Abstract:
A content addressable memory cell (105) for a non-volatile Content Addressable Memory (100), including non-volatile storage means (S1,S2,S) for storing a content digit, a selection input (WL i ;WL i ,BLP j ) for selecting the memory cell, a search input for receiving a search digit (BLR j ,BLL j ), and a comparison circuit arrangement for comparing the search digit to the content digit and for driving a match output (ML i ) of the memory cell so as to signal a match between the content digit and the search digit. The non-volatile storage means include at least one Phase-Change Memory element (S1,S2,S) for storing in a non-volatile way the respective content digit.
Abstract:
A content addressable memory cell (105) for a non-volatile Content Addressable Memory (100), including non-volatile storage means (S1,S2,S) for storing a content digit, a selection input (WL i ;WL i ,BLP j ) for selecting the memory cell, a search input for receiving a search digit (BLR j ,BLL j ), and a comparison circuit arrangement for comparing the search digit to the content digit and for driving a match output (ML i ) of the memory cell so as to signal a match between the content digit and the search digit. The non-volatile storage means include at least one Phase-Change Memory element (S1,S2,S) for storing in a non-volatile way the respective content digit.
Abstract:
Described herein is a column decoder (5) for a phase-change memory device (1; 1') provided with an array (2) of memory cells (3), a reading stage (6) for reading data contained in the memory cells (3), and a programming stage (7) for programming these data; the column decoder (5) selects and enables biasing of a bitline (BL) of the array (2) and generates a current path between the bitline (BL) and the reading stage (6; 6') or, alternatively, the programming stage (7), respectively during a reading or a programming operation of the contents of the memory cells. In the column decoder, a first decoder circuit (5a) generates a first current path between the bitline (BL) and the reading stage (6; 6'), and a second decoder circuit (5b), distinct and separate from the first decoder circuit (5a), generates a second current path, distinct from the first current path, between the bitline (BL) and the programming stage (7).
Abstract:
Described herein is a row decoder (5) for a phase-change memory device (1) provided with an array (2) of memory cells (3) organized according to a plurality of array wordlines (WL ) and array bitlines (BL); the row decoder (5) has a hierarchical architecture and has a global decoder (8; 8') that addresses a first (MWL_LV; MWL') and a second (MWL; MWL_WR) global wordline according to first address signals (GP, D); and at least one local decoder (9; 9'), which is operatively coupled to the global decoder (8; 8') and addresses a respective array wordline (WL ) according to the value of the first global wordline and the second global wordline and of second address signals (WLSEL, WLSELN_LV; WLSEL_SW). The local decoder (9; 9') has a first circuit branch (25, 26, 31; 40, 41) generating, when the first global wordline (MWL_LV; MWL') is addressed, a first current path between the array wordline (WL ) and a first biasing source (V DD ) during a reading operation; and a second circuit branch (32; 42) generating, when the second global wordline (MWL_LV; MWL') is addressed, a second current path, distinct from the first current path, between the array wordline (WL ) and a second biasing source (V CC ) during a programming operation.