Abstract:
The present invention relates to a semiconductor memory device with an improved address signal generator. The memory device comprises an array of memory elements (10), first decoding circuit means (8,15) for decoding a first set of address signals (7,14) for the selection of said memory elements, and second circuit means (4) for the generation internally to the memory of a sequence of values for said address signals (3,11). The second circuit means (4) generates said sequence so that successive values in the sequence differ for the logic state of only one of said address signals (3,11).
Abstract:
The memory array (30) comprises a plurality of cells (50), grouped together in sectors (31) and arranged in sector rows and columns, and has both hierarchical row decoding and hierarchical column decoding. Global word lines (35) are connected to at least two word lines (36) in each sector (31), through local row decoders (33); global bit lines (42) are connected to at least two local bit lines (43) in each sector (31), through local column decoders (40). The global column decoder (41) is arranged in the centre of the memory array (30), and separates from each other an upper half (30a) and a lower half (30b) of the memory array (30). Sense amplifiers (47) are also arranged in the middle of the array, thus saving space. This architecture also provides lesser stress of the cells, better reliability, and better production performance. In addition, each sector (31) is completely disconnected from the remaining sectors, and only the faulty row or column of a single sector should be doubled.