MANUFACTURING METHOD OF AN ELEMENT OF AN ELECTRONIC DEVICE HAVING IMPROVED RELIABILITY, AND RELATED ELEMENT, ELECTRONIC DEVICE AND ELECTRONIC APPARATUS

    公开(公告)号:EP3965149A1

    公开(公告)日:2022-03-09

    申请号:EP21194172.9

    申请日:2021-08-31

    Abstract: A manufacturing method of an anchorage element (82) of a passivation layer (69), comprising: forming, in a semiconductor body (80) made of SiC and at a distance from a top surface (52a) of the semiconductor body (80), a first implanted region (84) having, along a first axis (X), a first maximum dimension (di); forming, in the semiconductor body (80), a second implanted region (85), which is superimposed to the first implanted region (84) and has, along the first axis (X), a second maximum dimension (d 2 ) smaller than the first maximum dimension (di); carrying out a process of thermal oxidation of the first implanted region (84) and second implanted region (85) to form an oxidized region (86'); removing said oxidized region (86') to form a cavity (83); and forming, on the top surface (52a), the passivation layer (69) protruding into the cavity (83) to form said anchorage element (82) fixing the passivation layer (69) to the semiconductor body (80).

    METHOD FOR MANUFACTURING A SIC ELECTRONIC DEVICE WITH REDUCED HANDLING STEPS, AND SIC ELECTRONIC DEVICE

    公开(公告)号:EP3876263A1

    公开(公告)日:2021-09-08

    申请号:EP21161040.7

    申请日:2021-03-05

    Abstract: Method for manufacturing an electronic device (50) based on SiC, comprising the steps of: arranging a substrate (53) of SiC; forming a structural layer (52) of SiC on a front of the substrate; forming, in the structural layer (52), active regions of said electronic device (50), said active regions having a role in the generation and/or conduction of electric current during the use of the electronic device (50); forming, on the structural layer (52), a first electric terminal (58); forming an intermediate layer (72) of Titanium at the back of the substrate; heating the intermediate layer (72) by means of a LASER beam (82) in order to generate local heating such as to favor the formation of an ohmic contact of Titanium compounds; and forming, on the intermediate layer, a second electric terminal (57) of the electronic device.

    SILICON CARBIDE MOSFET DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:EP3605615A1

    公开(公告)日:2020-02-05

    申请号:EP19189720.6

    申请日:2019-08-02

    Abstract: A MOSFET device comprising: a structural region, made of a semiconductor material having a first type of conductivity, which extends between a first side and a second side opposite to the first side along an axis; a body region, having a second type of conductivity opposite to the first type, which extends in the structural region starting from the first side; a source region, having the first type of conductivity, which extends in the body region starting from the first side; a gate region, which extends in the structural region starting from the first side, traversing entirely the body region; and a shielding region, having the second type of conductivity, which extends in the structural region between the gate region and the second side. The shielding region is an implanted region self-aligned, in top view, to the gate region.

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