MEAT PROCESSING DEVICE INCORPORATING AN X-RAY ANALYZER
    161.
    发明公开
    MEAT PROCESSING DEVICE INCORPORATING AN X-RAY ANALYZER 审中-公开
    装有X射线分析仪的肉类加工装置

    公开(公告)号:EP3019863A1

    公开(公告)日:2016-05-18

    申请号:EP13737214.0

    申请日:2013-07-11

    Abstract: A meat processing device comprises a meat processing unit and an external X-ray meat analyzer provided with a housing formed with an inlet connectable with an outlet of the processing unit. The housing provides complete shielding of personnel from X-rays except towards the inlet and is movable relative to the processing unit to a first position for analysis at which the unit outlet is collocated with the inlet and at which the processing unit completes the shielding of personnel from X-rays towards the inlet.

    Abstract translation: 一种肉类加工装置,包括肉类加工单元(2)和设有外壳(8)的外部X射线肉类分析仪(6),所述外壳形成有可与处理单元(2)的出口(4)连接的入口 )。 除了朝向入口(16)外,壳体(8)提供人员完全的X射线屏蔽并且可相对于处理单元(2)移动到第一位置以进行分析,在该位置单元出口(4)与 入口(16),并且处理单元(2)完成人员从X射线到入口(16)的屏蔽。

    METHOD OF CONTROLLING A PRODUCTION PROCESS
    162.
    发明公开
    METHOD OF CONTROLLING A PRODUCTION PROCESS 审中-公开
    一种用于控制制造工艺

    公开(公告)号:EP2810131A1

    公开(公告)日:2014-12-10

    申请号:EP12702249.9

    申请日:2012-02-02

    CPC classification number: G05B13/048

    Abstract: A method of controlling a production process including a process step for the morphological modification of a bio-material matrix comprises obtaining digital input data acquired during each of a plurality of production runs of the process, which input data includes information from radiation within a portion of the electromagnetic or acoustic spectrum having interacted with the matrix at one or more locations within the process together with a process control parameter and production event data for the associated production run; generating in a computer a prediction model from a multivariate analysis of the digital input data, which model links the information directly with one or more of process control parameters, production run events and process control settings; and applying in the computer the prediction model to interacted information obtained from a new production run to generate as an output one or more of a process control parameter a process control event and a predicted production run event for the new production run for use in controlling the production process.

    METHOD OF COMPENSATING FREQUENCY DRIFT IN AN INTERFEROMETER
    163.
    发明公开
    METHOD OF COMPENSATING FREQUENCY DRIFT IN AN INTERFEROMETER 审中-公开
    方法频率以不同的干涉补偿

    公开(公告)号:EP2769187A1

    公开(公告)日:2014-08-27

    申请号:EP11772950.9

    申请日:2011-10-17

    CPC classification number: G01J3/45 G01J2003/283

    Abstract: Compensating for frequency drift of a reference energy source in an FT interferometer based spectrometer instrument may include obtaining data representing a reference interferogram collected in response to a trigger signal having been generated in dependence on the emission frequency of the reference energy source, and subsequently obtaining data representing a target interferogram recorded by the FT interferometer in response to a trigger signal also having been generated in dependence on the emission frequency of the reference energy source in the same manner. The method may further include comparing the obtained data to determine a phase shift between the interferograms in a window in at least one region away from center-burst, and generating a mathematical transform dependent on the determined shift to be subsequently applied to generate data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.

    METHOD FOR COMPENSATING AMPLITUDE DRIFT IN A SPECTROMETER AND SPECTROMETER PERFORMING SAID METHOD
    164.
    发明公开
    METHOD FOR COMPENSATING AMPLITUDE DRIFT IN A SPECTROMETER AND SPECTROMETER PERFORMING SAID METHOD 审中-公开
    方法用于补偿谱仪幅度波动和光谱仪实施

    公开(公告)号:EP2745085A1

    公开(公告)日:2014-06-25

    申请号:EP11746242.4

    申请日:2011-08-19

    CPC classification number: G01N21/255 G01J3/28 G01J3/45

    Abstract: Compensating for amplitude drift in a spectrometer may include making successive performances of a standardization process to generate, at each performance, a mathematical transform to compensate for amplitude drift for application by an arithmetic unit to a spectrum obtained by the spectrometer in an interval between the performances. The compensating may include modifying the mathematical transform with a function dependent on spectral data from a zero material measured in association with the standardization process and the single beam zero spectrum measured in an interval between performances. The compensating may include applying the modified mathematical transform to a spectrum from an unknown sample.

    SPECTROMETRIC INSTRUMENT
    165.
    发明公开

    公开(公告)号:EP2564154A1

    公开(公告)日:2013-03-06

    申请号:EP12717680.8

    申请日:2012-04-26

    CPC classification number: G01J3/4535

    Abstract: A spectrometric instrument (38) comprising: a scanning interferometer (40,42,44) having a beamsplitter (40) for dividing incident optical radiation into a reflected beam, following a reflected beam path and a transmitted beam following a transmitted beam path; a monochromatic optical radiation source (52) for launching a reference beam into the interferometer (40,42,44) along a first propagation path (62) to be initially incident on a first face (40') of the beamsplitter (40); an observation optical radiation source (46) for launching a divergent observation beam (64) into the interferometer (4,6,8) along a second propagation path (66) to be initially incident on the first face (40') of beamsplitter (40) and overlap the reference beam at the first face (40'); wherein the radiation sources (52;46) cooperate to generate a first angle (θ) between the directions of propagation of the two beams along respective first (62) and second (66) propagation paths when initially and simultaneously incident at the first face (40') which is larger than a divergence half-angle (α) of the observation beam 64.

    Abstract translation: 一种光谱测量仪器,包括:具有分束器(40)的扫描干涉仪(40,42,44),用于将入射光辐射分成反射光束,跟随反射光束路径和跟随透射光束路径的透射光束; 单色光辐射源(52),用于沿着第一传播路径(62)将参考光束发射到干涉仪(40,42,44)中以初始入射在分束器(40)的第一面(40')上; 观察光辐射源(46),用于沿第二传播路径(66)将发散观察光束(64)发射到干涉仪(4,6,8)中,以最初入射到分束器(40)的第一面(40')上; 40)并且在所述第一面(40')处重叠所述参考光束; 其中,所述辐射源(52; 46)协作以当初始和同时入射到所述第一面(第一面(62)和第二面(66))时沿着相应的第一(62)和第二(66)传播路径在两个光束的传播方向之间产生第一角度 40'),其大于观测光束64的发散半角(α)。

    FEEDSTUFF FORMULATIONS
    167.
    发明公开
    FEEDSTUFF FORMULATIONS 审中-公开
    饲料配方

    公开(公告)号:EP2278888A1

    公开(公告)日:2011-02-02

    申请号:EP09741967.5

    申请日:2009-04-16

    Inventor: BUCHMANN, Bo

    Abstract: A method of formulating a feedstuff is provided which comprises the steps of: analysing the effect on one or both chemical and biological properties of the feedstuff of varying feedstuff ingredients and analysing the effect on the ingredient cost of the feedstuff of varying the feedstuff ingredients. The method further comprises a step of analysing the effect on a predicted production cost of the feedstuff of varying the feedstuff ingredients and a step of determining a desired formulation of a feedstuff for production on the basis of at least the analysed effects on the properties, on the ingredient cost and on the predicted production cost of varying the feedstuff ingredients.

    A METHOD OF CHECKING THE PERFORMANCE OF A FLOW CYTOMETER INSTRUMENT AND A STANDARD KIT THEREFOR
    168.
    发明授权
    A METHOD OF CHECKING THE PERFORMANCE OF A FLOW CYTOMETER INSTRUMENT AND A STANDARD KIT THEREFOR 有权
    程序对流式细胞仪的性能与标准KIT THEREFOR

    公开(公告)号:EP1017989B1

    公开(公告)日:2008-07-23

    申请号:EP98942513.7

    申请日:1998-09-14

    Inventor: NYGAARD, Lars

    CPC classification number: G01N15/1012

    Abstract: A method for correcting the settings of a flow cytometer, designed for fast sample handling and counting, allowing about 500 samples per hour to be counted. The couting is based on the provision of data representing a PHA diagram (Pulse Height Analysis) of registered pulses, each indicating a passed cell or particle. To check the settings the user measures a standard sample of uniform microbeads (161) on the flow cytometer, and insert information on a disk (162) in a computer arranged to process the measurement data and to calculate: a plurality of particle counts on the same sample, a mean count, a standard deviation (s) and/or Coefficient of Variation (CV), a signal mean value (SM), a signal width (width of the bell-curve in the PHA-diagram). The parameters are compared to preset limits (165, 166, 167, 168) and the PHAS curve is compared to an ideal curve PHA0. A user help program for adjusting the flow cytometer is arranged to display typical symptoms on a computer screen, to indicate the possible defects and to recommend actions to remedy the problems, based on information in a library stored in the computer. Thereby a visit by a service engineer can often be avoided.

    Device for controlling the rate of processing
    169.
    发明公开
    Device for controlling the rate of processing 审中-公开
    Vorrichtung zur Kontrolle der Verarbeitungsgeschwindigkeit

    公开(公告)号:EP1855099A1

    公开(公告)日:2007-11-14

    申请号:EP06113604.0

    申请日:2006-05-08

    Abstract: Processing instrumentation comprises a processing element (2) for performing a substantially same processing operation on each of a plurality of substantially identical items (6) and a control element (4) configured to control the processing element (2) to operate at a first cadency selected to make available a predetermined maximum number of processing operations of the processing element (2) in a predetermined operating period. The control element (4) is further configured to selectably control the processing element (2) to operate at a second, different cadency whilst maintaining the number of processing operations available in the predetermined operating period at the predetermined maximum number.

    Abstract translation: 处理装置包括处理元件(2),用于对多个基本上相同的物品(6)中的每一个执行基本相同的处理操作;以及控制元件(4),其被配置为控制处理元件(2)以第一节奏 被选择为在预定操作周期内提供处理元件(2)的预定最大数量的处理操作。 控制元件(4)还被配置为可选择地控制处理元件(2)以不同的第二次动作操作,同时保持在预定操作周期内预定最大数量的可用处理操作的数量。

    Optical analyser
    170.
    发明公开
    Optical analyser 审中-公开
    Optisches分析仪

    公开(公告)号:EP1850117A1

    公开(公告)日:2007-10-31

    申请号:EP06112964.9

    申请日:2006-04-24

    Abstract: An optical analyser (2) is provided comprising a fluorescence detector (12) for detecting optical fluorescence from a sample usable in the generation of representative fluorescence data (14) and an optical spectrophotometer (16) for detecting optical absorption by a sample, preferably the same sample, usable in the generation of representative absorption data (20). A data processor (24) is configured to receive the data (14; 20) and operates to correlate the data (14; 20) with one or both of a qualitative and a quantitative indication of a property of interest of the material using a predictive model established from a combination of both fluorescence and absorption data.

    Abstract translation: 提供了一种光学分析器(2),其包括用于检测来自可用于产生代表性荧光数据的样品(14)的荧光检测器(12)和用于检测样品的光吸收的光学分光光度计(16),优选地 相同的样品,可用于生成代表性吸收数据(20)。 数据处理器(24)被配置为接收数据(14; 20)并且操作以使数据(14; 20)与材料的感兴趣属性的定性和定量指示中的一个或两个相关联, 从荧光和吸收数据的组合建立的模型。

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