Abstract:
A latent image memory is selectively operable as either a readwrite memory or a read-only memory. The memory comprises an array of cells each preferably consisting of a single active device. A first set of the cells are each adapted to store either one of two binary digits. A second set of the cells are each responsive to a first condition for storing either one of two binary digits and responsive to a second condition for storing only a single predetermined binary digit. Means are provided for selecting either the first condition to render the array operable as a read-write memory, or the second condition to render the array operable as a read-only memory. Each of the cells of the first set preferably comprises a field-effect transistor connected to a capacitor, and each of the cells of the second set preferably comprises a charge-coupled device.
Abstract:
A binary data storage system of a data processing system is comprised of electrically independent storage modules, each module comprised of a matrix of electrically independent storage devices, with each storage device being an integral circuit element comprised of a first matrix of binary storage cells and associated selection circuitry, and a second matrix of binary storage cells and associated selection circuitry. The design of the binary storage cell of the first matrix and associated selection circuitry is such that a large number of storage cells can occupy a unit space but provide relatively slow access to the binary data manifested by the cell. The second matrix of binary storage cells and associated selection circuitry is formed in such a way that a relatively small number of storage cells are provided with a relatively high speed of access to the binary data manifested in the storage cells. Each storage device has a single terminal for the transfer of a single binary bit to or from the storage device. Each of the previously mentioned storage modules also has a single terminal for the transfer of a single binary bit to or from the storage module. All of the terminals of the storage devices are connected in common to the terminal of a storage module. One storage module is provided for each binary bit of a data processing system binary data word to be transferred between the storage system and the central processing unit of the data processing system. The most recently accessed binary data will be manifested in the high speed storage cells of the second matrix such that when address information is sent to the storage system, a large percentage of the requests for access to the storage system will find the data in the high speed portion of each of the storage devices providing an effective access time to the data in the storage system significantly faster than if the access to the data were required to be made to the storage cells of the first matrix.
Abstract:
A read only memory comprising a plurality of semiconductor device cells arranged in rows and columns. Spaced conductive lines extending in a Y direction are connected to a first cell terminal. A plurality of second cell terminals defining a row or column are selectively interconnected to one or the other of a pair of adjacent X lines. The semiconductor device cells interconnected between the adjacent X line pair are responsive to digital input signals applied on the plurality of Y lines to generate distinct logical signals on the pair of adjacent X lines.
Abstract:
1345604 Semi-conductor data storage cell INTERNATIONAL BUSINESS MACHINES CORP 27 May 1971 [30 June 1970] 17441/71 Heading H3T [Also in Division G4] A capacitor storage cell C28, C33, T44, T46 has its stored data refreshed or maintained by a transistor 50 cross-coupled with T46 (Fig. 1). C28 is charged by a pulse 16 (Fig. 1A) at terminal 14 via R22, D24 and line 26, and discharged or not by T44 if the data input 10 is high or low respectively, when a negative pulse 56 occurs at T44 emitter 30; then C33 is charged by pulse 32 at 30 via R36, D38 and discharged or not by T46 when a negative pulse 52 occurs at T46 emitter 14 depending upon the stored voltage on C28. To regenerate the information stored to allow for leakage, a similar cycle of pulses is applied at times t 5 -t 8 but instead of T44 discharging C28 in dependence on the input, T50 is biased by a pulse 50 at 58 to discharge C28 or not according to the already stored level on C33. The transistor 50 may be replaced by a cross-coupled pair (T128, 130, Fig. 2, not shown) and in this case stored, information is maintained merely by a constantly applied negative level - V at their commoned emitters (134). A shift register (Fig. 3, not shown) has a plurality of these cells (156-m) in each row (150-n).
Abstract:
A monolithic memory including a plurality of interconnected cells. Each cell includes a diode in series with bipolar device or transistor which is dynamically or pulse powered. Parasitic capacitors are used as storage elements.