Abstract:
An exposure apparatus, wherein at least one of optical members constituting an exposure light source system, an illuminating optical system, a photomask and a projection optical system, is made of a synthetic quartz glass for an optical member, which has an absorption coefficient of 0.70 cm or less at a wavelength of 157 nm and an infrared absorption peak attributable to SiOH stretching vibration at about 3640 cm .
Abstract:
Silicon carbide having a resistivity of from 10 to 10 OMEGA .cm and a powder X-ray diffraction peak intensity ratio of at least 0.005 as represented by Id1/Id2 where Id1 is the peak intensity in the vicinity of 2&thetas; being 34 DEG and Id2 is the peak intensity in the vicinity of 2&thetas; being 36 DEG .
Abstract:
It is characterized by having a pellicle sheet made of a synthetic quartz glass having an OH group concentration of at most 100 ppm and containing substantially no oxygen deficient defect. It is particularly preferred that the OH group concentration is at most 10 ppm, and the internal transmittance is at least 80 %/cm at a wavelength of 157 nm.
Abstract:
It is characterized by having a pellicle sheet made of a synthetic quartz glass having an OH group concentration of at most 100 ppm and containing substantially no oxygen deficient defect. It is particularly preferred that the OH group concentration is at most 10 ppm, and the internal transmittance is at least 80 %/cm at a wavelength of 157 nm.
Abstract:
A structure for attaching a pellicle to a photomask, the pellicle comprising a pellicle frame and a pellicle sheet attached to an opening portion formed in the pellicle frame, wherein at least a portion of the pellicle frame surface in contact with the photo-mask has a direct contact with the photo-mask without interposing an adhesive.
Abstract:
A process for the production of synthetic silica glass optical members which contain 1 x 10 or more hydrogen molecules per cm , have OH group concentrations of 200 ppm or below and are substantially free from reduction type defects, by treating a synthetic silica glass containing fewer than 1 x 10 hydrogen molecules per cm at a temperature of 300 to 600 DEG C in a hydrogen-containing atmosphere at a pressure of 2 to 30 atms.
Abstract:
A synthetic quartz glass to be used for vacuum ultraviolet lights having a wavelength of 175 nm or less which is characterized in that it has an OH group content of 100 ppm or less and is substantially free of reducing type defects.