Abstract:
A memory device (100) is proposed. The memory device includes a plurality of memory cells (Mc) each one for storing a value, at least one reference cell (Mr 0 -Mr 2 ), biasing means (115) for biasing a set of selected memory cells and the at least one reference cell with a biasing voltage (Vc,Vr) having a substantially monotone time pattern, means (130) for detecting the reaching of a threshold value by a current (Ic,Ir) of each selected memory cell and of each reference cell, and means (145) for determining the value stored in each selected memory cell according to a temporal relation of the reaching of the threshold value by the currents of the selected memory cell and of the at least one reference cell. The biasing means includes means (305) for applying a predetermined biasing current (Ib) to the selected memory cells and to the at least one reference cell.
Abstract:
The present invention relates to a method for programming a multilevel memory of the flash EEPROM type comprising a matrix of cells grouped in memory words. Advantageously according to the invention the method provides the simultaneous generation of a first programming voltage value (V PROG ) and a second verify voltage value (V VER ), suitable to bias word lines (WLS) of the above memory matrix, respectively during programming and verify operations of the memory itself. The present invention also relates to a circuit implementing the above method.
Abstract:
The memory comprises a matrix of cells (10), a charge pump (11), a voltage regulator, controllable connection elements (12) each connected between the output of the charge pump (11) and a column line of the matrix of cells, and means (14) for selectively activating the connection elements. To arrange for the voltage of a cell in a predetermined biasing condition, for example, the programming condition, to be independent of temperature variations and of manufacturing and design parameters, the memory comprises a first element (12') equivalent to a connection element (12) and a second element (10') equivalent to a memory cell (10) in the predetermined biasing condition. These equivalent elements are connected in series with one another between the output terminal and the common terminal of the charge pump (11). The regulator (15, 17) is connected between the second equivalent element (10') and the input of the charge pump (11) in order to regulate the output voltage of the charge pump (11) in dependence on the voltage across the second equivalent element (10').