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公开(公告)号：KR100399773B1
公开(公告)日：2003-09-26
申请号：KR1020010006188
申请日：2001-02-08
Applicant: 삼성전자주식회사
IPC: G11C5/02
Abstract: The memory modules (82,83) are received in respective slots. Each memory module receives individual voltage from the reference voltage sources (85-1,85-2). An independent claim is included for memory system.
Abstract translation: 存储器模块（82,83）被接收在相应的插槽中。 每个存储器模块从参考电压源（85-1,85-2）接收单独的电压。 内存系统包含独立索赔。
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公开(公告)号：KR1020150054373A
公开(公告)日：2015-05-20
申请号：KR1020130136744
申请日：2013-11-12
Applicant: 삼성전자주식회사
IPC: G06F12/06
Abstract: 메모리시스템의동작방법에서는메모리컨트롤러를초기화시킨다. 메모리컨트롤러가비휘발성메모리및 휘발성메모리를포함하는하이브리드메모리장치의페일(fail) 정보영역으로부터비휘발성메모리및 휘발성메모리의페일정보를독출한다. 메모리컨트롤러가페일정보에기초하여하이브리드메모리장치중 페일정보영역및 페일영역과구분되는안전영역에데이터가저장되도록데이터와관련된논리적어드레스를안전영역의물리적어드레스에매핑한다. 메모리컨트롤러가매핑에따라데이터를안전영역에저장한다. 메모리시스템의동작방법에따르면페일정보를시스템레벨로전달할수 있고, 운영체제는페일정보를이용하여응용프로그램을하이브리드메모리장치내의안전영역에로딩할수 있다.
Abstract translation: 本发明涉及一种操作存储器系统的方法。 该方法包括：初始化存储器控制器的步骤; 存储器控制器从包括非易失性存储器和易失性存储器的混合存储器件的故障信息区域读取非易失性存储器和易失性存储器的故障信息的步骤; 存储器控制器将目标数据的逻辑地址映射到安全区域的物理地址上以将数据存储在与混合存储器件的故障信息区域分离的安全区域中的步骤和基于故障信息的故障区域 ; 以及存储器控制器根据映射操作将数据存储在安全区域中的步骤。 根据存储器系统操作方法，存储器控制器可以将故障信息传递到系统级，并且操作系统可以使用故障信息将应用程序加载到混合存储器件的安全区域中。
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公开(公告)号：KR1020150051641A
公开(公告)日：2015-05-13
申请号：KR1020130133374
申请日：2013-11-05
Applicant: 삼성전자주식회사
Abstract: 메모리시스템의동작방법에서는메모리컨트롤러를초기화시킨다. 메모리컨트롤러가메모리장치에포함되는페일(fail) 정보영역으로부터페일정보를독출한다. 메모리컨트롤러가페일정보에기초하여메모리장치중 페일정보영역및 페일영역을제외한안전영역에프로그램이저장되도록어드레스매핑한다. 메모리컨트롤러가어드레스매핑에따라프로그램을메모리장치의안전영역에로딩한다. 메모리시스템의동작방법을사용하면, 페일정보를시스템레벨로전달할수 있고, 운영체제는페일정보를이용하여응용프로그램을메모리장치내의안전영역에로딩할수 있다.
Abstract translation: 本发明涉及一种操作存储系统的方法，包括以下步骤。 一个内存控制器被初始化。 存储器控制器从包含在存储器件中的故障信息区域读取故障信息。 存储器控制器基于故障信息映射地址，以使程序存储在包括在存储器件中的故障信息区域和故障区域之外的安全区域中。 存储器控制器根据地址映射将程序加载到存储器件的安全区域中。 根据本发明的用于操作存储器系统的方法的使用允许将故障信息传送到系统级和操作系统，以通过使用故障信息将应用程序加载到存储器设备的安全区域。
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Patent Agency Ranking
公开(公告)号：KR1020140134096A
公开(公告)日：2014-11-21
申请号：KR1020130053817
申请日：2013-05-13
Applicant: 삼성전자주식회사
IPC: G11C29/00
CPC classification number: G11C29/70 , G06F12/0246 , G11C29/783
Abstract: 본 발명의 메모리 장치 및 컨트롤러를 포함하는 메모리 시스템에 있어서, 상기 메모리 장치는, 메모리의 배드 블록에 대응하는 페일 어드레스(fail address)를 저장하는 페일 어드레스 저장부; 상기 컨트롤러로부터 수신된 외부 어드레스와 상기 페일 어드레스를 비교하여 일치하는지 여부를 판단하는 페일 어드레스 매칭부; 및 상기 외부 어드레스와 상기 페일 어드레스의 일치 여부에 따라 스턱 비트(Stuck bit) 또는 정상적인 비트를 출력하는 비트 출력부를 포함한다.
Abstract translation: 本发明涉及包括存储器件和控制器的存储器系统。 存储装置包括故障地址存储单元，其存储对应于坏存储器块的故障地址; 确定从控制器接收的外部地址是否匹配失败地址的故障地址匹配单元; 以及根据外部地址和失败地址的匹配结果输出卡位或正常位的位输出单元。
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公开(公告)号：KR1020090017238A
公开(公告)日：2009-02-18
申请号：KR1020070081832
申请日：2007-08-14
Applicant: 삼성전자주식회사
CPC classification number: G06F3/0605 , G06F3/0604 , G06F3/0647 , G06F3/0649 , G06F3/0658 , G06F3/0659 , G06F3/0679 , G06F12/0246 , G06F12/08 , G06F2003/0697 , G06F2212/7202 , G11C11/56 , G11C16/10
Abstract: A semiconductor drive, a data storing method and a computing system including the same are provided to improve the overall write performance by storing the data in the low speed nonvolatile memory managed to the block mapping mode. The command for the write operation, and the address and data are input to an SSD controller from host(100). The inputted data is temporarily stored in the memory. The SSD controller determines whether the data inputted based on the write count value is the hot data or the cold data(110). In case the inputted data are confirmed as hot data, the inputted data are stored in the first layer of the storage media. In case the inputted data are classified as cold data, the inputted data are stored in the second layer of the storage media.
Abstract translation: 提供半导体驱动器，数据存储方法和包括该半导体驱动器的计算系统，以通过将数据存储在管理到块映射模式的低速非易失性存储器中来提高整体写入性能。 写入操作的命令以及地址和数据从主机（100）输入到SSD控制器。 输入的数据被暂时存储在存储器中。 SSD控制器确定基于写入计数值输入的数据是热数据还是冷数据（110）。 在输入数据被确认为热数据的情况下，输入的数据被存储在存储介质的第一层中。 在输入数据被分类为冷数据的情况下，输入的数据被存储在存储介质的第二层中。
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公开(公告)号：KR1020080090018A
公开(公告)日：2008-10-08
申请号：KR1020070032949
申请日：2007-04-03
Abstract: A glass molding die is provided to have an excellent release property, to allow precise processing easily using a bite or abrasive, and to reduce a production cost greatly by using a non-precious metal material for a release thin film. A glass molding die includes: a base material(1); and a protective layer(3) which comprises nickel-tungsten alloy and is formed on the surface of the base material. The protective layer comprises 25-45wt% of tungsten, and has a thickness of 0.1-2 micron. The die comprises a metal intermediate layer(2) formed through deposition of a metal element between the base material and the protective layer. The die comprises a diffusion prevention film between the protective layer and metal intermediate layer. Further, the diffusion prevention film comprises a metal nitride.
Abstract translation: 提供玻璃成型模具以具有优异的剥离性能，能够容易地使用咬入或研磨剂进行精密加工，并通过使用非贵金属材料用于剥离薄膜来大大降低生产成本。 玻璃成形模具包括：基材（1）; 以及包含镍 - 钨合金并形成在基材的表面上的保护层（3）。 保护层包含25-45wt％的钨，其厚度为0.1-2微米。 模具包括通过在基材和保护层之间沉积金属元件形成的金属中间层（2）。 模具包括在保护层和金属中间层之间的防扩散膜。 此外，扩散防止膜包括金属氮化物。
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公开(公告)号：KR1020080090019A
公开(公告)日：2008-10-08
申请号：KR1020070032950
申请日：2007-04-03
Abstract: A die for press-forming glass is provided to have excellent release property, and to retain stable release performance even after high-temperature and high-pressure press molding is repetitively carried out. A die for press-forming glass includes: a base material(1); and a release thin film(3) which comprises iridium and rhenium and is formed on the base material. The rhenium contained in the release thin film decreases away from the surface of the base material. The iridium contained in the release thin film increases away from the surface of the base material. The die further comprises a metal intermediate layer(2) formed through deposition of a metal element between the base material and the release thin film. Further, a diffusion prevention film comprising a metal nitride is formed between the release thin film and the metal intermediate layer.
Abstract translation: 提供了一种压制成形玻璃用模具，其脱模性优异，即使在高温高压加压成型反复进行后也能保持稳定的剥离性能。 压制成形用玻璃的模具包括：基材（1）; 以及包含铱和铼并形成在基材上的释放薄膜（3）。 包含在释放薄膜中的铼从基材的表面减小。 包含在释放薄膜中的铱从基材的表面增加。 模具还包括通过在基材和剥离薄膜之间沉积金属元件形成的金属中间层（2）。 此外，在剥离薄膜和金属中间层之间形成包含金属氮化物的防扩散膜。
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公开(公告)号：KR1020020060340A
公开(公告)日：2002-07-18
申请号：KR1020010001364
申请日：2001-01-10
Applicant: 삼성전자주식회사
IPC: G11C29/00
Abstract: PURPOSE: A method for testing a Rambus memory is provided, which realizes an environment causing noise to a channel, and realizes a specific memory signal under a mounted environment at will, and calculates an accurate memory position and memory access automatically when there is a fail. CONSTITUTION: According to the method for testing a Rambus memory device having a channel of a packet constituted in 8-burst type of 2 byte, 32-bit data of an equal pattern is written/read repetitively to/from all memories of the Rambus memory device. And upper 16 bits and lower 16 bits are exchanged complementarily, to be toggled as "01010101" on a time axis as to one data output pad.
Abstract translation: 目的：提供一种用于测试Rambus存储器的方法，其实现对通道产生噪声的环境，并且在安装环境下随意实现特定的存储器信号，并且当存在故障时自动计算准确的存储器位置和存储器访问 。 构成：根据用于测试具有以8突发类型的2字节构成的分组的信道的Rambus存储器件的方法，相等图案的32位数据被重复写入/读出Rambus存储器的所有存储器 设备。 并且高16位和低16位互补交换，在时间轴上切换为一个数据输出焊盘的“01010101”。
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