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公开(公告)号:KR1020150060036A
公开(公告)日:2015-06-03
申请号:KR1020130143941
申请日:2013-11-25
Applicant: 삼성전기주식회사
Inventor: 하욥
IPC: H01L23/49
CPC classification number: H01L23/49811 , H01L21/4853 , H01L21/56 , H01L21/565 , H01L23/3121 , H01L23/3735 , H01L23/49844 , H01L25/07 , H01L2224/48091 , H01L2224/48137 , H01L2224/73265 , H01L2924/13055 , H01L2924/00014 , H01L2924/00
Abstract: 본발명은전력반도체모듈및 그제조방법에관한것이다. 본발명의일 실시예에따른전력반도체모듈은반도체소자가실장된기판, 상기기판상에위치하며, 일측이상기기판과전기적으로연결되는핀 및상기핀의일부, 상기기판및 상기반도체소자를커버하도록형성된몰딩부를포함하며, 상기몰딩부는핀 삽입용개구부를갖는다.
Abstract translation: 功率半导体模块及其制造方法技术领域本发明涉及功率半导体模块及其制造方法。 根据本发明的一个实施例的功率半导体模块包括其上安装有半导体器件的基板,位于基板上并通过其一侧与基板电连接的销和形成的模制部件 以覆盖引脚,基板和半导体器件的一部分。 成型部具有用于插入销的开口部。
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公开(公告)号:KR1020140055514A
公开(公告)日:2014-05-09
申请号:KR1020120122515
申请日:2012-10-31
Applicant: 삼성전기주식회사
IPC: H01L23/495
CPC classification number: H01L23/043 , H01L23/049 , H01L23/14 , H01L23/3735 , H01L24/36 , H01L24/37 , H01L24/40 , H01L2224/371 , H01L2224/37147 , H01L2224/37155 , H01L2224/3716 , H01L2224/37599 , H01L2224/40095 , H01L2224/40137 , H01L2224/40225 , H01L2224/48091 , H01L2924/12041 , H01L2924/1305 , H01L2924/13055 , H01L2924/19105 , H01L2924/00014 , H01L2924/00
Abstract: The present invention relates to an integrated power semiconductor module comprising a plurality of first semiconductor devices which is formed on a substrate; a molded housing to include a bridge which crosses the upper part of the first semiconductor devices; and a plurality of lead members which is integrally formed on the housing and electrically connects the first semiconductor devices and the substrate. The present invention solves a reliability issue by increasing a bonding area and a bonding strength of the semiconductor devices. The present invention improves fairness and reduces defects by the step adjustment according to the alignment of the semiconductor devices and the height of the semiconductor devices as well as reduces a process time by omitting a wire bonding process.
Abstract translation: 本发明涉及一种集成功率半导体模块,其包括形成在基板上的多个第一半导体器件; 模制外壳,其包括穿过第一半导体器件的上部的桥; 以及多个引导部件,其一体地形成在壳体上并电连接第一半导体器件和基板。 本发明通过增加半导体器件的接合面积和接合强度来解决可靠性问题。 本发明通过根据半导体器件的对准和半导体器件的高度的阶梯调整来改善公平性并减少缺陷,并且通过省略引线接合过程来减少处理时间。
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公开(公告)号:KR101343199B1
公开(公告)日:2013-12-19
申请号:KR1020110130415
申请日:2011-12-07
Applicant: 삼성전기주식회사
Inventor: 하욥
CPC classification number: H01L23/36 , H01L23/3735 , H01L23/49811 , H01L23/49833 , H01L25/0652 , H01L25/071 , H01L2224/06181 , H01L2224/32225 , H01L2224/32245 , H01L2924/1305 , H01L2924/13055 , H01L2924/15192 , H01L2924/19043 , H01L2924/19105 , H01L2924/00
Abstract: 본발명은반도체패키지에관한것이다. 본발명의실시예에따르면, 제1 배선패턴이형성된제1 기판, 제1 기판상부에접촉되어실장되는제1 반도체소자, 제2 배선패턴이형성된제2 기판, 제1 반도체소자상부에실장되며, 제2 기판하부와접촉되는제3 반도체소자및 제1 반도체소자와제3 반도체소자사이에위치하며, 외부로돌출된한 개이상의상부전극및 하부전극을포함하는제3 배선패턴이형성되며, 하부전극은제1 반도체소자와접촉되며, 상부전극은제3 반도체소자와접촉되는제3 기판을포함하는반도체패키지가제공된다.
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公开(公告)号:KR1020090011095A
公开(公告)日:2009-02-02
申请号:KR1020070074346
申请日:2007-07-25
Applicant: 삼성전기주식회사
IPC: H01L23/48
CPC classification number: H01L21/78 , H01L21/4867 , H01L21/76 , H01L23/522 , H01L24/50
Abstract: A single wafer level device package and a packaging method thereof are provided to omit use of separate electrode pad by performing an electric connection through a conductive pattern of a sealing line. A single wafer level device package comprises a substrate(10'), a sealing line(40), and a wiring(30). A device(20) is positioned on a bottom surface of the substrate. The wiring is formed on the bottom surface of the substrate. The sealing line surrounds the device in order to seal the device, and has at least two conductive patterns(42) and a non-conductive pattern(41). The package is mounted using the sealing line. The non-conductive pattern is made of one selected among BCB(Benzocyclobutene), DFR(Dry Film Resin), epoxy, and thermosetting polymer. The conductive pattern is made of metal or conductive paste.
Abstract translation: 提供单个晶片级器件封装及其封装方法,以通过通过密封线的导电图案执行电连接来省略使用单独的电极焊盘。 单个晶片级器件封装包括衬底(10'),密封线(40)和布线(30)。 设备(20)位于基板的底表面上。 布线形成在基板的底面上。 密封线围绕该装置以便密封该装置,并且具有至少两个导电图案(42)和非导电图案(41)。 包装使用密封线安装。 非导电图案由选自BCB(苯并环丁烯),DFR(干膜树脂),环氧树脂和热固性聚合物中的一种制成。 导电图案由金属或导电膏制成。
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公开(公告)号:KR100862379B1
公开(公告)日:2008-10-13
申请号:KR1020070040219
申请日:2007-04-25
Applicant: 삼성전기주식회사
CPC classification number: H01L23/481 , H01L23/04 , H01L23/06
Abstract: A SAW device package and a fabricating method thereof are provided to increase a yield in a package manufacturing process by reducing an influence on an internal pattern thereof. A via(210) is formed in a first wafer(200). A first pattern is formed on one surface of the first wafer. The first pattern is electrically connected with the via. A second pattern is formed on the other surface of the first wafer. A cap is formed to cover at least one of the first pattern and the second pattern. The first pattern and the second pattern include a pattern for composing an IDT(Inter-Digital Transducer). The via forming process includes a process for punching a via hole on the first wafer, and a process for filling up a conductive material in the via hole.
Abstract translation: 提供SAW器件封装及其制造方法,以通过减小对其内部图案的影响来增加封装制造工艺中的产量。 通孔(210)形成在第一晶片(200)中。 在第一晶片的一个表面上形成第一图案。 第一图案与通孔电连接。 在第一晶片的另一个表面上形成第二图案。 形成盖以覆盖第一图案和第二图案中的至少一个。 第一图案和第二图案包括用于构成IDT(数字间传感器)的图案。 通孔形成工艺包括用于冲压第一晶片上的通孔的工艺,以及在通孔中填充导电材料的工艺。
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27.
公开(公告)号:KR100826393B1
公开(公告)日:2008-05-02
申请号:KR1020070049834
申请日:2007-05-22
Applicant: 삼성전기주식회사
CPC classification number: H01L21/50 , B81B2207/093 , B81C1/00301 , B81C2203/0118 , B81C2203/019 , H01L23/10 , H01L23/3114 , H01L2924/0002 , H01L2924/16195 , H01L2924/16235 , H03H9/1057 , H03H9/1071 , H01L2924/00
Abstract: A wafer level device package with a sealing line having a conductive pattern and a packaging method thereof are provided to read an electrical signal from a device on a device region or apply power to the device by using the conductive pattern and a lead frame without using a separate electrode pad. A wafer level device package includes a device substrate(10'), a sealing line(20), and a cap substrate(40'). A device region(30) is formed on the device substrate. A device is mounted on the device region. The sealing line encloses the device region and includes plural non-conductive patterns and plural conductive patterns(22). The cap substrate includes plural vias(50) which are connected to the respective conductive patterns. The cap substrate is bonded with the sealing line. Plural lead frames(31), which are connected to the conductive patterns of the sealing line, are formed on an upper surface of the device substrate.
Abstract translation: 提供了具有导电图案的密封线及其封装方法的晶片级器件封装,以从器件区域上的器件读取电信号,或者通过使用导电图案和引线框架来对器件施加电力而不使用 单独的电极垫。 晶片级器件封装包括器件衬底(10'),密封线(20)和帽衬底(40')。 在器件基板上形成器件区域(30)。 设备安装在设备区域上。 密封线包围器件区域并且包括多个非导电图案和多个导电图案(22)。 盖基板包括连接到各个导电图案的多个通孔(50)。 封盖基板与密封线接合。 连接到密封线的导电图案的多个引线框架(31)形成在器件基板的上表面上。
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