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公开(公告)号：DE10016377B4
公开(公告)日：2009-01-08
申请号：DE10016377
申请日：2000-04-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN , STORZ RAFAEL , ULRICH HEINRICH , BEWERSDORF JOERG , BIRK HOLGER
Abstract: The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.
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公开(公告)号：DE10105391B4
公开(公告)日：2004-11-25
申请号：DE10105391
申请日：2001-02-06
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: The invention discloses a scanning microscope for optical measurement with high spatial resolution of a specimen point of a specimen, having a light source for emitting an exciting light beam suitable for exciting an energy state of the specimen; a detector for detection of the emitted light; and a stimulating light beam, coming from the light source, for generating stimulated emission of the specimen excited by the exciting light beam at the specimen point, the exciting light beam and the stimulating light beam being arranged in such a way that their intensity distributions in the focal region partially overlap, wherein optical elements which shape the stimulating light beam are combined into at least one module that is positionable in the beam path of the scanning microscope.
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公开(公告)号：DE10150542A1
公开(公告)日：2003-04-30
申请号：DE10150542
申请日：2001-10-12
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: The invention discloses a fluorescence microscope comprising a light source that emits excitation light for illumination of a specimen, means for defining a two-dimensional search region for the excitation and detection wavelengths, means for selecting a subregion from the search region, at least one detector that detects detected light proceeding from the specimen, and a display for displaying an image of at least a portion of the specimen. Furthermore the invention discloses a method for fluorescence microscopy.
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公开(公告)号：GB2367702B
公开(公告)日：2002-09-11
申请号：GB0118351
申请日：2001-07-27
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.
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公开(公告)号：GB2369953A
公开(公告)日：2002-06-12
申请号：GB0123899
申请日：2001-10-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A light source for illumination in scanning microscopy comprises an electromagnetic energy source (3) emitting light (17) of one wavelength, and a beam splitter (5) for spatially dividing the light into two partial light beams (19, 21). An intermediate element (9), for wavelength modification is provided in at least one light beam (21). The partial light beams (19,21) may be directed onto overlapping regions of a specimen. The intermediate element (9) may be an optical parametric oscillator or an element for frequency multiplication. A beam shaping element may be placed after the intermediate element.
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Patent Agency Ranking
公开(公告)号：DE10056382A1
公开(公告)日：2002-05-23
申请号：DE10056382
申请日：2000-11-14
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: An electromagnetic source of power (3) emits light (17) for a wavelength and is upstream to a device (5) for apportioning light into two dividing beams of light. There is an intermediate element (9) in the first dividing beam of light (21) to alter wavelengths. The second dividing beam of light (19) is aligned directly onto a specimen (41) to give optical stimulation to a first area. An Independent claim is also included for a scan microscope with a microscope lens, a detector and a beam deflector device for guiding an illuminating light beam over a specimen.
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公开(公告)号：DE10043992A1
公开(公告)日：2002-03-21
申请号：DE10043992
申请日：2000-09-05
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HOFFMANN JUERGEN , KNEBEL WERNER
IPC: G02B21/00
Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen (11) is detected.
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公开(公告)号：DE10039520A1
公开(公告)日：2002-02-21
申请号：DE10039520
申请日：2000-08-08
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , HOFFMANN JUERGEN
Abstract: The present invention relates to a device and to a method for examining and manipulating microscopic objects (1), with a microscope (2), a light source (3, 4) used to illuminate the object (1), an illumination beam path (5), a detector (6) used to detect the light returning from the object (1), a detection beam path (7), a light source (8) used for the object manipulation and a manipulation light beam path (9). The device according to the invention and the method according to the invention are intended to permit three-dimensional examination and manipulation of objects (1) whose dimension along the optical axis is greater than the depth of focus of the microscope objective used, with the additional intention that object manipulation should be possible at all sites of the three-dimensional object (1).
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公开(公告)号：DE10012462A1
公开(公告)日：2001-09-20
申请号：DE10012462
申请日：2000-03-15
Applicant: LEICA MICROSYSTEMS
Inventor： HOFFMANN JUERGEN
Abstract: An optical component (7) is placed in one or more illumination beam paths (2, 4). This varies the light. Optical characteristics of the component (7) can be influenced or varied, to change the illumination pattern of the beam path, altering its shape in the object (1) region.
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公开(公告)号：DE10046199B4
公开(公告)日：2011-02-10
申请号：DE10046199
申请日：2000-09-19
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , HOFFMANN JUERGEN
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