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    MASS SPECTROMETRY
    11.
    发明申请
    MASS SPECTROMETRY 审中-公开
    质谱

    公开(公告)号：WO2003067626A1

    公开(公告)日：2003-08-14

    申请号：PCT/GB2003/000312

    申请日：2003-01-27

    Applicant: MICROSAIC SYSTEMS LIMITED ,  SYMS, Richard

    Inventor： SYMS, Richard

    IPC: H01J49/10

    CPC classification number: H01J49/147 ,  H01J49/0018 ,  H01J49/08 ,  H01J49/4215

    Abstract: A method of fabricating miniature quadrupole electrostatic mass filter has been previously described. The electrodes are metallised cylinders, mounted in grooves etched in oxidised silicon substrates, which are held apart at the correct spacing by cylindrical spacer rods. This invention concerns an ion source mounted on extensions of the spacer rods, which project beyond the mass filter. The ion source consists of a cold-cathode electron emitter, which emits electrons with energies sufficient to cause impact ionisation, and electrostatic optics suitable for coupling the ion flux into the mass filter. Methods of constructing a single self-aligned electron source and a similar dual source are described. Arrangements for mounting the electron source and the ion coupling lens so that the electron and ion beams travel at right angles to one another for efficient separation are described. A method of fabricating a self-aligned one-dimensional einzel electrostatic lens from metallised cylinders mounted in the silicon substrates using etched grooves is described. A method of fabricating a-self-aligned two-dimensional einzel lens from metal plates is also described.

    Abstract translation: 以前已经描述了制造微型四极静电质量过滤器的方法。 电极是金属化的气缸，安装在蚀刻在氧化硅衬底中的槽中，它们通过圆柱形间隔棒以正确的间隔分开。 本发明涉及一种安装在间隔棒的延伸部上的离子源，其突出超过质量过滤器。 离子源由冷阴极电子发射器组成，其发射能量足以引起冲击电离的电子，以及适于将离子通量耦合到质量过滤器中的静电光学器件。 描述了构建单个自对准电子源和类似双源的方法。 描述了用于安装电子源和离子耦合透镜以使电子和离子束彼此成直角行进以进行有效分离的布置。 描述了使用蚀刻槽从安装在硅衬底中的金属化气缸制造自对准的一维立体静电透镜的方法。 还描述了从金属板制造自对准二维单面透镜的方法。

    COLLISION JUDGMENT APPARATUS, RECORDING MEDIUM RECORDING PROGRAM, AND COLLISION JUDGMENT METHOD
    13.
    发明公开
    COLLISION JUDGMENT APPARATUS, RECORDING MEDIUM RECORDING PROGRAM, AND COLLISION JUDGMENT METHOD 审中-实审

    公开(公告)号：EP4404235A2

    公开(公告)日：2024-07-24

    申请号：EP23216424.4

    申请日：2023-12-13

    Applicant: JEOL Ltd.

    Inventor： HAYASHI, Kohei ,  KAKEYA, Takumi

    IPC: H01J37/26 ,  H01J37/20 ,  H01J37/28 ,  H01J49/08

    CPC classification number: H01J37/28 ,  H01J49/08 ,  H01J37/26 ,  H01J2237/2029220130101 ,  H01J37/20

    Abstract: Based on a three-dimensional model of a dynamic object having a position which changes, point group information which represents, with a group of points, a three-dimensional shape of the dynamic object is generated. Based on a three-dimensional model of a static object having a position which does not change, point group information representing, with a group of points, a three-dimensional shape of the static object is generated. Based on the point group information of the static object, voxel group information which represents, with a group of voxels, the three-dimensional shape of the static object, and which is formed into a database is generated. Presence or absence of overlap between the dynamic object and the static object is judged by collating voxel group information representing the static object which is present on a movement path of the dynamic object, and point group information representing the dynamic object.

    Method and apparatus for analyzing a gas sample
    14.
    发明公开
    Method and apparatus for analyzing a gas sample 失效
    用于分析气体样品的方法和装置。

    公开(公告)号：EP0647963A3

    公开(公告)日：1996-01-10

    申请号：EP94307145.6

    申请日：1994-09-29

    Applicant: MARQUETTE ELECTRONICS, INC.

    Inventor： Ellis, Donald G. ,  Micco, Alexander J. ,  Baer, Norman W.

    IPC: H01J49/04 ,  H01J49/14 ,  H01J49/42 ,  H01J49/10

    CPC classification number: H01J49/0422 ,  H01J49/08 ,  H01J49/147 ,  H01J49/4215

    Abstract: A mass spectrometer system for gas analysis comprises an ion pump (12) for creating an internal vacuum within said mass spectrometer, an ionization chamber (26), an inlet passage (14) through which a gas sample is introduced into the ionization chamber, extraction means a quadrupole filter (50) into which the ions and electrons are directed by the extractor plate (48), the quadrupole filter (50) being operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter while ions other than those having the pre-selected mass-to-charge ratio separate from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter (50) so that the electrons combine with the ions, a sensor (64) for detecting the stream of ions passing through the quadrupole filter (50), and analyzing means (80) connected with the sensor for analyzing the components of the gas sample.

    Method and apparatus for analyzing a gas sample
    15.
    发明公开
    Method and apparatus for analyzing a gas sample 失效
    Verfahren und Vorrichtung zur分析von Gasproben。

    公开(公告)号：EP0647963A2

    公开(公告)日：1995-04-12

    申请号：EP94307145.6

    申请日：1994-09-29

    Applicant: MARQUETTE ELECTRONICS, INC.

    Inventor： Ellis, Donald G. ,  Micco, Alexander J. ,  Baer, Norman W.

    IPC: H01J49/04 ,  H01J49/14 ,  H01J49/42 ,  H01J49/10

    CPC classification number: H01J49/0422 ,  H01J49/08 ,  H01J49/147 ,  H01J49/4215

    Abstract: A mass spectrometer system for gas analysis comprises an ion pump (12) for creating an internal vacuum within said mass spectrometer, an ionization chamber (26), an inlet passage (14) through which a gas sample is introduced into the ionization chamber, extraction means a quadrupole filter (50) into which the ions and electrons are directed by the extractor plate (48), the quadrupole filter (50) being operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter while ions other than those having the pre-selected mass-to-charge ratio separate from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter (50) so that the electrons combine with the ions, a sensor (64) for detecting the stream of ions passing through the quadrupole filter (50), and analyzing means (80) connected with the sensor for analyzing the components of the gas sample.

    Abstract translation: 用于气体分析的质谱仪系统包括用于在所述质谱仪内产生内部真空的离子泵（12），离子化室（26），将气体样品引入电离室的入口通道（14），阀 与入口通道相关联的用于控制引入电离室（26）的气体样品的体积的装置（18,20），用于将电子引入电离室（26）的细丝（32），由此电子轰击气体样品，因此 形成离子;邻近电离室（26）定位的提取器板（48），并被偏置，使得一部分离子和电子被允许通过提取器板;四极过滤器（50），离子和电子被定向到其中 通过提取器板（48），四极过滤器（50）可操作以允许具有预先选择的质荷比的离子流通过过滤器，而除了具有预选质量比 与离子流分离的质荷比，用于将电子引向除了在所述四极滤波器（50）的区域中具有预选质量 - 电荷比的那些之外的离子的装置，使得电子与 离子，用于检测通过四极过滤器（50）的离子流的传感器（64），以及与传感器连接的用于分析气体样品的分量的分析装置（80）。

    GAS ANALYZER
    16.
    发明授权
    GAS ANALYZER 有权

    公开(公告)号：EP2006672B1

    公开(公告)日：2018-11-28

    申请号：EP07736895.9

    申请日：2007-03-16

    Applicant: Rigaku Corporation

    Inventor： ARII, Tadashi ,  TAKATA, Yoshihiro ,  OTAKE, Satoshi ,  MATSUURA, Shigeki

    IPC: G01N27/64 ,  G01N27/62 ,  H01J49/08 ,  H01J49/16 ,  H01J49/10

    CPC classification number: G01N27/64 ,  H01J49/08 ,  H01J49/147 ,  H01J49/162

    Abstract: A plurality of molecular components contained in a gas are to be ionized together at the same time by the PI method. For example, a plurality of molecular components contained in a gas generated at a certain instant are accurately analyzed in real-time based on the PI method. A gas analyzer includes a gas conveyor 4 that conveys a gas generated from a sample S in a sample chamber R0 to an analysis chamber R1, an ionizer 19 that ionizes the gas, a quadrupole filter 21 that separates ions for each mass-to-charge ratio, and an ion detector 22 that detects the separated ions. The ionizer 19 has an ionizing region provided near a gas outlet of the gas conveyor 4 and a lamp 33A that applies light to the ionizing region. Since the lamp 33A emits light having an light directivity lower than that of laser light and traveling in a spreading manner, the gas having entered the ionizing region in the ionizer 19 receives light irradiation in a wide range, and a plurality of gas components therein are ionized.

    GAS ANALYZER
    17.
    发明公开
    GAS ANALYZER 审中-公开
    GASANALYSEGERÄT

    公开(公告)号：EP2006672A1

    公开(公告)日：2008-12-24

    申请号：EP07736895.9

    申请日：2007-03-16

    Applicant: Rigaku Corporation ,  HAMAMATSU PHOTONICS K. K.

    Inventor： ARII, Tadashi ,  TAKATA, Yoshihiro ,  OTAKE, Satoshi ,  MATSUURA, Shigeki

    IPC: G01N27/64 ,  G01N27/62

    CPC classification number: G01N27/64 ,  H01J49/08 ,  H01J49/147 ,  H01J49/162

    Abstract: A plurality of molecular components contained in a gas are to be ionized together at the same time by the PI method. For example, a plurality of molecular components contained in a gas generated at a certain instant are accurately analyzed in real-time based on the PI method.
    A gas analyzer includes a gas conveyor 4 that conveys a gas generated from a sample S in a sample chamber R0 to an analysis chamber R1, an ionizer 19 that ionizes the gas, a quadrupole filter 21 that separates ions for each mass-to-charge ratio, and an ion detector 22 that detects the separated ions. The ionizer 19 has an ionizing region provided near a gas outlet of the gas conveyor 4 and a lamp 33A that applies light to the ionizing region. Since the lamp 33A emits light having an light directivity lower than that of laser light and traveling in a spreading manner, the gas having entered the ionizing region in the ionizer 19 receives light irradiation in a wide range, and a plurality of gas components therein are ionized.

    Abstract translation: 通过PI法同时将气体中所含的多种分子成分同时离子化。 例如，基于PI法，能够实时地分析在某一时刻产生的气体中所含的多个分子成分。 气体分析仪包括：将从样品室R0中的样品S产生的气体输送到分析室R1的气体输送器4，使气体离子化的离子发生器19;将每个质量与电荷分离离子的四极过滤器21 以及检测分离的离子的离子检测器22。 电离器19具有设置在气体输送器4的气体出口附近的电离区域和向该电离区域施加光的灯33A。 由于灯33A发光的方向性低于激光的光并且以扩散方式行进，所以进入离子发生器19的电离区域的气体接收宽范围的光照射，其中多个气体成分是 电离。

    FOURIER TRANSFORM MASS SPECTROMETER
    19.
    发明公开
    FOURIER TRANSFORM MASS SPECTROMETER 审中-公开
    傅立叶变换质谱仪

    公开(公告)号：EP3289603A1

    公开(公告)日：2018-03-07

    申请号：EP16786029.5

    申请日：2016-04-20

    Applicant: DH Technologies Development Pte. Ltd.

    Inventor： HAGER, James Walter

    IPC: H01J49/42 ,  H01J49/08 ,  H01J49/36

    CPC classification number: H01J49/38 ,  H01J49/08 ,  H01J49/4205

    Abstract: A quadrupole is filled with ions and the ions are cooled by applying a pressure and gas flow within the quadrupole. Ions are trapped in the quadrupole by applying a DC voltage and an RF voltage to quadrupole rods of the quadrupole, one or more DC voltages to a plurality of auxiliary electrodes of the quadrupole, and a DC voltage and an RF voltage to an exit lens at the end of the quadrupole. The ions are coherently oscillated after the filling and cooling by applying a coherent excitation between at least two rods of the quadrupole rods. The coherently oscillating ions are axially ejected through the exit lens and to a destructive detector for detection by changing one or more voltages of the one or more DC voltages of the plurality of auxiliary electrodes and changing the DC voltage of the exit lens.

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