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公开(公告)号：US20180275067A1
公开(公告)日：2018-09-27
申请号：US15928870
申请日：2018-03-22
Applicant: Sumitomo Chemical Company Limited
Inventor： Matthew Roberts , Irene Zaccari , May Wheeler
CPC classification number: G01N21/658 , B01L3/502 , B01L3/5023 , B01L2300/0654 , B01L2300/0681 , B01L2300/0825 , G01J3/02 , G01J3/021 , G01J3/0229 , G01J3/0259 , G01J3/04 , G01J3/12 , G01J3/1804 , G01J3/44 , G01N21/8483
Abstract: A device for performing Raman spectroscopy is disclosed. The device comprises a sensor device comprising a transparent substrate having first and second opposite faces. The sensor device comprises a light source, a first grating, a first reflective element, and a light detector carried by the first face of the substrate. The light source is arranged to emit light towards the second face of the substrate and the light detector is directed at the second face of the substrate. The first grating is interposed between the light source and the light detector. The first reflective element is interposed between the light source and the first grating. The sensor device comprises a second grating and a second reflective element carried by the second face of the substrate, the second grating arranged to receive light from the light source and the second reflective element arranged to receive light from the first grating. The sensor device comprises a light-filtering layer disposed in the substrate between the first and second faces. The device for performing Raman spectroscopy comprises a fluidic device coupled to the sensor device next to the second face of the sensor device. The fluidic device comprises an analyte binding site next to the second face of the substrate, a port and a channel between the port and the analyte binding site for directing a test sample from the port to the analyte binding site. The light filtering layer comprises a first pair of light blocking regions arranged to provide a first aperture in a first optical path between the first grating and the detector and a second pair of light blocking regions arranged to provide a second aperture in a second optical path between the second grating and the analyte binding site.
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公开(公告)号：US20180100767A1
公开(公告)日：2018-04-12
申请号：US15805278
申请日：2017-11-07
Applicant: Brandt Christopher Pein , Harold Young Hwang , Wendi Chang , Keith Adam Nelson , Vladimir Bulovic , Nathaniel C. Brandt
Inventor： Brandt Christopher Pein , Harold Young Hwang , Wendi Chang , Keith Adam Nelson , Vladimir Bulovic , Nathaniel C. Brandt
CPC classification number: G01J5/046 , G01J1/58 , G01J3/0216 , G01J3/0245 , G01J3/04 , G01J3/42 , G01J5/0815 , G01J5/0837
Abstract: A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.
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223.发明授权公开(公告)号：US09939320B2
公开(公告)日：2018-04-10
申请号：US15362037
申请日：2016-11-28
Applicant: Electronic Photonic IC Inc. (EPIC Inc.)
Inventor： Seng-Tiong Ho , Yingyan Huang
CPC classification number: G01J3/20 , G01J3/0218 , G01J3/0237 , G01J3/0256 , G01J3/0259 , G01J3/04 , G01J3/18 , G01J3/1895 , G01J3/24 , G01J3/28 , G01J2003/1842 , G01J2003/1847 , G02B5/1861 , G02B6/29326 , G02B6/2938
Abstract: The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (COGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.
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224.发明申请公开(公告)号：US20180087963A1
公开(公告)日：2018-03-29
申请号：US15714454
申请日：2017-09-25
Inventor： Heinrich Grueger , Jens Knobbe , Tino Puegner
CPC classification number: G01J3/1804 , G01J3/0202 , G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0256 , G01J3/04 , G01J3/06 , G01J2003/1885
Abstract: An optical arrangement for a spectral analysis system, a method for producing an optical arrangement for a spectral analysis system and a spectral analysis system are disclosed. In an embodiment the optical arrangement includes a carrier substrate having a placement area for a frame and a base area, and a diffraction grating movably arranged in the frame, wherein the frame is arranged on the placement area in an inclined placement position with respect to the base area so that the diffraction grating, arranged in a base position, is inclined with respect to the base area.
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公开(公告)号：US09726542B2
公开(公告)日：2017-08-08
申请号：US14546271
申请日：2014-11-18
Applicant: RAYTHEON COMPANY
Inventor： John F. Silny
CPC classification number: G01J3/2823 , G01J3/0208 , G01J3/0232 , G01J3/027 , G01J3/04 , G01J3/08 , G01J3/18
Abstract: A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.
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Patent Agency Ranking
公开(公告)号：US09528877B2
公开(公告)日：2016-12-27
申请号：US14607745
申请日：2015-01-28
Applicant: Buerkert Werke GmbH
Inventor： Martin Garbos , Christoph Scholl
CPC classification number: G01J3/28 , G01J3/0208 , G01J3/0229 , G01J3/04 , G01J3/18 , G01J2003/2866 , G01N21/255 , G01N21/85 , G01N2201/061 , G01N2201/068
Abstract: A spectrometer, in particular for being installed in a sensor module of a fluid analysis system, including a radiation source and the following components defining a beam path or being arranged along the beam path: a sample chamber for a fluid to be examined, a first lens, a diffraction element, a second lens and a detector. A restriction aperture for restricting the effective diameter of the light beam incident on the diffraction element is provided between the sample chamber and the diffraction element.
Abstract translation: 一种光谱仪，特别是用于安装在流体分析系统的传感器模块中，包括辐射源和限定光束路径或沿着光束路径布置的以下部件：用于待检查流体的样品室，第一 透镜，衍射元件，第二透镜和检测器。 在样品室和衍射元件之间设置用于限制入射在衍射元件上的光束的有效直径的限制孔。
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227.发明授权Optical emission spectroscopic (OES) instrument with automatic top and bottom slit curtains 有权具有自动顶部和底部狭缝窗帘的光学发射光谱仪（OES）仪器公开(公告)号：US09494463B2
公开(公告)日：2016-11-15
申请号：US14293405
申请日：2014-06-02
Inventor： Mark A. Hamilton
CPC classification number: G01J3/0229 , G01J3/0237 , G01J3/0264 , G01J3/027 , G01J3/0272 , G01J3/0289 , G01J3/0291 , G01J3/04 , G01J3/06 , G01J3/443
Abstract: An optical emission spectroscopic (OES) instrument includes a spectrometer, a processor and an adjustable mask controlled by the processor. The adjustable mask defines a portion of an analytical gap imaged by the spectrometer. The instrument automatically adjusts the size and position of an opening in the mask, so the spectrometer images an optimal portion of plasma formed in the analytical gap, thereby improving signal and noise characteristics of the instrument, without requiring tedious and time-consuming manual adjustment of the mask during manufacture or use.
Abstract translation: 光发射光谱（OES）仪器包括光谱仪，处理器和由处理器控制的可调掩模。 可调节掩模定义了由光谱仪成像的分析间隙的一部分。 仪器自动调整面罩开口的尺寸和位置，因此光谱仪将分析间隙中形成的等离子体的最佳部分图像化，从而提高仪器的信号和噪声特性，而不需要繁琐乏味的手动调节 面具在制造或使用过程中。
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公开(公告)号：US20160258807A1
公开(公告)日：2016-09-08
申请号：US15061308
申请日：2016-03-04
Applicant: Brandt Christopher Pein , Harold Young Hwang , Wendi Chang , Keith A. Nelson , Vladimir Bulovic , Nathaniel C. Brandt
Inventor： Brandt Christopher Pein , Harold Young Hwang , Wendi Chang , Keith A. Nelson , Vladimir Bulovic , Nathaniel C. Brandt
CPC classification number: G01J5/046 , G01J1/58 , G01J3/0216 , G01J3/0245 , G01J3/04 , G01J3/42 , G01J5/0815 , G01J5/0837
Abstract: A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.
Abstract translation: 放射线检测技术采用场增强结构和电致发光材料将入射的太赫兹（THz）辐射转换成可见光和/或红外光。 在这种技术中，诸如开环谐振器或微缝隙的场增强结构增强了施加电致发光材料的局部区域内的进入的THz光的电场。 增强的电场然后诱导电致发光材料通过电致发光工艺发射可见光和/或红外光。 诸如雪崩光电二极管的检测器可以检测和测量发射的光。 这种技术允许在室温下对THz辐射进行成本有效的检测。
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公开(公告)号：US09429472B2
公开(公告)日：2016-08-30
申请号：US14894821
申请日：2014-05-15
Applicant: KONICA MINOLTA, INC.
Inventor： Shinichi Iida , Wataru Yamaguchi
CPC classification number: G01J3/42 , G01J1/0271 , G01J1/1626 , G01J1/42 , G01J3/0262 , G01J3/0291 , G01J3/04 , G01J3/10 , G01J3/50 , G01J3/504 , G01J2001/1636 , G01J2003/425
Abstract: An illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam in the light is guided to the object to be illuminated. A second light beam in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam and a traveling direction of the second light beam make the same angle with the reference axis.
Abstract translation: 照明装置设置有光源，光电检测器和支撑结构。 发光的光源具有光分布，其中参考轴用作对称轴或光分布，其中包括基准轴的平面用作对称平面。 光中的第一光束被引导到被照明的物体。 光中的第二光束被引导到光电检测器。 光检测器检测第二光束的强度。 光源和光电检测器由支撑结构支撑在允许以上述方式引导第一光束和第二光束的位置和姿势。 第一光束的行进方向和第二光束的行进方向与参考轴线成相同的角度。
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230.发明授权Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum 有权控制装置和控制方法具有基于获取的入射光谱的半值波长的狭缝选择公开(公告)号：US09404798B2
公开(公告)日：2016-08-02
申请号：US14468900
申请日：2014-08-26
Applicant: NEC Corporation
Inventor： Hideya Tomita
CPC classification number: G01J3/04 , G01J3/18 , G01J2003/042 , G01J2003/045
Abstract: A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
Abstract translation: 控制装置包括具有不同宽度的多个矩形狭缝的狭缝板。 控制装置还包括从矩形狭缝获取入射光谱的获取单元。 该设备还包括：狭缝选择单元，其基于入射光谱获取入射光谱的半值波长，并且基于半值波长执行多个矩形狭缝之一的选择。
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