公开(公告)号：DE3909143A1

公开(公告)日：1990-09-27

申请号：DE3909143

申请日：1989-03-21

Applicant: BASF AG

Inventor： HICKEL WERNER DR ,  KNOLL WOLFGANG DR ,  ROTHENHAEUSLER BENNO DR

IPC: G01B11/06 ,  G01B11/30 ,  G01N21/552 ,  G01N21/88

Abstract: The invention relates to a method for examination of surface structures which differ with respect to refractive index and/or height modulation of the surface, these surface structures being brought into a surface/plasmon field and scanned by means of surface/plasmon microscopy.

公开(公告)号：DE3906521A1

公开(公告)日：1990-09-13

申请号：DE3906521

申请日：1989-03-02

Applicant: BASF AG

Inventor： FUNHOFF DIRK DR ,  FUCHS HARALD DR ,  LICHT ULRIKE DR ,  SCHREPP WOLFGANG DR ,  HICKEL WERNER DR ,  KNOLL WOLFGANG DR ,  WEGNER GERHARD PROF DR ,  DUDA GISELA DR

IPC: G11B7/00 ,  G11B7/005 ,  G11B7/24 ,  G11B7/244 ,  G11B7/245 ,  G11B11/00

Abstract: The invention relates to a method for reproducing information which is recorded in thin polymer films, information in thin polymer films which have been applied to a metal or semiconductor layer, by means of electromagnetic or particle beams which induce a permanent change in the properties of the polymer films in the irradiated areas, being reproduced by surface plasmons. … …