-
公开(公告)号:DE69607965T2
公开(公告)日:2000-08-17
申请号:DE69607965
申请日:1996-06-10
Applicant: ABB RESEARCH LTD
Inventor: BERGMAN KARL , BIJLENGA BO , HERMANSSON WILLY , ZDANSKY LENNART
IPC: H01L29/47 , H01L29/861 , H01L29/872 , H02M7/00 , H02M7/538 , H03K17/08 , H03K17/0814 , H03K17/16 , H03K17/725 , H02M1/00 , H02H7/12
-
公开(公告)号:SE9500761D0
公开(公告)日:1995-03-02
申请号:SE9500761
申请日:1995-03-02
Applicant: ABB RESEARCH LTD
Inventor: BIJLENGA BO
IPC: H01L27/04 , H01L21/822 , H02H7/20 , H02H9/04 , H02M1/08 , H02M7/538 , H03K17/0814 , H03K17/082
-
公开(公告)号:SE9704149D0
公开(公告)日:1997-11-13
申请号:SE9704149
申请日:1997-11-13
Applicant: ABB RESEARCH LTD
Inventor: BIJLENGA BO , ZDANSKY LENNART , HARRIS CHRISTOPHER , BAKOWSKI MIETEK , KONSTANTINOV ANDREY , GUSTAFSSON ULF
-
公开(公告)号:SE9602407D0
公开(公告)日:1996-06-19
申请号:SE9602407
申请日:1996-06-19
Applicant: ABB RESEARCH LTD
Inventor: HARRIS CHRISTOPHER , BAKOWSKI MIETEK , ZDANSKY LENNART , BIJLENGA BO
Abstract: In a method for producing a channel region layer in a SiC-layer for providing a voltage-controlled semiconductor device a layer of silicon being one of a) polycrystalline and b) amorphous is applied on top of the SiC-layer, an aperture is etched in the silicon layer extending to the SiC-layer, a surface layer of a certain thickness of the silicon layer is oxidized, and the lateral extension of the channel region layer is determined by removing the oxidized layer and carrying out a further implantation into the area exposed by the so formed enlarged aperture.
-
-
-