Abstract:
A power module (10) includes a substrate (12) that includes an upper layer (16), an electrical insulator and a thermal coupling layer. The upper layer includes an electrically conductive pattern (17) and is configured for receiving power devices (14). The electrical insulator is disposed between the upper layer and the thermal coupling layer. The thermal coupling layer is configured for thermal coupling to a heat sink. The power module further includes at least one laminar interconnect (18) that includes first and second electrically conductive layers (20, 24) and an insulating layer (22) disposed between the first and second electrically conductive layers. The first electrically conductive layer of the laminar interconnect is electrically connected to the upper layer of the substrate. Electrical connections (42) connect a top side (19) of the power devices to the second electrically conductive layer of the laminar interconnect.
Abstract:
PROBLEM TO BE SOLVED: To increase the number of memory modules to be loaded without increasing the area of a mother board or increasing bus length between a CPU and a memory module.SOLUTION: Disclosed is a memory system including: a memory module 10 configured such that a plurality of memories 11 are mounted on a module substrate 12; and a module socket 20 mounted on a mother board 30 for loading the memory module 10. In this case, the module socket 20 is configured as a pin socket in which a plurality of pins 21 are two-dimensionally arrayed, and each of the plurality of pins is mounted so as to be vertically erected on the mother board 30. Also, the memory module 10 is provided with a contact part 13 having a plurality of through-holes 14 arrayed on the module substrate 12 correspondingly with each of the plurality of pins 21, and configured to, when the corresponding pins 21 are inserted, connecting the pertinent pins 21 to wiring on the module substrate 12.
Abstract:
In some embodiments a passive impedance equalization network for high speed serial links is described. The impedance equalization network includes at least one stepped impedance transformer near points of impedance discontinuities. The impedance discontinuities may be at an interface connection between two circuit boards. The impedance discontinuities on a circuit board may be at a die-package interface and/or a package-board interface. The stepped impedance transformer may be formed in a package trace, a board trace or both. Forming the stepped impedance transformers in the traces requires no modification to existing package/board design methodology or technology. The stepped impedance transformers can provide impedance matching over a range of frequencies. To account for modeling errors in the design of the stepped impedance transformers integrated circuits transmitting data over the serial link may include active circuitry to select an output/input impedance for transmitters/receivers. Other embodiments are otherwise disclosed herein.
Abstract:
PROBLEM TO BE SOLVED: To provide a printed circuit board mounting structure, mounting a semiconductor element capable of detecting or transmitting light, electromagnetic wave, vibration and so on through a printed circuit board with high positional accuracy, and an electronic device such as a nuclear medicine diagnosis apparatus including the printed circuit board mounting structure. SOLUTION: In this printed circuit board mounting structure, connectors provided on each of a plurality of slave printed circuit boards juxtaposed on a master printed circuit board fixed to a metal-made backboard are respectively inserted in a plurality of connectors juxtaposed on the master printed circuit board. Both ends near the semiconductor element mounted on the respective slave printed circuit boards are partially held between a first metal-made frame and a second metal-made frame and fixed there to achieve high positional accuracy. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
A dummy wiring 25 is provided for simulating an actual wiring 26 connecting semiconductor integrated circuits 2 and 6 on a circuit board. The semiconductor integrated circuit comprises a data output circuit 28 capable of variably setting the slew rate and a circuit 29 for measuring signal delay time between a signal sending point and a signal reflection point (characteristic impedance mismatching point) using the dummy wiring 25, and the delay time so obtained by the measuring circuit is used for the determination of the signal transition time of the output circuit. The transition time of the signal is set at least twice of the signal delay time between the signal sending point and the wiring branch at the nearest end. In this way, signal transmission with alleviated reflection by the reflection point at the nearest end is realized.
Abstract:
PROBLEM TO BE SOLVED: To solve a problem that, when high speed differential signals are transmitted to a differential interconnection, in the case of interposing a via-hole having an open stab, a waveform distortion arises by impedance mismatch in the open stab causing jitter to be generated. SOLUTION: To the differential interconnection passing through the via-hole having the open stab, the degree of coupling is made small with the differential characteristic impedance kept constant. Consequently, since the impact of the backward crosstalk noise caused by the coupling can be suppressed small, the jitter can be suppressed. COPYRIGHT: (C)2007,JPO&INPIT