Method for programming and testing a non-volatile memory
    21.
    发明授权
    Method for programming and testing a non-volatile memory 失效
    一种用于编程的方法和测试的非易失性存储器

    公开(公告)号:EP0665558B1

    公开(公告)日:2001-05-23

    申请号:EP94830032.2

    申请日:1994-01-31

    CPC classification number: G11C29/46 G11C29/14

    Abstract: A new method for testing an electrically programmable non-volatile memory and comprising a cell matrix and a state machine which governs the succession and timing of the memory programming phases by means of some control signals (WEN, CEN, OEN and DU) provides exclusion of the internal state machine and modification of the meaning of at least one of the control signals (WEN, CEN, OEN and DU) to program directly the cell matrix and then verify programming correctness.

    Memory circuit with improved address signal generator
    26.
    发明公开
    Memory circuit with improved address signal generator 失效
    Speicherschaltung mit verbicultem Adressensignalgenerator

    公开(公告)号:EP0913829A1

    公开(公告)日:1999-05-06

    申请号:EP97830558.9

    申请日:1997-10-31

    CPC classification number: G11C16/16 G11C8/04

    Abstract: The present invention relates to a semiconductor memory device with an improved address signal generator. The memory device comprises an array of memory elements (10), first decoding circuit means (8,15) for decoding a first set of address signals (7,14) for the selection of said memory elements, and second circuit means (4) for the generation internally to the memory of a sequence of values for said address signals (3,11). The second circuit means (4) generates said sequence so that successive values in the sequence differ for the logic state of only one of said address signals (3,11).

    Abstract translation: 本发明涉及具有改进的地址信号发生器的半导体存储器件。 存储器件包括存储元件阵列(10),第一解码电路装置(8,15),用于对用于选择所述存储器元件的第一组地址信号(7,14)进行解码;以及第二电路装置(4) 用于内部生成用于所述地址信号(3,11)的一系列值的存储。 第二电路装置(4)产生所述序列,使得序列中的连续值对于仅一个所述地址信号(3,11)的逻辑状态不同。

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