Abstract:
A thermosetting composite resin composition, a prepreg prepared by using the composition, and a composite film prepared by using the composition are provided to reduce dielectric loss and to allow desired dielectric constant to be obtained. A thermosetting composite resin composition comprises a base resin comprising a cycloolefin polymer of solid state; an organic solvent which dissolves the base resin; a crosslinking agent; an initiator; and at least one inorganic filler selected from BaTiO3, SrTiO3, TiO2, PZT, Al, Cu, Ni, Fe, Ag, Ti, Cr, Si, Mg, Zn, Sn, Pb, Ti, Zr, Ta, Pt, carbon black and graphite, wherein the ratio of the base resin and the crosslinking agent is 95:5 to 80:20 by weight. The composition has a dielectric constant of 4-1,750 according to the content of the inorganic filler.
Abstract:
A CCL(Copper Clad Laminate), a PCB(Printed Circuit Board), and a CCL manufacturing method are provided to secure high heat resistance and high junction property with copper clad and to increase the dielectric property to the desirable level. A CCL is composed of a prepreg(10) formed by impregnating a low-loss polymer composition with glass fiber and a complex film(20) containing an inorganic filler selected from ceramic and metal materials, carbon black, and graphite and a low-loss polymer composition. The low-loss polymer composition contains thermoplastic resin selected from PPO(Polyphenylene Oxide), copolymer of PPO and PS(Polystyrene), cyclic olefin, and PEI(Polyetherimide) and thermosetting materials applying cross-linking property to the thermoplastic resin. The prepregs are laminated on both ends of a complex film layer formed by laminating the complex films in at least two layers. The copper clad is formed at both ends of the laminated prepreg.
Abstract:
A method for manufacturing an interposer includes a step of forming one or more through-vias on a semiconductor substrate; a step of electrically connecting one or more through-vias to a thin-film circuit formed on one side of the semiconductor substrate; and a step of electrically connecting one or more through-vias to an integrated circuit chip formed on the other side of the semiconductor substrate.
Abstract:
PURPOSE: A semiconductor package and a manufacturing method thereof are provided to implement a thin film type semiconductor package by embedding a thin film passive device in a substrate. CONSTITUTION: At least one first hole is formed on a silicon substrate (110) integrated with a thin film passive device (120). An integrated circuit (130) is inserted into the first hole. A connection member (140) for connecting the integrated circuit to the thin film passive device is formed. An organic insulation layer is made of organic materials by a lamination process. An connection electrode is formed after the connection member is molded. [Reference numerals] (AA,CC) Thin film capacitor; (BB,DD) Spiral inductor
Abstract:
다층 배선 구조의 인터포저 제조 방법은, 박막 수동 소자가 집적된 실리콘 웨이퍼에 양면 라미네이션 공정을 수행하여 유기 물질의 절연층을 각각 형성한 후에 실리콘을 관통하여 형성되는 공간에 집적 회로를 실장하고 실리콘을 관통하여 형성되는 비아 구멍의 내벽으로 패터닝과 전기 도금을 이용하여 박막 수동 소자의 연결 전극으로 사용되는 라이닝 비아를 형성한다. 다음, 라이닝 비아가 형성된 실리콘 웨이퍼에 양면 라미네이션 공정을 수행하여 유기 물질의 절연층을 각각 형성한 후에 집적 회로의 연결 전극으로 사용되는 라이닝 비아를 형성한다.
Abstract:
PURPOSE: An interposer and a manufacturing method thereof are provided to form a through silicon via with a low loss by forming a thick insulation layer using a lamination process. CONSTITUTION: An interposer(10) is formed with a multilayer interconnection structure and includes a silicon wafer(100), an integrated circuit(110), and a thin film passive device(120). A lining via(130) is formed on a silicon wafer. A lining via(140) is formed on an organic insulation layer of the silicon wafer. A lining via(150) is formed with a coaxial structure.
Abstract:
본 발명은 관통 실리콘 비아(Through Silicon Via; TSV) 제조 방법에 관한 것으로, 특히 폴리머 진공 열압착 공정을 이용한 관통 실리콘 비아 제조 방법에 관한 것이다. 본 발명의 관통 실리콘 비아 제조 방법은 실리콘 기판의 전면에 구멍을 뚫는 (a) 단계; 상기 실리콘 기판의 전면에 폴리머 필름을 놓는 (b) 단계; 진공 상태에서 열과 압력을 이용하여 상기 폴리머 필름을 상기 실리콘 기판의 전면에 접합시키고 상기 구멍에 채워 넣는 (c) 단계; 상기 폴리머 필름으로 메워진 구멍을 처음 뚫을 때의 지름보다 작게 재차 뚫는 (d) 단계; 및 상기 재차 뚫린 구멍을 금속으로 메우는 (e) 단계를 포함하여 이루어진다.