Abstract:
An electron beam source is provided with an electron forming means (12,2,3) such as a doped layer of Si (2) for forming conduction band electrons near the surface of the pointed tip of a needle-shaped structure while suppressing emission of electrons from a valence band. The surface of the pointed tip of the needle-shaped structure is formed with a single-crystal semiconductor or insulator. Preferably a surface passivation layer (4) and/or a highly doped layer is formed on the surface of the needle-shaped structure. Also, means for exciting electrons in a valence band may be provided.
Abstract:
An imaging apparatus (100) for providing an image from a display (106) to an observer (101), comprising: a display (106) generating an optical output, an imaging surface member (109) constructed and arranged for viewing by said observer, and a scanning mirror/lens assembly (102) optically interposed between the display and the imaging surface member, and constructed and arranged to motively repetitively scan the display, generate a scanned image, and transmit the scanned image to the imaging surface member, for viewing of the scanned image. Various field emitter display designs and subassemblies are described, which may be usefully employed in such imaging apparatus.
Abstract:
Disclosed is a cathode (e.g., a Schottky emission cathode) having an electron emitter of a tungsten single-crystal with a sharp point, and a heater connected to the electron emitter to heat it. The work function of the crystal face of the point of the electron emitter is reduced by providing adsorbed thereon a nitride of Zr, Ti, Y, Nb, Sc, V or La, or an oxide of Y, Sc, V or La. The nitride or oxide can be formed as a reservoir on the heater (from where it thermally diffuses to the point), or chemically adsorbed on the point. For forming the nitride or oxide on the point, the metal forming the nitride or oxide can be provided on the point and reacted with nitrogen or oxygen thereat to form the nitride or oxide; to provide the metal on the point, the metal forming the nitride or oxide can either be evaporated onto the point, or can form a reservoir on the heater and thermally diffuse therefrom to the point. The effect of reducing the work function results in a cathode having a narrow FWHM (full width at half maximum) of emission electrons and a high current density. Moreover, the cathode of the present invention is easy to manufacture and handle.
Abstract:
An electron beam source is provided with an electron forming means (12,2,3) such as a doped layer of Si (2) for forming conduction band electrons near the surface of the pointed tip of a needle-shaped structure while suppressing emission of electrons from a valence band. The surface of the pointed tip of the needle-shaped structure is formed with a single-crystal semiconductor or insulator. Preferably a surface passivation layer (4) and/or a highly doped layer is formed on the surface of the needle-shaped structure. Also, means for exciting electrons in a valence band may be provided.
Abstract:
본 발명에 따라, 기판(1)과; 상기 기판(1) 상에 형성된 다수 개의 전자 방출 전극(7)과; 전자 방출 전극(7)이 배치된 다수 개의 제 1 캐비티(2a)를 가지며 상기 기판(1) 상에 형성된 제1 절연층(2)과; 제 1 캐비티(2a)와 연통하는 제 1 개구(3a)를 다수 개 가지며 상기 제 1 절연층(2) 상에 형성된 게이트 전극(3)과; 상기 제 1 개구(3a)와 연통하는 제 2 캐비티(4a)를 다수 개 가지며 게이트 전극(3) 상에 형성된 제 2 절연층(4); 및 제 2 캐비티(4a)와 연통하는 제 2 개구(5a)를 다수 개 가지며 상기 제 2 절연층(4) 상에 형성된 집속 전극(5)을 포함하는 냉음극 (9)으로서, 제 2 개구(5a)의 중심축과 제 1 개구(3a)의 중심축중 적어도 하나는 상기 전자 방출 전극(7)의 중심축과 편심(eccentric)인 것을 특징으로 한다. 상기 냉음극(9)은 전자 (10)가 방출되는 각도를 넓힘으로써, 더욱 넓게 전자 빔(10)을 방사한다. 즉, 발광 면적에 비해서 상대적으로 작은 전자 방출 면적을 갖는다.
Abstract:
PURPOSE: A method of field emission display manufacture is provided to enhance the characteristic and the reliability of the device by coating the material having excellent electronic discharge and durability onto the surface of a tip. CONSTITUTION: A method of field emission display manufacture comprises the steps of: forming a metal tip(15) onto a cathode electrode(11) on the bottom of a gate hole; vertical evaporation of a silicon(17) doped with impurities onto the whole surface; and selective spreading of tungsten(19) formed by WF6 gas resolving reaction of CVD process only onto the silicon.
Abstract:
a silicon substrate (31) where the high density impurity is diffused; an emitter (37) projected in the form of a cone connected to a substrate (31); an insulating layer (32,33,34) which is open closely to the emitter and formed on the top of the substrate; a gate electrode (39) which is formed to surround the edge of the opened insulating layer; a metal silicide (40) which is formed to intensify the characteristics of the emitter on top of the emitter.
Abstract:
An electron emission device includes a polycrystalline film of lanthanum boride, and a size of a crystallite which composes the polycrystalline film is equal to or more than 2.5 nm and equal to or less than 100 nm, preferably the film thickness of the polycrystalline film is equal to or less than 100 nm.
Abstract:
A field emission device (1) may be used for emitting electrons in, for example, a field emission display (FED). Field emission tips (40) are used for the emitting of electrons in the field emission device (1). In operation of the field emission device (1) a voltage is applied between a first electrode (4) having electrical contact with the field emission tip (40) and a second electrode (34) to make the field emission tip (40) emit electrons. To form a field emission tip (40) a layer of liquid material is applied on a substrate (2) provided with the first electrode (4). The layer of liquid material is embossed with a patterned stamp and subsequently cured to form a field emission tip structure (20). A conductive film (38) is applied on the field emission tip structure (20) to form a field emission tip (40) that has electrical contact with the first electrode (4).