Abstract:
A circuit (125,130) for biasing an input node (Na) of a sense amplifier (115) is proposed. The circuit includes means (125) for keeping the input node at a pre-set operative voltage during a sensing operation; the circuit of the invention further includes means (250) for pulling the input node from a starting voltage towards a power supply voltage (+Vdd), the operative voltage being comprised between the starting voltage and the power supply voltage, and control means (255) for disabling the means for pulling before the input node reaches the operative voltage.
Abstract:
A method for configuring a voltage regulator (20) connected to a memory cell (1) is described, the method comprising the steps of:
identifying at least a first and a second operation regions of the cell (1); associating the first and second operation regions with respective first and second operation conditions of the cell (1); detecting an operative condition of the cell (1) involved in a programming operation; generating at least a configuration signal (EN_LOW_IPROG_HV) of the regulator according to said detected operative condition, this configuration signal (EN_LOW_IPROG_HV) taking a first and a second value associated with the first and second operation conditions.
Abstract:
A description has been given of a regulator for a digital-to-analog converter having in input a digital signal (BUS ) and being suitable for providing an analog signal (Vout) in output. The regulator comprises at least one pair of buffers (Buf1, Buf2..Bufn) having in input said digital signal (BUS ) and the outputs connected to a pair of circuit branches (r1, r2..rn) connected to the output of the regulator; each of said at least two circuit branches comprises at least one resistance. To at least one (Buf2, Buf3...Bufn)) of said at least one pair of buffers a variable resistance (Rv2...Rvn) is associated and the regulator comprises means (10) having in input the analog signal and being suitable for measuring its trend and acting on the variable resistance (Rv2...Rvn) in response to its possible anomalous trend compared to a desired trend.
Abstract:
A memory device (100) is proposed. The memory device includes a plurality of memory cells (Mc) each one for storing a value, at least one reference cell (Mr 0 -Mr 2 ), biasing means (115) for biasing a set of selected memory cells and the at least one reference cell with a biasing voltage (Vc,Vr) having a substantially monotone time pattern, means (130) for detecting the reaching of a threshold value by a current (Ic,Ir) of each selected memory cell and of each reference cell, and means (145) for determining the value stored in each selected memory cell according to a temporal relation of the reaching of the threshold value by the currents of the selected memory cell and of the at least one reference cell. The biasing means includes means (305) for applying a predetermined biasing current (Ib) to the selected memory cells and to the at least one reference cell.
Abstract:
The present invention relates to a method for programming a multilevel memory of the flash EEPROM type comprising a matrix of cells grouped in memory words. Advantageously according to the invention the method provides the simultaneous generation of a first programming voltage value (V PROG ) and a second verify voltage value (V VER ), suitable to bias word lines (WLS) of the above memory matrix, respectively during programming and verify operations of the memory itself. The present invention also relates to a circuit implementing the above method.
Abstract:
In a memory device (1; 30) having an array (2) of memory cells (3), a column decoder (9) is configured to address the memory cells (3), and a charge-pump supply circuit (6; 32) generates a boosted supply voltage (V b ; V yr ) for the column decoder (9). A connecting stage (22) is arranged between the supply circuit (6; 32) and the column decoder (9); the connecting stage (22) switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device (1; 30), in particular during a reading step.