中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

214 records (took 0.023 seconds)

    162.
    发明专利
    未知

    公开(公告)号：DE10016361A1

    公开(公告)日：2001-10-11

    申请号：DE10016361

    申请日：2000-04-03

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN

    IPC: G02B26/02 ,  G02B5/00 ,  G02B5/04 ,  G02B21/00 ,  G02B26/00 ,  G02B27/10 ,  G02B27/12

    Abstract: The arrangement has a dispersive medium for spectral spatial fanning of the multicolor light beam (1) into individual light beams (3) and an attenuation arrangement (5,6) for at least partial attenuation of the intensity of one or more light beams. The dispersive medium can have a prism (2) rotatable about an axis perpendicular to a plane spanned by the light beam and/or arranged after an optical arrangement preferably containing a lens.

    163.
    发明专利
    未知

    公开(公告)号：DE10015449A1

    公开(公告)日：2001-10-04

    申请号：DE10015449

    申请日：2000-03-29

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN

    IPC: G02B21/00

    Abstract: A method for aligning the optical beam path of a microscope, in particular of a confocal microscope having a light source (1), a microscope optical system, a detection stop (12), and a detection device (13), is configured, in the interest of simplified alignment with reduced service and maintenance costs, in such a way that the detection stop (12) is used as the optical reference. Also provided is a microscope assemblage, having a light source (1), a microscope optical system, a detection stop (12), and a detection device (13), in which the detection stop (12) is usable as the optical reference.

    165.
    发明专利
    未知

    公开(公告)号：DE10006800A1

    公开(公告)日：2001-08-16

    申请号：DE10006800

    申请日：2000-02-15

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  HAY BILL ,  HOFFMANN JUERGEN

    IPC: G01J3/08 ,  G01J3/32 ,  G01J3/36 ,  G02B21/00

    Abstract: The system is designed so that in the fanned out light beam (1), an optical component part (4) is arranged reflecting and-or refracting the light beam to a detector (3), the optical effective region of which is reduced or increased along the surface, so that by alignment of the component part (4) to the focal line (2) and the resulting covering of the focal line, and the surface of the spectral region arriving at the detector (3) is definable.

    Compensating for intensity fluctuations in a confocal microscope
    167.
    发明专利
    Compensating for intensity fluctuations in a confocal microscope 未知

    公开(公告)号：GB2358922A

    公开(公告)日：2001-08-08

    申请号：GB0026120

    申请日：2000-10-25

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

    IPC: G02B21/00 ,  G02B21/06 ,  G01J1/16 ,  G01J1/44

    Abstract: A system for compensating for intensity fluctuations of an illumination system in a confocal microscope comprises first and second analog-to-digital converters (34, 36) for digitizing a first electrical signal corresponding to the light reflected from a specimen and a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to first and second look-up tables (38, 40) carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator (42) for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look-up table (44) for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.

    168.
    发明专利
    未知

    公开(公告)号：DE10064776A1

    公开(公告)日：2001-07-12

    申请号：DE10064776

    申请日：2000-12-22

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

    IPC: G02B21/00 ,  G02B21/06

    Abstract: A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.

    Method of user guidance and training for use with raster microscopy, involves receiving image data from first and second images of sample in succession
    169.
    发明专利
    Method of user guidance and training for use with raster microscopy, involves receiving image data from first and second images of sample in succession 未知

    公开(公告)号：DE10057948A1

    公开(公告)日：2001-07-05

    申请号：DE10057948

    申请日：2000-11-22

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN

    IPC: G02B21/00

    Abstract: Training of inexperience operators of raster microscopes requires that the user is initially fully familiar with the principles of confocal microscopy, where a flawless adjustment or setting is essential for good image quality and that no automatic setting of the optimal parameter can be provided, and all parameters must be set by the user him/herself. To better enable the novice user to obtain good results, image data of first and a second image of a sample are received in succession, and the statistical data collation time is expanded and carried out independently of the position of the image and the image structure. A number of relevant image quality parameters is then calculated and used for further image acquisition.

Patent Agency Ranking