant: UNIV AKRON

Inventor： GIAKOS GEORGE C

IPC: G01J4/04 ,  G01J20060101 ,  G01J3/02 ,  G01J3/28 ,  G01J3/36 ,  G01J4/00 ,  G01N21/21

CPC classification number: G01J4/04 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0224 ,  G01J3/2823 ,  G01J3/36 ,  G01J3/433 ,  G01J3/447 ,  G01N21/21

Abstract: A multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder / multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities The system includes a light source (14) for illuminating a target (18) with a first quantity of light having a first wavelength and a second quantity of light having a second wavelength, the first and second wavelength being different. A polarization-state generator (22) generates a polarization state for each of the first and second quantities of light, and includes a first polarizer (26) through which the first and second quantities of light are transmitted before entering a first waveplate (32). A polarization-state receiver (44) evaluates a resulting polarization state of the first and second quantities of light following illumination of the target (18), the polarization-state receiver (44) including a second waveplate (48) through which the first and second quantities of light are transmitted before entering a second polarizer (51). An optical image-capture device captures a first image of the target illuminated by the first quantity of light and a second image of the target illuminated by the second quantity of light. A processing unit assigns a weighting factor to at least one of the first and second images and evaluates a weighted difference between the first and second images to generate a multi-energy image of the target (18).

公开(公告)号：EP1717918A4

公开(公告)日：2007-05-16

申请号：EP05710105

申请日：2005-02-10

Applicant: ANRITSU CORP

Inventor： MORI HIROSHI ,  KIKUGAWA TOMOYUKI ,  TAKAHASHI YOSHIO ,  SUZUKI TOSHIYUKI ,  KIMURA KIYOSHI

IPC: H01S5/227 ,  G01J3/433 ,  G01N21/39 ,  H01S20060101 ,  H01S5/024 ,  H01S5/062 ,  H01S5/0683 ,  H01S5/10 ,  H01S5/12

CPC classification number: H01S5/12 ,  G01J3/433 ,  G01N21/39 ,  H01S5/02415 ,  H01S5/0683 ,  H01S5/1039 ,  H01S5/227

Abstract: A variable-wavelength semiconductor laser comprises an n-type semiconductor substrate, an active layer disposed over the n-type semiconductor substrate and capable of generating light, a p-type clad layer disposed over the active layer, and wavelength selection means for selectively oscillating a specific wavelength of the light generated in the active layer. The variable-wavelength semiconductor laser oscillates at the specific wavelength when a current is injected into the active layer, and the specific wavelength can be varied by varying the magnitude of the current. The device length representing the length in the direction of the propagation of the generated light ranges from about 200 to 500 mum, and the width of the active layer representing the length perpendicular to the direction of the propagation of the light and parallel to the substrate ranges from about 1 to 2 mum. The p-type clad layer includes a low-concentration clad sub-layer having a low impurity concentration and a high-concentration clad sub-layer having a high impurity concentration sequentially formed in order from the active layer side.

公开(公告)号：EP1746411A1

公开(公告)日：2007-01-24

申请号：EP06291172.2

申请日：2006-07-19

Applicant: Horiba Jobin Yvon S.A.S.

Inventor： McLoskey, David c/o Horiba Jobin Yvon Inc. ,  Baker Glenn M. S. c/o Horiba Jobin Yvon Inc. ,  Mattheis, Jim c/o Horiba Jobin Yvon Inc. ,  Atzeni, Sal c/o Horiba Jobin Yvon Inc.

IPC: G01N21/64 ,  G01J3/44

CPC classification number: G01N21/6408 ,  G01J3/10 ,  G01J3/433 ,  G01J3/4406 ,  G01N21/6458

Abstract: A method of spectrographic measurement is disclosed. The method generates light energy using a solid state low capacitance excitation source, the light energy being caused to fall on a sample to be assayed, causing the sample to output an output optical signal. The method generates a plurality of modulation frequencies, and a plurality of heterodyne frequencies to form a set of heterodyne signals at the heterodyne frequencies. Each of the heterodyne frequencies is associated with one of the modulation frequencies. Coupling the modulation frequencies to the excitation source, causes the excitation source to generate excitation energy modulated in intensity in proportion to the modulation frequencies. A sampling a portion of the substantially incoherent excitation energy forms a reference substantially incoherent excitation signal.
Focusing the output optical signal as an image modulated with the plurality of modulation frequencies on an image intensifier enables the formation of an intensified image modulated with the plurality of modulation frequencies, receiving the intensified image modulated with the plurality of modulation frequencies on a multielement optical detector.

Abstract translation: 公开了一种光谱测量方法。 该方法使用固态低电容激励源产生光能，使光能落在要测定的样品上，导致样品输出输出光信号。 该方法产生多个调制频率和多个外差频率，以在外差频率上形成一组外差信号。 每个外差频率与调制频率之一相关联。 将调制频率耦合到激励源，使得激发源产生与调制频率成比例的强度调制的激发能。 基本上非相干激发能量的一部分的采样形成参考基本上非相干的激励信号。 将输出光信号聚焦成图像增强器上用多个调制频率调制的图像，能够形成用多个调制频率调制的增强图像，在多元素光学检测器上接收用多个调制频率调制的增强图像 。

公开(公告)号：EP1090276B1

公开(公告)日：2006-05-10

申请号：EP99931922.1

申请日：1999-06-25

Applicant: Aspectrics, Inc.

Inventor： Hagler, Thomas

IPC: G01J3/12 ,  G01J3/32 ,  G01J3/433

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0213 ,  G01J3/0229 ,  G01J3/0289 ,  G01J3/12 ,  G01J3/18 ,  G01J3/32 ,  G01J3/433 ,  G01J2001/4242 ,  G01J2003/2866

Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin (m theta + p pi /4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by corresponding filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

公开(公告)号：EP1618355A2

公开(公告)日：2006-01-25

申请号：EP04760102.6

申请日：2004-04-22

Applicant: ITT MANUFACTURING ENTERPRISES, INC.

Inventor： NEFF, Benjamin, R. ,  PRUITT, Jeff, D. ,  GYPSON, Matthew, L. ,  DOBBS, Michael, E.

IPC: G01J3/433 ,  G01N21/31 ,  G01N21/35

CPC classification number: G01N21/39 ,  G01J3/433 ,  G01N21/3151 ,  G01N2021/399

Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the detected signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the detected signal that are present at the first and second frequencies.

公开(公告)号：EP1460410A4

公开(公告)日：2005-04-06

申请号：EP02803925

申请日：2002-11-25

Applicant: JAPAN SCIENCE & TECH AGENCY

Inventor： SHIGEKAWA HIDEMI ,  TAKEUCHI OSAMU ,  YAMASHITA MIKIO ,  MORITA RYUJI

IPC: G01J1/42 ,  G01J3/28 ,  G01J3/433 ,  G01N21/64 ,  G01Q30/00 ,  G01Q30/02 ,  G01Q60/10 ,  G01Q60/24 ,  G01N13/12 ,  G01N13/16 ,  G12B21/22

CPC classification number: G01J3/433 ,  G01J3/2889 ,  G01J2001/4242 ,  G01N21/6408 ,  G01N21/6458 ,  G01N2021/6415 ,  G01Q30/02 ,  G01Q60/12 ,  Y10S977/85

Abstract: An apparatus for measuring a physical phenomenon caused by light excitation having an extreme resolution in both time and space domains, particularly a delay time modulation time-resolved probe scanning microscope. The apparatus comprises an ultra-short light laser pulse generator (2), a delay modulation circuit (6) for splitting an ultra-short light laser pulse (3) generated by the ultra-short light laser pulse generator (2) into two pulses and frequency-modulating (ω) the delay time td between the two ultra-short light laser pulses (4, 5), a scanning probe microscope (17), and a lock-in detector (8) for detecting lock-in of a probe signal of the microscope (17) with a modulation frequency (ω) of the delay time. The delay-time dependence of the probe signal (11) on the delay time is determined as a change of rate without being influenced by the fluctuation of the intensity of the ultra-short light laser pulse (3) and without thermal expansion and thermal contraction of the chip of the probe (19) caused by the application of the ultra-short light laser pulse (3). With a femtosecond-order time resolution and an angstrom-order space resolution, a light excitation physical phenomenon depending on the delay time between ultra-short light pulses can be measured.

公开(公告)号：EP1409993A1

公开(公告)日：2004-04-21

申请号：EP02748210.8

申请日：2002-07-19

Applicant: THE BOARD OF REGENTS OF OKLAHOMA STATE UNIVERSITY

Inventor： STONE, Marvin, L. ,  NEEDHAM, DUANE ,  SOLIE, John, B. ,  RAUN, William, R. ,  JOHNSON, Gordon, V.

IPC: G01N21/35 ,  A01C21/00 ,  G01J3/427 ,  G01N21/47

CPC classification number: A01C21/007 ,  G01J3/427 ,  G01J3/433 ,  G01N21/3563 ,  G01N21/4738 ,  G01N2021/3155 ,  G01N2021/3181 ,  G01N2201/0627 ,  G01N2201/0691 ,  G01N2201/0694

Abstract: A spectral reflectance sensor including: a light source for emitting a modulated beam of red light; a light source for emitting a modulated beam of near infrared light; a receiver for receiving reflected light produced by either the red source or the near infrared source; a receiver for receiving incident light from either the red source or the infrared source; a signal conditioner responsive to the modulation such that the signals produced by the receivers in response to reflected and incident light from the source can be discriminated from signals produced by ambient light; and a microprocessor having an input such that the microprocessor can determine the intensities of incident red light, reflected red light; incident near infrared light; and reflected near infrared light. From these intensities, and by knowing the growing days since emergence or planting, the sensor can calculate the mid-growing season nitrogen fertilizer requirements of a plant.

公开(公告)号：EP0768525B1

公开(公告)日：2003-06-11

申请号：EP96402130.7

申请日：1996-10-07

Applicant: L'air Liquide, S.A. à Directoire et Conseil de Surveillance pour l'Etude et l'Exploitation des Procédés Georges Claude

Inventor： Mc Andrew, James J.F. ,  Wang, Hwa-Chi ,  Jurcik, Benjamin J.

IPC: G01N21/39 ,  G01N21/35 ,  G01J3/433

CPC classification number: G01N21/031 ,  C23C16/4412 ,  G01J3/433 ,  G01N21/3504 ,  G01N21/3554 ,  G01N21/39